Recently, the wavelet-based estimation method has gradually been becoming popular as a new tool for software reliability assessment. The wavelet transform possesses both spatial and temporal resolution which makes the wavelet-based estimation method powerful in extracting necessary information from observed software fault data, in global and local points of view at the same time. This enables us to estimate the software reliability measures in higher accuracy. However, in the existing works, only the point estimation of the wavelet-based approach was focused, where the underlying stochastic process to describe the software-fault detection phenomena was modeled by a non-homogeneous Poisson process. In this paper, we propose an interval estimation method for the wavelet-based approach, aiming at taking account of uncertainty which was left out of consideration in point estimation. More specifically, we employ the simulation-based bootstrap method, and derive the confidence intervals of software reliability measures such as the software intensity function and the expected cumulative number of software faults. To this end, we extend the well-known thinning algorithm for the purpose of generating multiple sample data from one set of software-fault count data. The results of numerical analysis with real software fault data make it clear that, our proposal is a decision support method which enables the practitioners to do flexible decision making in software development project management.

This study investigated the test-retest reliability and the criterion-related validity of the Implicit Association Test (IAT [1]) that was developed for measuring shyness among Japanese people. The IAT has been used to measure implicit stereotypes, as well as self-concepts, such as implicit shyness and implicit self-esteem. We administered the shyness IAT and the self-esteem IAT to participants (N = 59) on two occasions over a one-week interval (Time 1 and Time 2) and examined the test-retest reliability by correlating shyness IATs between the two time points. We also assessed the criterion-related validity by calculating the correlation between implicit shyness and implicit self-esteem. The results indicated a sufficient positive correlation coefficient between the scores of implicit shyness over the one-week interval (r = .67, p < .01). Moreover, a strong negative correlation coefficient was indicated between implicit shyness and implicit self-esteem (r = -.72, p < .01). These results confirmed the test-retest reliability and the criterion-related validity of the Japanese version of the shyness IAT, which is indicative of the validity of the test for assessing implicit shyness.

The effects of fluorine implantation on flicker noise and reliability of NMOSFET and PMOSFETs were concurrently investigated. The flicker noise of an NMOSFET was decreased about 66% by fluorine implantation, and that of a PMOSET was decreased about 76%. As indicated by the results, fluorine implantation is one of the methods that can be used to improve the noise characteristics of MOSFET devices. However, hot-carrier degradation was enhanced by fluorine implantation in NMOSFETs, which can be related to the difference of molecular binding within the gate oxide. On the contrary, in case of PMOSFETs, NBTI life time was increased by fluorine implantation. Therefore, concurrent investigation of hot-carrier and NBTI reliability and flicker noise is necessary in developing MOSFETs for analog/digital mixed signal applications.

This paper proposes a novel method to determine a priority for applying selective triple modular redundancy (selective TMR) against single event upset (SEU) to achieve cost-effective reliable implementation of application circuits onto coarse-grained reconfigurable architectures (CGRAs). The priority is determined by an estimation of the vulnerability of each node in the data flow graph (DFG) of the application circuit. The estimation is based on a weighted sum of the node parameters which characterize impact of the SEU in the node on the output data. This method does not require time-consuming placement-and-routing processes, as well as extensive fault simulations for various triplicating patterns, which allows us to identify the set of nodes to be triplicated for minimizing the vulnerability under given area constraint at the early stage of design flow. Therefore, the proposed method enables us efficient design space exploration of reliability-oriented CGRAs and their applications.

In this paper we show that self synchronous circuits can provide robust operation in both soft error prone and low voltage operating environments. Self synchronous circuits are shown to be self checking, where a soft error will either cause a detectable error or halt operation of the circuit. A watchdog circuit is proposed to autonomously detect dual-rail '11' errors and prevent propagation, with measurements in 65 nm CMOS showing seamless operation from 1.6 V to 0.37 V. Compared to a system without the watchdog circuit size and energy-per-operation is increased 6.9% and 16% respectively, while error tolerance to noise is improved 83% and 40% at 1.2 V and 0.4 V respectively. A circuit that uses the dual-pipeline circuit style as redundancy against permanent faults is also presented and 40 nm CMOS measurement results shows correct operation with throughput of 1.2 GHz and 810 MHz at 1.1 V before and after disabling a faulty pipeline stage respectively.

A solution-processed photosensitive passivation layer with a low dielectric constant (PPLD) has been developed for an a-Si thin film transistor. The PPLD has three highly important properties: a low leakage current, low water absorption, and high-transparency. In addition to providing passivation, the PPLD doubles as a planarization layer. The photoactive property of the PPLD is convenient for its adaption to LCD manufacturing process. A photoactive compound contained in the PPLD enables the formation of contact holes and patterns via a photolithography process. Meanwhile, the PPLD requires ITO workability and strong adhesion property on metal and glass substrates. Apart from the above features, an a-Si TFT must perform with extremely high reliability if it is to replace the conventional inorganic passivation layer (SiNx:H). This reliability has been achieved by an a-Si TFT and LCD panel coated with the PPLD. A reliability test was conducted under a high-temperature, high-humidity (HH) condition to examine how resistant the electronic characteristics were to change. The PPLD-coated LCD panel display view showed no defects for a test duration of HH200 hours. This high reliability was presumed to be at least partly attributable to the low water absorption rate of the passivation layer and the suppression of the increase of the TFT off-leakage current by the PPLD, a passivation layer designed to be non-polar as possible. Judging from the results of these experiments, this solution-processed passivation layer seems to be a viable substitute for the conventional inorganic passivation layer. For a larger screen LCD and higher drive frequency, the problem of RC delay has been emerged. The low dielectric constant of the PPLD will suppress the RC delay of the signal and realize both a higher pixel and a higher drive frequency.

This letter presents a novel weighted reliability-based (WRB) algorithm for decoding low-density parity-check (LDPC) codes. Viewing the well-known normalized min sum (NMS) algorithm as reliability-based, the WRB algorithm can be seen as a simplified version of the NMS algorithm. Unlike the NMS algorithm, the WRB algorithm does not update the soft information sent between the variable nodes and check nodes, which greatly reduces the decoding complexity. For finite geometry LDPC codes with larger row redundancy and column weights, simulation results show that the WRB algorithm almost matches the error performance of the NMS algorithm.

Directional antennas provide numerous benefits, such as higher gains, increased transmission range, and lower interferences. In this paper, we propose a reliable broadcast protocol for directional antenna referred to as beam table-based reliable broadcast for directional antennas (BTRB). The BTRB employs (1) ACK-based scheme to provide full reliability; (2) spatio-temporal ACK combination to resolve the problems of ACK implosion and transmission delay; and (3) beam table caching to represent spatial relationship among destination nodes in the broadcast group. Performance evaluation has shown that the proposed BTRB shows full reliability and outperforms existing reliable broadcast schemes with respect to transmission delay by about 55%.

In this paper, we discuss the stochastic modeling for operational software reliability measurement, assuming that the testing environment is originally different from the user operation one. In particular, we introduce the concept of systemability which is defined as the reliability characteristic subject to the uncertainty of the field operational environment into the model. First we introduce the environmental factor to consistently bridge the gap between the software failure-occurrence characteristics during the testing and the operation phases. Then we consider the randomness of the environmental factor, i.e., the environmental factor is treated as a random-distributed variable. We use the Markovian imperfect debugging model to describe the software reliability growth phenomena in the testing and the operation phases. We derive the analytical solutions of the several operational software reliability assessment measures which are given as the functions of time and the number of debuggings. Finally, we show several numerical illustrations to investigate the impacts of the consideration of systemability on the field software reliability evaluation.

An exponential regression-based model with stochastic intensity is developed to describe the software reliability growth phenomena, where the software testing metrics depend on the intensity process. For such a generalized modeling framework, the common maximum likelihood method cannot be applied any more to the parameter estimation. In this paper, we propose to use the pseudo maximum likelihood method for the parameter estimation and to seek not only the model parameters but also the software reliability measures approximately. It is shown in numerical experiments with real software fault data that the resulting software reliability models based on four parametric approximations provide the better goodness-of-fit performance than the common non-homogeneous Poisson process models without testing metric information.

Recently, a flexible loss recovery scheme, called Active Caching (AC) has been proposed to accomplish a Desired Communication Reliability (DCR) about the whole data packets at a source depending on the various applications. However, since AC does not consider the packet delivery rate of each wireless link on multi-hop forwarding paths, it increases the number of totally transmitted packets to achieve a DCR and thus grows the energy consumption of sensor nodes. Thus, this letter proposes a novel recovery scheme which can minimize the number of totally transmitted packets while satisfying a DCR. By geometric programming, the proposed scheme allocates an optimized one-hop packet transmission rate of each wireless link on the multi-hop forwarding path.

As the Internet represents a key social infrastructure, its reliability is essential if we are to survive failures. Physical connectivity of networks is also essential as it characterizes reliability. There are collaboration structures, which are topological structures where two or more nodes are connected to a node, and collaboration structures are observed in transcriptional regulatory networks and the router-level topologies of ISPs. These collaboration structures are related to the reliability of networks. The main objective of this research is to find whether an increase in collaboration structures would improve reliability or not. We first categorize the topology into a three-level hierarchy for this purpose, i.e., top-level, middle-level, and bottom-level layers. We then calculate the reliability of networks. The results indicate that the reliability of most transcriptional regulatory networks is higher than that of one of router-level topologies. We then investigate the number of collaboration structures. It is apparent that there are much fewer collaboration structures between top-level nodes and middle-level nodes in router-level topologies. Finally, we confirm that the reliability of router-level topologies can be improved by rewiring to increase the collaboration structures between top-level and middle-level nodes.

Non-homogeneous Poisson processes (NHPPs) have gained much popularity in actual software testing phases to estimate the software reliability, the number of remaining faults in software and the software release timing. In this paper, we propose a new modeling approach for the NHPP-based software reliability models (SRMs) to describe the stochastic behavior of software fault-detection processes. The fundamental idea is to apply the equilibrium distribution to the fault-detection time distribution in NHPP-based modeling. We also develop efficient parameter estimation procedures for the proposed NHPP-based SRMs. Through numerical experiments, it can be concluded that the proposed NHPP-based SRMs outperform the existing ones in many data sets from the perspective of goodness-of-fit and prediction performance.

This paper proposes a direction-of-arrival (DOA) estimation method of multiple speech sources from a stereophonic mixture in an underdetermined case where the number of sources exceeds the number of sensors. The method relies on the sparseness of speech signals in time-frequency (T-F) domain representation which means multiple independent speakers have a small overlap. At first, a selection of T-F cells bearing reliable spatial information is proposed by an introduced reliability index which is defined by the estimated interaural phase difference at each T-F cell. Then, a statistical error propagation model between the phase difference at T-F cell and its consequent DOA is introduced. By employing this model and the sparseness in T-F domain the DOA estimation problem is altered to obtaining local peaks of probability density function of DOA. Finally the kernel density estimator approach based on the proposed statistical model is applied. The performance of the proposed method is assessed by conducted experiments. Our method outperforms others both in accuracy for real observed data and in robustness for simulation with additional diffused noise.

As MOS transistors are scaled down, the impact of randomly placed discrete charge (impurity atoms, traps and surface states) on device characteristics rapidly increases. Significant variability caused by random dopant fluctuation (RDF) is a direct result of this, which urges the adoption of new device architectures (ultra-thin body SOI FETs and FinFETs) which do not use impurity for body doping. Variability caused by traps and surface states, such as random telegraph noise (RTN), though less significant than RDF today, will soon be a major problem. The increased complexity of such residual-charge-induced variability due to non-Gaussian and time-dependent behavior will necessitate new approaches for variation-aware design.

To develop the advanced and rich life, and the also economy and social activity continuously, various types of energy are necessary. At the same time, to protect the global environment and to prevent the depletion of natural resources, the effective and moreover efficient use of energy is becoming important. Electric power is one of the most important forms of energy for our life and society. This paper describes topics and survey results of technical trends regarding the electric power supply systems which are playing a core role as the important infrastructure to support the emergence of information-oriented society. Specifically, the power supply systems that enhance high power quality and reliability (PQR) are important for the steady growth of information and communication services. The direct current (DC) power, which has been used for telecommunications power systems and information and communications technologies (ICT), enables existing utilities' grid and distributed energy resources to keep a balance between supply and demand of small-scaled power systems or microgirds. These techniques are expected to be part of smartgrid technologies and facilitate the installation of distributed generators in mission critical facilities.

Large capacity tags are becoming available to meet the demands of industry, but the UHF RFID protocol is unable to reliably and efficiently read large data sets from tags. First of all, large data sets are not well protected. The tag merely relies on 16-bit CRC for ensuring the validity of up to 4,096-bit user-specific data in EPCglobal C1G2 protocol. Furthermore, the reliability will be even worse if large capacity tags are implemented using semi-active technology which is likely to prevail among sensor-integrated RFID tags. Since semi-active tags greatly alleviate the performance limitation imposed by the turn-on power of the tag chip, backscattering signal of semi-active tags could be a serious challenge for most readers because it is much weaker than signals emitted by passive tags due to longer reading distance. In this paper, Interim CRC is presented to enhance transmission reliability and efficiency when the tag is backscattering a large data set. By taking advantage of Interim CRC, the large data set can be divided into several blocks, and 16-bit checksum is calculated over each block. The tag backscatters all blocks at the first time and only retransmits certain blocks if CRC error occurs in those blocks. The result of simulation shows that the reading error rate can be confined to a preset threshold and the accumulative total of transmitted data are greatly reduced if optimal block size and transmission times are complied with. The simulation also conclusively proves that semi-active tags derive even longer reading range from Interim CRC. In addition, Interim CRC is totally compliant with the EPCglobal C1G2 protocol. It fully makes use of CRC-16 encoder and does not involve any other data encoding schematics and hardware modifications.

Although unavailability and failure frequency are important reliability measures for designing telecommunications networks, having two different reliability measures causes difficulties when their evaluation results contradict each other. To overcome this difficulty, for determining a single reliability measure is proposed. Market share, which is an important management index, was used and the effect of each reliability measure on this index was studied. If we the effect of one of the reliability measures is small enough to be ignored, then the other one is chosen as the single reliability measure. The procedure of the proposed statistical analysis method and test results suggesting that failure frequency is promising as a single reliability measure are discussed.

In this paper, a novel visual signal reliability (VSR) measure is proposed to consider video degradation at the signal level in audio-visual speaker identification (AVSI). The VSR estimation is formulated using a~ Gaussian fuzzy membership function (GFMF) to measure lighting variations. The variance parameters of GFMF are optimized in order to maximize the performance of the overall AVSI. The experimental results show that the proposed method outperforms the score-based reliability measuring technique.

Generally, the failure rate of a sealed relay is regarded as a constant value, no matter where and how it is used. However, the failure processes of sealed relays won't be the same under different conditions, even for one relay, its failure rate also will be changed during operations. This paper studies the failure process of a kind of sealed relay by analyzing the variations of its time parameters. Among contact resistance and all those time parameters, it is found that closing gap time can indicate the failure process of tested relay very well. For the purpose of verifying this conclusion derived from time parameters, the contacts are observed by microscope after the tested relay failed. Both theoretical calculation result of contacts gap and photos taken by microscope show that the hypothetic failure mode derived from time parameters is reasonable. Based on the failure analysis, the paper also proposes a dynamic reliability estimation method with closing gap time.