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Hironori AKAMATSU Toru IWATA Hiroyuki YAMAUCHI Hisakazu KOTANI Akira MATSUZAWA Hiro YAMAMOTO Takashi HIRATA
An experimental latch circuit is fabricated by using a 0.35µm MT-CMOS technology. This latch circuit has a volume smaller by 30%, a delay time shorter by 10%, and has an active power consumption smaller by 10% over those of a conventional MT-CMOS circuit. Furthermore, at a operation frequency of 100 MHz, an SRAM employing this IPS scheme has a standby current which is 0.4% of SRAM's without using IPS scheme.
Takakuni DOUSEKI Shin-ichiro MUTOH
This paper describes the effects of operating temperature on delay time in a 1-V multi-threshold CMOS(MTCMOS) circuit, Delay-time analysis including the temperature factor shows that the delay-time variation of the CMOS circuit becomes amall for low-voltage operation and the variation is mainly determined by the threshold voltage and its variation-rate with temperature. As a design method of a MTCMOS circuit with both high-threshold and low-threshold MOSFETs, optimization of the low-threshold voltage at which the delay-time of the circuit is independent of operating temperature is described in detail. The validity of the design method is confirmed by the evaluation of a gate-chain TEG and a 1-V 12 K-gate digital-filter LSI fabricated with o.5-µm MTCMOS technology.
Takakuni DOUSEKI Shin'ichiro MUTOH Takemi UEKI Junzo YAMADA
Soft-error immunity of a 1-V operating CMOS memory cell is described. To evaluate the immunity precisely at the supply voltage of 1 V, a multi-threshold CMOS (MTCMOS) memory scheme, which has a peripheral circuit combining low-threshold CMOS logic gates and high-threshold MOSFETs with a virtual supply line, is adopted as a test structure. A 1-kb memory was designed and fabricated with 0.5-µm MTCMOS technology and the soft-error immunity of the memory cells was evaluated. The results of an alpha-particle exposure test and a pulse laser test show that a full-CMOS memory cell has high immunity at 1-V operations.