Clock driver suffers from delay variation due to manufacturing and environmental variabilities as well as combinational cells. The delay variation causes clock skew and jitter, and varies both setup and hold timing margins. This paper presents a timing verification method that takes into consideration delay variation inside a clock network due to both manufacturing variability and dynamic power supply noise. We also discuss that setup and hold slack computation inherently involves a structural correlation problem due to common paths, and demonstrate that assigning individual random variables to upstream clock drivers provides a notable accuracy improvement in clock skew estimation with limited increase in computational cost. We applied the proposed method to industrial designs in 90 nm process. Experimental results show that dynamic delay variation reduces setup slack by over 500 ps and hold slack by 16.4 ps in test cases.

Substrate noise analysis has become increasingly important in recent LSI design. This is because substrate noise, which affects PLLs, causes jitter that results in timing error. Conventional analysis techniques of substrate noise are, however, impractical for large-scale designs that have hundreds of millions of transistors because the computational complexity is too huge. To solve this problem, we have developed a fast substrate noise analysis technique for large-scale designs, in which a chip is divided into multiple domains and the circuits of each domain are reduced into a macro model. Using this technique, we have designed a processor chip for use in the supercomputer (die size: 20 mm 21 mm, frequency: 3.2 GHz, transistor count: 350M). Computation time with this design is five times faster than that with a 1/3000 scale design using a conventional technique, while resulting discrepancy with measured period jitter is less than 15%.

In this paper, we propose two methods to estimate clock jitter caused by power supply noise in a LSI (Large-Scale Integrated circuit). One of the methods enables estimation of clock jitter at the initial design stage before floor-planning. The other method reduces simulation time of clock distribution network to analyze clock jitter at the design verification stage after place-and-route of the chip. For an example design, the relative difference between clock jitter estimated at the initial design stage and that of the design verification stage is 23%. The example result also shows that the proposed method for the verification stage is about 24 times faster than the conventional one to analyze clock jitter.

In this paper by using an exactly analytic approach the clock jitter in the feedback path of the continuous time Delta Sigma modulators (CT DSM) is modeled as an additive jitter noise, providing a time invariant model for a jittery CT DSM. Then for various DAC waveforms the power spectral density (psd) of the clock jitter at the output of DAC is derived and by using an approximation the in-band power of the clock jitter at the output of the modulator is extracted. The simplicity and generality of the proposed approach are the main advantages of this paper. The MATALB and HSPICE simulation results confirm the validity of the proposed formulas.

In this paper the spectral density of the additive jitter noise in continuous time (CT) Delta-Sigma modulators (DSM) is derived analytically. Making use of the analytic results, extracted in this paper, a novel method for elimination of the damaging effects of the clock jitter in continuous time Delta-Sigma modulators is proposed. In this method instead of the conventional waveforms used in the feedback path of CT DSM's such as the non return to-zero, the return to-zero, and the half delay return to-zero, an impulse waveform is employed.

Undersampling (or bandpass sampling) phase modulated signals directly at high frequency band, the harmful effects of the aperture jitter characteristics of ADCs (Analog-to-Digital converters) and sampling clock instability of the system can not be ignored. In communication systems the sampling jitter brings additional phase noise to the constellation pattern besides thermal noise, thus the BER (bit error rate) performance will be degraded. This paper examines the relationship between the input frequency to ADC and the sampling jitter in digital IF (Intermediate Frequency) downconversion receivers with undersampling scheme. This paper presents the measurement results with a real hardware prototype system as well as the computer simulation results with a theoretically modeled IF sampling receiver. We evaluated EVM (Error Vector Magnitude) in various clock jitter configurations with commonly used and reasonable cost ADCs of which sampling rates was 40 MHz. According to the results, the IF input frequencies of QPSK (16 QAM) signals were limited below around 290 (210) MHz for wireless LAN standard, and 730 (450) MHz for W-CDMA standard, respectively, in our best configuration.