This paper presents a method combining array signal processing and adaptive noise cancellation to suppress unwanted ambient interferences in in situ measurement of radiated emissions of equipment. First, the signals received by the antenna array are processed to form a main data channel and an auxiliary data channel. The main channel contains the radiated emissions of the equipment under test and the attenuated ambient interferences. The auxiliary channel only contains the attenuated ambient interferences. Then, the adaptive noise cancellation technique is used to suppress the ambient interferences based on the correlation of the interferences in the main and auxiliary channels. The proposed method overcomes the problem that the ambient interferences in the two channels of the virtual chamber method are not correlated, and realizes the suppression of multi-source ambient noises in the use of fewer array elements. The results of simulation and experiment show that the proposed method can effectively extract radiated emissions of the equipment under test in complex electromagnetic environment. Finally, discussions on the effect of the beam width of the main channel and the generalization of the proposed method to three dimensionally distributed signals are addressed.

Hydrophobic DNA (H-DNA) nano-film was formed on a thin glass plate of 50μm thick working as a slab optical waveguide. Bromothymol blue (BTB) molecules were immobilized from aqueous solution with direct contacting to the H-DNA nano-film for 20 minutes. From changes in absorption spectra observed with slab optical wave guide (SOWG) during automated solution exchange (SE) processes for 100 times, it was found that about 95% of bromothymol blue (BTB) molecules was immobilized in the H-DNA nano-film with keeping their functionality of color change responsible to pH change in the solution.

In situ UV-vis. absorption spectra of cytochrome c adsorbed on ITO electrode was observed with slab optical waveguide spectroscopy combining pulse potential step (PPS) between 0.3 and -0.45 V vs. Ag/AgCl. The amount of cytochrome c adsorbed on ITO electrode was estimated from the amount of coulomb of the peaks in cyclic voltammogram to be about a monolayer coverage in this experimental condition. Spectral change between oxidized and reduced cytochrome c by PPS was finished in about 20 msec with phosphate buffer solution. The results strongly proved that SOWG spectroscopy should be effective for in situ observation of ET reaction kinetics of surface adsorbed molecules.

In this paper, we report the reduction in the base-collector capacitance (CBC) of InP/InGaAs double heterojunction bipolar transistors with buried SiO2 wires (BG-HBT). In a previous trial, we could not confirm a clear difference between the CBC of the conventional HBT and that of the BG-HBT because the subcollector layer was thicker than expected. In this study, the interface between the collector and the subcollector was shifted to the middle of the SiO2 wires by adjusting the growth temperature, and a reduction in CBC with buried SiO2 wires was confirmed. The estimated CBC of the BG-HBT was 7.6 fF, while that of the conventional HBT was 8.6 fF. This 12% reduction was in agreement with the 10% reduction calculated according to the designed size.

In situ observation of electrochemical activity and time dependent characteristics of cytochrome c (cyt c) was carried out in 0.01 M phosphate buffered saline (PBS, pH 7.4) containing 20 µM cyt c solutions at bare indium-tin-oxide (ITO) electrodes by using a cyclic voltammetry (CV) and a slab optical waveguide (SOWG) spectroscopy. The bare ITO electrodes could retain the electrochemical activity of cyt c in the PBS solutions, indicating the great advantage of using ITO electrodes against other electrode materials, such as gold (Au). The CV curves and simultaneously observed the time-resolved SOWG absorption spectra in the consecutive cycles implied that the cyt c molecules could retain its own electrochemical function for a long time.

In situ observations were mainly performed by using slab optical waveguide (SOWG) spectroscopy synchronized with potential step measurements to investigate the time dependent spectral change of the adsorbed heptyl viologen cation radicals (HV+) in thin deposition layer on indium-tin-oxide (ITO) electrodes. Several absorption bands, which indicated a monomer and dimer of HV+ were co-adsorbed on ITO electrode surface with a monolayer or a few layers deposition, were observed in UV-visible region. The time dependent spectra yielded some important molecular information for the adsorption phenomena of HV+ on the electrode surface. All observed absorption bands disappeared completely when the electrode potential of -200 mV vs. Ag/AgCl was applied, which indicated the adsorbed HV+ species were electrochemically reoxidized on the ITO electrode.

A novel technique has been developed for in situ sensing of thin film growth. In this method, a fiber optic probe is placed at an appropriate position in a deposition chamber, and the thin film builds up on the end of the fiber. This film is either the same as on the wafer where deposition occurs, or it bears a fixed relationship to the film on the wafer. By an analysis of the intensity of the light reflected from the film and guided by the fiber, information on the film may be obtained. With interference causing maxima, minima and a point of inflection as the film grows, it is possible to obtain near real time information on the following quantities: the real and imaginary parts of the refractive index of the film, a Gaussian parameter characterizing surface roughness, and the film thickness itself. To demonstrate this technique, we have studied the deposition of silicon nitride films in a CVD reactor and how reactor temperature and reactant flow rates influence film growth. This technique may be applied to measure in situ reflectivity of multi layer films, so that reflectance as a function of temperature and time may be obtained. Because the measurement is simple and direct and the information is optical, we believe that this technique has the potential to supplant quartz oscillators in the measurement of thin film growth.