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[Keyword] dropout(12hit)

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  • Shift Quality Classifier Using Deep Neural Networks on Small Data with Dropout and Semi-Supervised Learning

    Takefumi KAWAKAMI  Takanori IDE  Kunihito HOKI  Masakazu MURAMATSU  

     
    PAPER-Pattern Recognition

      Pubricized:
    2023/09/05
      Vol:
    E106-D No:12
      Page(s):
    2078-2084

    In this paper, we apply two methods in machine learning, dropout and semi-supervised learning, to a recently proposed method called CSQ-SDL which uses deep neural networks for evaluating shift quality from time-series measurement data. When developing a new Automatic Transmission (AT), calibration takes place where many parameters of the AT are adjusted to realize pleasant driving experience in all situations that occur on all roads around the world. Calibration requires an expert to visually assess the shift quality from the time-series measurement data of the experiments each time the parameters are changed, which is iterative and time-consuming. The CSQ-SDL was developed to shorten time consumed by the visual assessment, and its effectiveness depends on acquiring a sufficient number of data points. In practice, however, data amounts are often insufficient. The methods proposed here can handle such cases. For the cases wherein only a small number of labeled data points is available, we propose a method that uses dropout. For those cases wherein the number of labeled data points is small but the number of unlabeled data is sufficient, we propose a method that uses semi-supervised learning. Experiments show that while the former gives moderate improvement, the latter offers a significant performance improvement.

  • Ultra-Low Quiescent Current LDO with FVF-Based Load Transient Enhanced Circuit Open Access

    Kenji MII  Akihito NAGAHAMA  Hirobumi WATANABE  

     
    PAPER-Electronic Circuits

      Pubricized:
    2020/05/28
      Vol:
    E103-C No:10
      Page(s):
    466-471

    This paper proposes an ultra-low quiescent current low-dropout regulator (LDO) with a flipped voltage follower (FVF)-based load transient enhanced circuit for wireless sensor network (WSN). Some characteristics of an FVF are low output impedance, low voltage operation, and simple circuit configuration [1]. In this paper, we focus on the characteristics of low output impedance and low quiescent current. A load transient enhanced circuit based on an FVF circuit configuration for an LDO was designed in this study. The proposed LDO, including the new circuit, was fabricated in a 0.6 µm CMOS process. The designed LDO achieved an undershoot of 75 mV under experimental conditions of a large load transient of 100 µA to 10 mA and a current slew rate (SR) of 1 µs. The quiescent current consumed by the LDO at no load operation was 204 nA.

  • Recognition of Online Handwritten Math Symbols Using Deep Neural Networks

    Hai DAI NGUYEN  Anh DUC LE  Masaki NAKAGAWA  

     
    PAPER-Pattern Recognition

      Pubricized:
    2016/08/30
      Vol:
    E99-D No:12
      Page(s):
    3110-3118

    This paper presents deep learning to recognize online handwritten mathematical symbols. Recently various deep learning architectures such as Convolution neural networks (CNNs), Deep neural networks (DNNs), Recurrent neural networks (RNNs) and Long short-term memory (LSTM) RNNs have been applied to fields such as computer vision, speech recognition and natural language processing where they have shown superior performance to state-of-the-art methods on various tasks. In this paper, max-out-based CNNs and Bidirectional LSTM (BLSTM) networks are applied to image patterns created from online patterns and to the original online patterns, respectively and then combined. They are compared with traditional recognition methods which are MRFs and MQDFs by recognition experiments on the CROHME database along with analysis and explanation.

  • An Ultra-Low Voltage Analog Front End for Strain Gauge Sensory System Application in 0.18 µm CMOS

    Alexander EDWARD  Pak Kwong CHAN  

     
    PAPER-Electronic Circuits

      Vol:
    E95-C No:4
      Page(s):
    733-743

    This paper presents analysis and design of a new ultra-low voltage analog front end (AFE) dedicated to strain sensor applications. The AFE, designed in 0.18 µm CMOS process, features a chopper-stabilized instrumentation amplifier (IA), a balanced active MOSFET-C 2nd order low pass filter (LPF), a clock generator and a voltage booster which operate at supply voltage (Vdd) of 0.6 V. The designed IA achieves 30 dB of closed-loop gain, 101 dB of common-mode rejection ratio (CMRR) at 50 Hz, 80 dB of power-supply rejection ratio (PSRR) at 50 Hz, thermal noise floor of 53.4 nV/, current consumption of 14 µA, and noise efficiency factor (NEF) of 9.7. The high CMRR and rail-to-rail output swing capability is attributed to a new low voltage realization of the active-bootstrapped technique using a pseudo-differential gain-boosting operational transconductance amplifier (OTA) and proposed current-driven bulk (CDB) biasing technique. An output capacitor-less low-dropout regulator (LDO), with a new fast start-up LPF technique, is used to regulate this 0.6 V supply from a 0.8–1.0 V energy harvesting power source. It achieves power supply rejection (PSR) of 42 dB at frequency of 1 MHz. A cascode compensated pseudo differential amplifier is used as the filter's building block for low power design. The filter's single-ended-to-balanced converter is implemented using a new low voltage amplifier with two-stage common-mode cancellation. The overall AFE was simulated to have 65.6 dB of signal-to-noise ratio (SNR), total harmonic distortion (THD) of less than 0.9% for a 100 Hz sinusoidal maximum input signal, bandwidth of 2 kHz, and power consumption of 51.2 µW. Spectre RF simulations were performed to validate the design using BSIM3V3 transistor models provided by GLOBALFOUNDRIES 0.18 µm CMOS process.

  • Transient Response Enhancement on the Output-Capacitorless Low-Dropout Regulator Using the Multipath Nested Miller Compensation with a Transient Quiescent Current Booster

    Chun-Hsun WU  Le-Ren CHANG-CHIEN  

     
    PAPER-Electronic Circuits

      Vol:
    E94-C No:9
      Page(s):
    1464-1471

    Low drop-out regulators (LDOs) are widely used in the system-on-a-chip (SoC) design. Due to the multi-function and energy saving requirements for mobile applications nowadays, more strict specifications are expected on the developmental roadmap of the LDOs. An output-capacitorless LDO providing fast transient response under the low supply voltage and low quiescent current conditions is proposed in this paper. Provided by the low supply voltage, the proposed LDO adopts cascading technique using the Multipath Nested Miller Compensation (MNMC) to maintain a higher bandwidth for fast transient requirement. In addition, a Transient Quiescent Current Booster (TQCB) is supplemented to the operational amplifier to improve the slew rate for the fast load transient. The TQCB only raises the quiescent current during the load transient instant so that both power saving and the load response improvement could be well achieved. It deserves noting that the proposed TQCB contains only two transistors, which is simple to be implemented compared to the other transient current enhancement techniques. The designed LDO has only 1.6 pF capacitance for the totally added on-chip compensation, and 25.8 µA of current consumption in the main amplifier. The recovery time under the fast load change is less than 3 µs and the stability is guaranteed. Test results from the real implementation of a 0.35 µm CMOS process verify that the designed LDO performs as expected.

  • 0.5-V Input Digital Low-Dropout Regulator (LDO) with 98.7% Current Efficiency in 65 nm CMOS

    Yasuyuki OKUMA  Koichi ISHIDA  Yoshikatsu RYU  Xin ZHANG  Po-Hung CHEN  Kazunori WATANABE  Makoto TAKAMIYA  Takayasu SAKURAI  

     
    PAPER

      Vol:
    E94-C No:6
      Page(s):
    938-944

    In this paper, Digital Low Dropout Regulator (LDO) is proposed to provide the low noise and tunable power supply voltage to the 0.5-V near-threshold logic circuits. Because the conventional LDO feedback-controlled by the operational amplifier fail to operate at 0.5 V, the digital LDO eliminates all analog circuits and is controlled by digital circuits, which enables the 0.5-V operation. The developed digital LDO in 65 nm CMOS achieved the 0.5-V input voltage and 0.45-V output voltage with 98.7% current efficiency and 2.7-µA quiescent current at 200-µA load current. Both the input voltage and the quiescent current are the lowest values in the published LDO's, which indicates the good energy efficiency of the digital LDO at 0.5-V operation.

  • LDO Design Methodology and an Intelligent Power Management Sub-System IC for CDMA Handsets

    Tsutomu WAKIMOTO  

     
    PAPER-Electronic Circuits

      Vol:
    E93-C No:10
      Page(s):
    1518-1524

    This paper describes the design methodology of a low dropout regulator (LDO). It was used to develop a power management sub-system IC for CDMA handsets which is also described in this paper. This IC contains 11 LDOs, bandgap reference, battery charger, control logic and some other peripheral circuits. For CDMA applications, very small ground current in the order of µA in standby mode is required for LDOs. An LDO architecture to meet this requirement and achieve stable operation over the process variation was developed. The on-chip logic efficiently controls all LDOs and battery charger to reduce the power dissipation as much as possible. This mixed signal subsystem has been implemented in the in-house 0.6-µm BCDMOS process. The very low LDO ground current down to 3 µA has been achieved with stable operation.

  • A Low-Power High Accuracy Over Current Protection Circuit for Low Dropout Regulator

    Socheat HENG  Cong-Kha PHAM  

     
    PAPER-Electronic Circuits

      Vol:
    E92-C No:9
      Page(s):
    1208-1214

    In this paper, a low power current protection circuit implemented in a low dropout regulator (LDO) is presented. The proposed circuit, designed in a 0.35 µm CMOS process, provides a precise limiting current as well as holding current with low dependency on both supply voltage and regulator output voltage. The experimental results showed that the proposed circuit is operable in the regulator output voltage range from VOUT=1.2 V to VOUT=3.6 V and supply voltage range from VDD=VOUT+0.5 V to VDD=5.6 V. Since the proposed circuit is composed of few simple basic circuits such as a comparator and a Schmitt Trigger, it has a low current consumption of less than ISS=0.82 µA at a load current of ILOAD=200 mA. This makes the circuit suitable for low power and low voltage LDO design.

  • A Low Noise CMOS Low Dropout Regulator with an Area-Efficient Bandgap Reference

    Sangwon HAN  Jongsik KIM  Kwang-Ho WON  Hyunchol SHIN  

     
    LETTER-Electronic Circuits

      Vol:
    E92-C No:5
      Page(s):
    740-742

    In a low dropout (LDO) linear regulator whose reference voltage is supplied by a bandgap reference, double stacked diodes increase the effective junction area ratio in the bandgap reference, which significantly lowers the output spectral noise of the LDO. A low noise LDO with the area-efficient bandgap reference is implemented in 0.18 µm CMOS. An effective diode area ratio of 105 is obtained while the actual silicon area is saved by a factor of 4.77. As a result, a remarkably low output noise of 186 nV/sqrt(Hz) is achieved at 1 kHz. Moreover, the dropout voltage, line regulation, and load regulation of the LDO are measured to be 0.3 V, 0.04%/V, and 0.46%, respectively.

  • A CMOS Low Dropout Regulator with Extended Stable Region for the Effective Series Resistance of the Output Capacitor

    Hsuan-I PAN  Chern-Lin CHEN  

     
    PAPER-Electronic Circuits

      Vol:
    E91-C No:8
      Page(s):
    1356-1364

    In this paper, a new compensation scheme and a corresponding pass element structure for a CMOS low-dropout regulator (LDO) are presented. The proposed approach effectively alleviates the strict stability constraint on the ESR of the output capacitor. Stability of a CMOS LDO with the conventional compensation requires the effective series resistance (ESR) of the output capacitor in a tunnel-like region. With the proposed design approach, an LDO can be stable using an output capacitor without ESR. A 2.5 V/150 mA LDO has been implemented using a 0.5-µm 1P2M CMOS process. The experimental results illustrate that the proposed LDO is stable with an output capacitor of 0.33 µF and no ESR.

  • A 60 µA Quiscent Current, 250 mA CMOS Low Dropout Regulator

    Yen-Shyung SHYU  Jiin-Chuan WU  

     
    PAPER-Electronic Circuits

      Vol:
    E84-C No:5
      Page(s):
    693-703

    A fully integrated Low Dropout (LDO), low quiescent current regulator has been fabricated in a 0.6 µm CMOS technology. It is stable with low and high effective series resistance (ESR) capacitors. A dynamic feedback (DNFB) bias technique is used to bias the error amplifier in the LDO such that good current efficiency is achieved while maintaining a good transient response. In order to compare the performance of the LDO regulators with and without dynamic feedback, the error amplifiers are configured to have a large bias current (LC), a small bias current (SC) and a bias with dynamic feedback current using switches. The measurement results show that DNFB's line and load regulations are 0.145%/V and 11 ppm/mA, respectively. Besides, there is about 33% reduction in settling time and voltage drop compared with SC LDO when load current is switching from 0 mA to 50 mA. In order to reduce the dropout voltage, a dropout reduction circuitry based on DNFB is also designed to reduce the threshold voltage of LDO's output PMOS. The measured dropout reduction is 8.1 mV which can be further reduced by a larger feedback ratio in DNFB. The quiescent current of this LDO is measured to be 59.4 µ A and this LDO can provide a maximum output current of 250 mA at an input voltage of 3.6 V. The active area of this LDO is 760 µ m 714 µ m.

  • Magnetic Tape Deformation due to Wear Debris and Its Influence on Spacing Loss

    Takashi YOSHIZAWA  

     
    PAPER

      Vol:
    E81-C No:3
      Page(s):
    349-355

    The tape deformation due to such particles as wear debris and dust in the head/tape contact region is one of the main causes of the signal quality deterioration in magnetic tape devices. Thus it is significant to make clear the tape deformation due to a particle for realizing higher recording densities. This paper investigates the tape deformation profile generated by a particle through an interferometric experiment and a simulation using a point loaded tape model. A rather good agreement between them is obtained, thereby the simulation is verified appropriate to estimate the tape deformation due to a particle. This paper also describes the relationship between the spacing loss and the particle height, considering the tape deformation profile obtained from the simulation. In addition, the influence of the particle height on the width of the tape deformed area is estimated, which can make a basis of the design of error correction code.