In this paper, a concept of non-contact PIM evaluation method using balanced transmission lines is proposed for impedance-matched PIM measurement systems. In order to evaluate the PIM characteristics of a MSL by using its image model, measurement system using balanced transmission line is introduced. In non-contact PIM measurement, to reduce undesirable PIM generation by metallic contact and the PIM-degradation in repeated measurements, a non-contact connector which is applicable without any design changes in DUT is introduce. The three-dimensional balun composed of U-balun and balanced transmission line is also proposed so that it can be applicable to conventional unbalanced PIM measurement systems. In order to validate the concept of the proposed system, a sample using nickel producing high PIM is introduced. In order to avoid the effect of the non-contact connection part on observed PIM, a sample-configuration that PIM-source exists outside of the non-contact connection part is introduced. It is also shown using a sample using copper that, nickel-sample can be clearly differentiated in PIM characteristics while it is equivalent to low-PIM sample in scattering-parameter characteristics. Finally, by introducing the TRL-calibration and by extracting inherent DUT-characteristics from whole-system characteristics, a method to estimate the PIM characteristics of DUT which cannot be taken directly in measurement is proposed.

We developed a 300-GHz high gain amplifier MMIC in 75-nm InP high electron mobility transistor technology. We approached the issues with accurate characterization of devices to design the amplifier. The on-wafer through-reflect-line calibration technique was used to obtain accurate transistor characteristics. To increase measurement accuracy, a highly isolated structure was used for on-wafer calibration standards. The common source amplifier topology was used for achieving high gain amplification. The implemented amplifier MMIC exhibited a gain of over 25 dB in the 280-310-GHz frequency band.

The transmission S-parameter, S21, between dipole elements on a rectangular finite ground plane is calculated by the MoM with planar-segments in the horizontally and vertically polarized configurations. Supposed a 1/10 scaling, the frequency range is selected 0.15-0.8 GHz. The size of the finite ground plane is 40 cm 100 cm. The dipole-element length is 18.8 cm (half-wavelength at 0.8 GHz). The distance between dipole elements is 30 cm. The results are compared to the calculated results with the conventional MoM-GTD hybrid method and also the measured results with a TRL-calibrated network analyzer. It makes clear that the MoM-GTD hybrid method is not applicable to a small ground plane in the vertically polarized configuration. The results calculated by the MoM with planar-segments agree well to the measured results both in the horizontal and vertical polarizations. The results show that the size of the finite ground plane for the vertical polarization should be much larger than for the horizontal polarization.

The transmission S-parameter between two dipole-elements is a measure to evaluate sites for measuring complex antenna factors (CAF). In this paper, the S-parameter between two dipole-elements on a ground plane is measured using a network analyzer with its TRL (Thru-Reflect-Line) calibration. The S-parameter is also calculated by the method of moment (MoM) and compared to the measurement results. The comparison shows that the calculated S-parameter is usable as a reference value in the evaluation of CAF measurement sites. As an example of the evaluation and selection of measurement sites, the transmission S-parameter on a finite ground plane is calculated using the hybrid method combined the geometrical theory of diffraction (GTD) and MoM. As a result, a preferable antenna setting on the finite ground plane is recommended.