This paper proposes an ultra-low quiescent current low-dropout regulator (LDO) with a flipped voltage follower (FVF)-based load transient enhanced circuit for wireless sensor network (WSN). Some characteristics of an FVF are low output impedance, low voltage operation, and simple circuit configuration [1]. In this paper, we focus on the characteristics of low output impedance and low quiescent current. A load transient enhanced circuit based on an FVF circuit configuration for an LDO was designed in this study. The proposed LDO, including the new circuit, was fabricated in a 0.6 µm CMOS process. The designed LDO achieved an undershoot of 75 mV under experimental conditions of a large load transient of 100 µA to 10 mA and a current slew rate (SR) of 1 µs. The quiescent current consumed by the LDO at no load operation was 204 nA.

This paper presents a new low-dropout (LDO) regulator with low-quiescent, high-drive and fast-transient performance. This is based on a new composite power transistor composed of a shunt feedback class-AB embedded gain stage and the application of dynamic-biasing schemes to both the error amplifier as well as the composite power transistor. The proposed LDO regulator has been simulated and validated using BSIM3 models and GLOBALFOUNDRIES 0.18-µm CMOS process. The simulation results have shown that the LDO regulator consumes 4.7 µA quiescent current at no load, regulating the output at 1 V from a minimum 1.2 V supply. It is able to deliver up to 450 mA load current with a dropout of 200 mV. It can be stabilized using a 4.7 µF output capacitor with a 0.1 Ω ESR resistor. The maximum transient output voltage is 64.6 mV on the basis of a load step change of 450 mA/10 ns under typical condition. The full load transient response is less than 350 ns.

This paper presents an accurate and systematic method to simulate the interference imposed on the input/output (I/O) ports of electronic equipment under the electrical fast transients/burst (EFT/B) test. The equivalent circuit of the EFT/B generator and the coupling clamp are modeled respectively. Firstly, a transfer function (TF) of the EFT pulse-forming network is constructed with the latent parameters based on circuit theory. In the TF, two negative real parameters characterize the non-oscillation process of the network while one complex conjugate pair characterizes the damping-oscillation process. The TF of the pulse-forming network is therefore synthesized in the equivalent circuit of the EFT/B generator. Secondly, the standard coupling clamp is modeled based on the scatter (S) parameter obtained by using a vector network analyzer. By applying the vector fitting method during the rational function approximation, a macromodel of the coupling clamp can be obtained and converted to a Spice compatible equivalent circuit. Based on the aforementioned procedures, the interference imposed on the I/O ports can be simulated. The modeling methods are validated experimentally, where the interference in differential mode and common mode is evaluated respectively.

Method for eliminating magnetic saturation in low-voltage and high-current DC-DC converter with fast dynamic response is described. The magnetic saturation is observed in onboard isolated bridge-type DC-DC converter due to inherently asymmetrical PWM signal during transient condition. The saturation is not eliminated by using ac-coupling capacitor for transformer. Mechanism of the saturation is analyzed and confirmed by experiments. Based on the analysis a solution for the magnetic saturation is proposed. The effectiveness of proposed method is also confirmed by experiments.

This paper presents an accurate and systematic method to model the equivalent circuit of pulse generator in the electrical fast transients/burst test (EFT/B). Firstly, a new analytical expression is presented to express the generator's charging and discharging process under open-condition (1000-Ω), which all its coefficients are determined according to the output waveform specified by the manufacturer. And then, with adoption of the step source, the transfer function of the pulse forming network in Laplace domain is deduced, which is ready for the network synthesis. Based on above discussion, the parameterized method and the technique of constant-resistance are adopted for the network synthesis. Finally, the equivalent circuit is renormalized and improved to meet the specification under matching-condition (50-Ω). In this way, the equivalent circuit of EFT/B generator is obtained and can be adjusted conveniently to satisfy the different manufacturers. The PSPICE simulation with a certain load is validated by measurement.

The very fast transients of micro-gap discharges driven by low voltage electrostatic discharging (ESDs) are investigated in the time domain. We previously developed a 12 GHz wideband measurement setup consisting of a distributed constant line system, however the observed transients due to micro-gap discharges had very fast rise times of 34 ps or less, which reached the limitation on our system. In this paper, we proposed a method for estimating wideband transients beyond the measurement limit by using the transmission loss of a high performance coaxial transmission line. The proposed method is validated by estimating an impulsive voltage waveform with rise/fall time of 16 ps from the waveform measured through a semi-rigid coaxial cable with a length of 10 m.

The analysis of the shielding properties of chiral materials slabs is here presented, first deriving the spectral representation of the shielded fields, then getting the asymptotic expression of the transmission matrix in the higher frequencies. The time response of the shielded field for the NEMP incidence is finally deduced in a closed form.

The analysis of the shielding properties of a planar wire-mesh shield embedded in a general isotropic--chirality is included--or anisotropic stratified media is here presented. A suitable model of the grating has been introduced in order to consider the occuring phenomena, in fact through a spectral technique the electromagnetic problem is translated into the equivalent circuit network model that allows to express the time response of the shielded field for the NEMP incidence in a closed form.