In order to provide a low profile wire antenna for mobile communication, we have developed a new type of the transmission line type antenna, which we call a Modified Transmission Line Antenna (MTLA). Analysis of a certain type of the modified transmission line antenna has revealed that the input impedance and the gain can be determined independently by appropriately choosing antenna configuration. In this paper, we first explain the fundamental characteristics of the modified transmission line antenna. We then introduce two types of MTLA, i. e. a zigzag MTLA and a double MTLA, for practical application of the MTLA to mobile communication. Their characteristics are also discussed theoretically and experimentally.

This paper describes a new evaluation technique for Si surfaces. A laser/microwave method using two lasers of different wavelengths for carrier injection is proposed to evaluate Si surfaces. With this evaluation system, the effect of impedance mismatching between the microwave probe and the Si wafer can be eliminated. These lasers used in this experiment are He-Ne (wavelength633 nm, penetration depth3 µm) and YAG lasers (wavelength1060 nm, penetration depth500 µm). Using a microwave probe, the amount of injected excess carriers can be detected. These carrier concentrations are mainly dependent on the condition of the surface, when carriers are excited by the He-Ne laser, and the condition of the bulk region, when carriers are excited by the YAG laser. We refer to microwave intensities detected by the He-Ne and YAG lasers as the surface-recombination-velocity-related microwave intensity (SRMI) and bulk-related microwave intensity (BRMI), respectively. We refer to the difference between SRMI and BRMI as relative SRMI (R-SRMI), which is closely related to the surface condition. A theoretical analysis is performed and several experiments are conducted to evaluate Si surfaces. It is found that the R-SRMI method is better suited to surface evaluation then conventional lifetime measurements, and that the rdliability and reproducibility of measurements are improved.

It is important to develop methods of measuring radiated electromagnetic interference level that will produce identical results at all measuring locations. We have considered a number of problems which prevent the achievement of identical results, and proposed some solutions. However, agreement of measurement values adequate for practical purposes has not been achieved. After our successive studies, we finally became aware that there is a causal relationship with changes in the line-to-ground impedance of the power supply. It is presumed that power cables of AC-powered devices operate as antenna elements that produce emission. Thus changes in the power line-to-ground impedance cause variations in the radiation efficiency to produce a different EMI level. We therefore made plans to measure the values of line-to-ground impedance at the AC power outlet for the frequency range of 100kHz to 500MHz at various locations where measurements are made of EMI from EUT (Equipment Under Test). The impedance varies greatly between 6ohms and 2 k-ohm, not only according to the frequency, but also according to the measurement location. In such cases, the EMI level shows a different value even with the same EUT, and it usually increases-especially for vertical polarization. We have developed a new type of LISN (Line Impedance Stabilization Network or Artificial Mains Network) to stabilize the power line-to-ground impedance to get consistent measurement conditions. The LISN consists of feed-through capacitors and an disk type RF resistor. The measurements confirm the consistency in the impedance value which is maintained at 50 ohms in the frequency range from 1MHz to 500MHz. Thus the newly developed LISN improves consistency of measurement values at all locations, while it was difficult to obtain good correlation before employing the LISN. We feel confident that incorporation of the method discussed here in the pertinent technical standards of EMI measurements, such as CISPR, would lead to a major improvement in getting consistent measurements values.