Low-temperature poly-Si thin film transistor with gate-overlapped LDD (GOLD) structure was fabricated. Reliability was evaluated using electrical stress method comparing conventional LDD and single drain structures. As previous researchers have reported, we have confirmed that the degradation of ON current and the field effect mobility was very small compared to conventional LDD or non-LDD structures. We have analyzed the reliability of the GOLD TFT using two-dimensional device simulator. We have clarified that vertical negative field plays a dominant role for improving the reliability in the GOLD TFT. Impact ionization occurs far from the interface between the oxide and poly-silicon by the vertical negative field. GOLD structure is promising for the realization of system on panel.

If there exist any two vertices in G whose distance becomes longer when a vertex u is removed, then u is defined as a hinge vertex. Finding the set of hinge vertices in a graph is useful for identifying critical nodes in an actual network. A number of studies concerning hinge vertices have been made in recent years. In a number of graph problems, it is known that more efficient sequential or parallel algorithms can be developed by restricting classes of graphs. In this paper, we shall propose a parallel algorithm which runs in O(log n) time with O(n) processors on CREW PRAM for finding all hinge vertices of a trapezoid graph.

In this study, a hybrid genetic algorithm/neural network with fuzzy logic controller (NN-flcGA) is proposed to find the global optimum of reliability assignment/redundant allocation problems which should be simultaneously determined two different types of decision variables. Several researchers have obtained acceptable and satisfactory results using genetic algorithms for optimal reliability assignment/redundant allocation problems during the past decade. For large-size problems, however, genetic algorithms have to enumerate numerous feasible solutions due to the broad continuous search space. Recently, a hybridized GA combined with a neural network technique (NN-hGA) has been proposed to overcome this kind of difficulty. Unfortunately, it requires a high computational cost though NN-hGA leads to a robuster and steadier global optimum irrespective of the various initial conditions of the problems. The efficacy and efficiency of the NN-flcGA is demonstrated by comparing its results with those of other traditional methods in numerical experiments. The essential features of NN-flcGA namely, 1) its combination with a neural network (NN) technique to devise initial values for the GA, 2) its application of the concept of a fuzzy logic controller when tuning strategy GA parameters dynamically, and 3) its incorporation of the revised simplex search method, make it possible not only to improve the quality of solutions but also to reduce computational cost.

In this paper, we consider optimal mirror allocation problems for the purpose of load balancing in network servers. We focus on constructing high-reliability networks and propose the optimal mirror allocation model such that the system reliability is maximized subject to costs and delays, in view of the trade-off between the reliability and cost. This optimization model is capable of dealing with various kinds of network topologies, although for simplicity, we assume the read-only situation. We formulate this optimization problem into a 0-1 integer programming model, and we use an approximate method for numerical analysis in order to analyze more large-scale systems. Our objective is to find the optimal mirror allocation by solving this model, and to show quantitatively the general characteristics of the load balancing and the improvement of the system reliability by the distributed mirror allocation.

In an optical fiber ring topology network such as FDDI (Fiber Distributed Data Interface) rings and SONET (Synchronous Optical Network) rings, the number of consecutively bypassed failed stations is limited by the optical power loss constraint. In recent years, this situation was represented as a consecutive k-out-of-n:F system and the two-terminal reliability was presented in the literature, but K-terminal reliability has not been presented. In this paper, we obtain K-terminal reliability expressions for dual-counter rotating networks (DR's) that use both self-heal and station-bypass switches in which all components (stations, links and bypass switches) can fail. The results are useful in evaluating the reliabilities of FDDI ring networks parametrically and making reliability comparisons. This method can be used to obtain a closed-form reliability expression in a more general ring-network such as 'ring of trees. '

We study the reliability functions or the minimum r-achievable rates of the lossless coding for the general sources in the sense of Han-Verdu, where r means the exponent of the error probability. Han has obtained formulas for the minimum r-achievable rates of the general sources. Our aim is to give alternative expressions for the minimum r-achievable rates. Our result seems to be a natural extension of the known results for the stationary memoryless sources and Markov sources.

The heterogeneous autonomous decentralized system technology offers a way to integrate different types of context-related autonomous decentralized (sub) systems into a coherent system. The aim of this research is to model and evaluate the communication capacity among the subsystems connected by communication gateways of a heterogeneous autonomous decentralized system. Failures of subsystems and communication gateways in the system are taken into account. We use graphs to represent the topologies of heterogeneous autonomous decentralized systems and use the residual connectedness reliability (RCR) to characterize the communication capacity among its subsystems connected by its gateways. This model enables us to share research results obtained in residual connectedness reliability study in graph theory. Not to our surprise, we learnt soon that computing RCR of general graphs is NP-hard. But to our surprise, there exist no efficient approximation algorithms that can give a good estimation of RCR for an arbitrary graph when both vertices and edges may fail. We proposed in this paper a simulation scheme that gave us good results for small to large graphs but failed for very large graphs. Then we applied a theoretical bounding approach. We obtained expressions for upper and lower bounds of RCR for arbitrary graphs. Both upper and lower bound expressions can be computed in polynomial time. We applied these expressions to several typical graphs and showed that the differences between the upper and lower bounds tend to zero as the sizes of graphs tend to infinite. The contributions of this research are twofold, we find an efficient way to model and evaluate the communication capacity of heterogeneous autonomous decentralized systems; we contribute an efficient algorithm to estimate RCR in general graph theory.

The long-term reliability of heterojunction bipolar transistor (HBT) continues to be a subject of great interest due to the increased acceptance of this device in a wide range of applications. The most demanding requirements for long-term reliability include high performance microwave instrumentation, X-band radar, and lightwave communication (OC-192). A significant leap in the long-term reliability performance was observed in HBT as the AlGaAs emitter material was replaced with lattice matched InGaP. A dramatic improvement in the long-term reliability was also observed in AlGaAs emitter HBT's as the turn on voltage (Vbe) was lowered. The typical failure mechanism in HBT devices at high current density and high temperature long-term reliability testing was a dramatic increase in the base current at low current densities. One of the limiting factors in obtaining MTTF in InGaP HBT was the long time required to promote failures in the HBT device. Furthermore, a large sample size is necessary to extract a reliable MTTF. Significant increases in the current density as high as 180 kA/cm2 during reliability testing was used to promote failures in order to obtain an MTTF within a reasonable amount of time. The MTTF at a junction temperature of 334C and at a current density of 180 kA/cm2 was 1159 hours. The extrapolated MTTF at a junction temperature of 150C exceeded 106 hours for all of the tested devices. An attempt to predict the MTTF of AlGaAs and InGaP HBT using a simple model based upon the fitting of the initial Gummel plots of large area devices was made. The model was based upon the estimation of the trap defect density at the base/emitter junction, the hole injection component of the base current, and the turn-on Vbe. Degradation of the HBT was assumed to occur at the base/emitter junction and this corresponded to an increase in the trap density at this heterojunction. A factor of 5 improvement in the MTTF of the reliability of AlGaAs HBT with a lower turn on voltage was estimated based upon the above model, which confirmed the experimental results. These results suggested that the emitter material is primarily responsible in determining the long-term reliability characteristics of HBT. The combination of a high effective hole barrier and a low turn-on Vbe are highly desirable for long-term reliability characteristics.

In variable-length coding, the probability of codeword length per source letter being above (resp. below) a prescribed threshold is called the overflow (resp. the underflow) probability. In this paper, we show that the infimum achievable threshold given the overflow probability exponent r always coincides with the infimum achievable fixed-length coding rate given the error exponent r, without any assumptions on the source. In the case of underflow probability, we also show the similar results. From these results, we can utilize various theorems and results on the fixed-length coding established by Han for the analysis of overflow and underflow probabilities. Moreover, we generalize the above results to the case with overflow and underflow probabilities of codeword cost.

We have carried out a systematic study of the impact of hydrogen exposure on InP HEMTs and GaAs PHEMTs with Ti/Pt/Au gates. Hydrogen poisoning is an important reliability concern in these devices. Our work has provided ample evidence supporting the formation of TiH inside the gate structure upon exposure of HEMTs to a hydrogen environment. The resulting volume expansion of the gate stresses the semiconductor heterostructure underneath and, through the piezoelectric effect, results in a shift of the threshold voltage of the device. This mechanism is largely reversible. Independently of this, we have found that H2 upsets the stoichiometry of the exposed InAlAs barrier in the recessed region right next to the gate. This irreversebly changes the extrinsic sheet carrier concentration in the channel and affects other figures of merit such as the breakdown voltage. This understanding should be instrumental in identifying device-level solutions to this problem.

A universal channel decoder for a given family of channels is a decoder that can be designed without prior knowledge of the characteristics of the channel. Nevertheless, it still attains the same random coding error exponent as the optimal decoder tuned to the channel. This paper investigates the duality between universal channel decoders and universal source encoders. First, for the family of finite-state channels, we consider a sufficient condition for constructing universal channel decoders from universal source encoders. Next, we show the existence of a universal channel code that does not depend on the choice of the universal decoder.

In this paper, the error performances of several reliability based decoding algorithms over the Rayleigh fading channel with coherent detection are evaluated. The algorithms for which the theoretical bounds are evaluated are the Generalized Minimum Distance (GMD), Chase-type, combined GMD and Chase-type and ordered statistic decodings. All derived bounds are relatively tight and require the same computational effort.

Reliability-based decoding algorithm in multistage decoding of multilevel codes is discussed. Through theoretical analyses, effects of soft reliability information are examined for different types of partitionings.

Effects of imprint on signal margin in FeRAM with Pt/SrBi2Ta2O9/Pt capacitors have been investigated. Imprint, induced during high temperature storage, significantly reduced the signal margin and hence determines lifetime of FeRAM. Initial signal margin of 470 mV is reduced to 290 mV after storage at 175C for 96 hours. From the reduction rate of the signal margin, it is estimated that imprint lifetime of the FeRAM is more than 10 years even though the storage temperature is 175C.

This paper proposes a synchronous acquisition method using correlation mapping by multiple-dwell detection considering false alarm penalty in M-ary/SS systems. In the method, first, the correlation value between a received signal and each assigned sequence in an M-ary/SS system in some short duration is calculated for each phase and stored in the mapping. Second, the maximum correlation value of each phase in the mapping is selected and arranged, then, the first probable synchronous phase is decided by the maximum one in these values. Simultaneously, data demodulation starts. Next, to recognize the synchronous phase, i.e., as considering false alarm penalty, the correlation values are calculated in longer duration, and the second probable phase with high reliability can be obtained by suppression of noise to signal level. Finally, if the second synchronous phase is different from the first one, the second one is reset. By this method, a short acquisition time and high reliability of acquisition can be achieved. The improvement of acquisition time and the optimal combination values of dwelling time, which is duration to calculate the correlation, are shown for several conditions in asynchronous M-ary/SSMA.

Highly reliable and high power weakly index guided buried-stripe type 980 nm pump laser diodes developed for undersea applications are reviewed. The 10,000-hour large scale reliability tests of the first generation LD chips shows that 16.7 FIT for the random failure was confirmed at 10C with 60% confidence level at 120 mW output power. We also fabricated a FBG locked co-axial type module using a can-sealed LD with a two-lens system, which showed a stable FBG locked mode oscillation at 980 nm under the temperature range from 5C to 45C. The 5,000-hour heat cycle test of the modules reveals that the cumulative failure rate after 27 years at 10C is expected to be 0.023%. These first generation LD modules were employed in the transoceanic commercial systems such as Pacific Crossing-1 and the Japan-US cable system projects. We have also succeeded in developing the 980 nm LD for higher output operation with optimizing waveguide design. The 1000 µm long LD showed CW kink-free operation up to 545 mW optical output and a maximum output power of over 650 mW, which was limited by thermal rollover. In addition, a preliminary aging test at 350 mW optical output power at 50C has shown stable operation up to 2,300 h. We also confirmed 300 mW kink-free fiber output power with a co-axial type module with the improved coupling efficiency of approximately 78%. These figures are the highest reported operation levels for 980-nm co-axial type modules.

Highly reliable and high power weakly index guided buried-stripe type 980 nm pump laser diodes developed for undersea applications are reviewed. The 10,000-hour large scale reliability tests of the first generation LD chips shows that 16.7 FIT for the random failure was confirmed at 10C with 60% confidence level at 120 mW output power. We also fabricated a FBG locked co-axial type module using a can-sealed LD with a two-lens system, which showed a stable FBG locked mode oscillation at 980 nm under the temperature range from 5C to 45C. The 5,000-hour heat cycle test of the modules reveals that the cumulative failure rate after 27 years at 10C is expected to be 0.023%. These first generation LD modules were employed in the transoceanic commercial systems such as Pacific Crossing-1 and the Japan-US cable system projects. We have also succeeded in developing the 980 nm LD for higher output operation with optimizing waveguide design. The 1000 µm long LD showed CW kink-free operation up to 545 mW optical output and a maximum output power of over 650 mW, which was limited by thermal rollover. In addition, a preliminary aging test at 350 mW optical output power at 50C has shown stable operation up to 2,300 h. We also confirmed 300 mW kink-free fiber output power with a co-axial type module with the improved coupling efficiency of approximately 78%. These figures are the highest reported operation levels for 980-nm co-axial type modules.

To improve the reliability and efficiency of multicast transmissions in wireless systems, a novel retransmission procedure is desired. In this paper, the representative acknowledgment scheme for reliable wireless multicast communications is proposed that offers quite a low packet loss rate. The proposed protocol carries out retransmissions in the datalink layer within the wireless region, and retransmissions do not affect the traffic in the wired region. The representative acknowledgment scheme employs both positive acknowledgment (ACK) and negative acknowledgment (NACK) to achieve reliable multicast transmissions and reduces the number of responses to be returned by forming groups of stations in the cell. One of the members in a group, called a representative station, returns a response for a received data frame while the others return a NACK if necessary. With this scheme, reliable multicast transmissions are enabled in wireless communications without spending much time as in conventional reliable multicast protocols. The performance of the proposed protocol is evaluated by numerical analyses and by computer simulation. The results show that 30% or more decrease in transmission time is achieved in a typical wireless environment.

In this paper, we examine an optimal reliability assignment/redundant allocation problem formulated as a nonlinear mixed integer programming (nMIP) model which should simultaneously determine continuous and discrete decision variables. This problem is more difficult than the redundant allocation problem represented by a nonlinear integer problem (nIP). Recently, several researchers have obtained acceptable and satisfactory results by using genetic algorithms (GAs) to solve optimal reliability assignment/redundant allocation problems. For large-scale problems, however, the GA has to enumerate a vast number of feasible solutions due to the broad continuous search space. To overcome this difficulty, we propose a hybridized GA combined with a neural-network technique (NN-hGA) which is suitable for approximating optimal continuous solutions. Combining a GA with the NN technique makes it easier for the GA to solve an optimal reliability assignment/redundant allocation problem by bounding the broad continuous search space by the NN technique. In addition, the NN-hGA leads to optimal robustness and steadiness and does not affect the various initial conditions of the problems. Numerical experiments and comparisons with previous results demonstrate the efficiency of our proposed method.

This paper proposes a statistical method to estimate the optimal software release time which minimizes the expected total software cost incurred in both testing and operation phases. It is shown that the underlying cost minimization problem can be reduced to a graphical one. This implies that the software release problem under consideration is essentially equivalent to a time series forecasting for the software fault-occurrence time data. In order to predict the future fault-occurrence time, we apply three extraordinary auto-regressive models by Singpurwalla and Soyer (1985) as the prediction devices as well as the well-known AR and ARIMA models. Numerical examples are devoted to illustrate the predictive performance for the proposed method. We compare it with the classical exponential software reliability growth model based on the non-homogeneous Poisson process, using actual software fault-occurrence time data.