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[Keyword] logic circuits(10hit)

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  • A Lower Bound on the Gate Count of Toffoli-Based Reversible Logic Circuits

    Takashi HIRAYAMA  Hayato SUGAWARA  Katsuhisa YAMANAKA  Yasuaki NISHITANI  

     
    PAPER-Reversible/Quantum Computing

      Vol:
    E97-D No:9
      Page(s):
    2253-2261

    We present a new lower bound on the number of gates in reversible logic circuits that represent a given reversible logic function, in which the circuits are assumed to consist of general Toffoli gates and have no redundant input/output lines. We make a theoretical comparison of lower bounds, and prove that the proposed bound is better than the previous one. Moreover, experimental results for lower bounds on randomly-generated reversible logic functions and reversible benchmarks are given. The results also demonstrate that the proposed lower bound is better than the former one.

  • A Delay Model of Multiple-Valued Logic Circuits Consisting of Min, Max, and Literal Operations

    Noboru TAKAGI  

     
    PAPER-Logic Design

      Vol:
    E93-D No:8
      Page(s):
    2040-2047

    Delay models for binary logic circuits have been proposed and clarified their mathematical properties. Kleene's ternary logic is one of the simplest delay models to express transient behavior of binary logic circuits. Goto first applied Kleene's ternary logic to hazard detection of binary logic circuits in 1948. Besides Kleene's ternary logic, there are many delay models of binary logic circuits, Lewis's 5-valued logic etc. On the other hand, multiple-valued logic circuits recently play an important role for realizing digital circuits. This is because, for example, they can reduce the size of a chip dramatically. Though multiple-valued logic circuits become more important, there are few discussions on delay models of multiple-valued logic circuits. Then, in this paper, we introduce a delay model of multiple-valued logic circuits, which are constructed by Min, Max, and Literal operations. We then show some of the mathematical properties of our delay model.

  • Design for Delay Fault Testability of 2-Rail Logic Circuits

    Kentaroh KATOH  Kazuteru NAMBA  Hideo ITO  

     
    LETTER-Dependable Computing

      Vol:
    E92-D No:2
      Page(s):
    336-341

    This paper presents a scan design for delay fault testability of 2-rail logic circuits. The flip flops used in the scan design are based on master-slave ones. The proposed scan design provides complete fault coverage in delay fault testing of 2-rail logic circuits. In two-pattern testing with the proposed scan design, initial vectors are set using the set-reset operation, and the scan-in operation for initial vectors is not required. Hence, the test application time is reduced to about half that of the enhanced scan design. Because the additional function is only the set-reset operation of the slave latch, the area overhead is small. The evaluation shows that the differences in the area overhead of the proposed scan design from those of the standard scan design and the enhanced scan design are 2.1 and -14.5 percent on average, respectively.

  • A Single-Electron-Transistor Logic Gate Family for Binary, Multiple-Valued and Mixed-Mode Logic

    Katsuhiko DEGAWA  Takafumi AOKI  Tatsuo HIGUCHI  Hiroshi INOKAWA  Yasuo TAKAHASHI  

     
    PAPER

      Vol:
    E87-C No:11
      Page(s):
    1827-1836

    This paper presents a model-based study of SET (Single-Electron-Transistor) logic gate family for synthesizing binary, MV (Multiple-Valued) and mixed-mode logic circuits. The use of SETs combined with MOS transistors allows compact realization of basic logic functions that exhibit periodic transfer characteristics. The operation of basic SET logic gates is successfully confirmed through SPICE circuit simulation based on the physical device model of SETs. The proposed SET logic gates are useful for implementing binary logic circuits, MV logic circuits and binary-MV mixed-mode logic circuits in a highly flexible manner. As an example, this paper describes design of various parallel counters for carry-propagation-free arithmetic, where MV signals are effectively used to achieve higher functionality with lower hardware complexity.

  • Parameter Optimization of Single Flux Quantum Digital Circuits Based on Monte Carlo Yield Analysis

    Nobuyuki YOSHIKAWA  Kaoru YONEYAMA  

     
    PAPER-Digital Applications

      Vol:
    E83-C No:1
      Page(s):
    75-80

    We have developed a parameter optimization tool, Monte Carlo Josephson simulator (MJSIM), for rapid single flux quantum (RSFQ) digital circuits based on a Monte Carlo yield analysis. MJSIM can generate a number of net lists for the JSIM, where all parameter values are varied randomly according to the Gaussian distribution function, and calculate the circuit yields automatically. MJSIM can also produce an improved parameter set using the algorithm of the center-of-gravity method. In this algorithm, an improved parameter vector is derived by calculating the average of parameter vectors inside and outside the operating region. As a case study, we have optimized the circuit parameters of an RS flip-flop, and investigated the validity and efficiency of this optimization method by considering the convergency and initial condition dependence of the final results. We also proposed a method for accelerating the optimization speed by increasing 3σ spreads of the parameter distribution during the optimization.

  • Design Considerations of Data-Driven Self-Timed RSFQ Adder Circuits

    Nobuyuki YOSHIKAWA  Hiroshi TAGO  Kaoru YONEYAMA  

     
    INVITED PAPER-Digital Applications

      Vol:
    E81-C No:10
      Page(s):
    1618-1626

    We have designed rapid single-flux-quantum (RSFQ) adder circuits using two different architectures: one is the conventional architecture employing globally synchronous clocking and the other is the data-driven self-timed (DDST) architecture. It has been pointed out that the timing margin of the RSFQ logic is very sensitive to the circuit parameter variations which are induced by the fabrication process and the device parameter uncertainty. Considering the physical timing in the circuits, we have shown that the DDST architecture is advantageous for realizing RSFQ circuits operating at very high frequencies. We have also calculated the theoretical circuit yield of the DDST adders and shown that a four-bit system operating at 10 GHz is feasible with sufficient operating margin, considering the present 1 kA/cm2 Nb Josephson technology.

  • Research Topics and Results on Digital Signal Processing

    Masayuki KAWAMATA  Tatsuo HIGUCHI  

     
    PAPER

      Vol:
    E76-A No:7
      Page(s):
    1087-1096

    This review presents research topics and results on digital signal processing in the last twenty years in Japan. The main parts of the review consist of design and analysis of multidimensional digital filters, multiple-valued logic circuits and number systems for signal processing, and general purpose signal processors.

  • Fault Analysis on (K+1)-Valued PLA Structure Logic Circuits

    Hui Min WANG  Chung Len LEE  Jwu E CHEN  

     
    PAPER-Fault Analysis, Testing and Verification

      Vol:
    E76-A No:6
      Page(s):
    1001-1010

    This paper presents a general form and a set of basic gates to implement (K+1)-valued PLA structure logic circuits. A complete fault analysis on the proposed circuit has been done and it is shown that all fanout stem faults can be collapsed to branch faults. A procedure for fault collapsing is derived. For any function implemented in the (K+1)-valued circuit, the number of remaining faults is smaller than that of the 2-valued circuit after the collapsing, where the value of K is dependent on the number of outputs and the assignment of the OR plane of the 2-valued logic circuit.

  • Prospects of Multiple-Valued VLSI Processors

    Takahiro HANYU  Michitaka KAMEYAMA  Tatsuo HIGUCHI  

     
    INVITED PAPER

      Vol:
    E76-C No:3
      Page(s):
    383-392

    Rapid advances in integrated circuit technology based on binary logic have made possible the fabrication of digital circuits or digital VLSI systems with not only a very large number of devices on a single chip or wafer, but also high-speed processing capability. However, the advance of processing speeds and improvement in cost/performance ratio based on conventional binary logic will not always continue unabated in submicron geometry. Submicron integrated circuits can handle multiple-valued signals at high speed rather than binary signals, especially at data communication level because of the reduced interconnections. The use of nonbinary logic or discrete-analog signal processing will not be out of the question if the multiple-valued hardware algorithms are developed for fast parallel operations. Moreover, in VLSI or ULSI processors the delay time due to global communications between functional modules or chips instead of each functional module itself is the most important factors to determine the total performance. Locally computable hardware implementation and new parallel hardware algorithms natural to multiple-valued data representation and circuit technologies are the key properties to develop VLSI processors in submicron geometry. As a result, multiple-valued VLSI processors make it possible to improve the effective chip density together with the processing speed significantly. In this paper, we summarize several potential advantages of multiple-valued VLSI processors in submicron geometry due to great reduction of interconnection and due to the suitability to locally computable hardware implementation, and demonstrate that some examples of special-purpose multiple-valued VLSI processors, which are a signed-digit arithmetic VLSI processor, a residue arithmetic VLSI processor and a matching VLSI processor can achieve higher performance for real-world computing system.

  • Coded Time-Symbolic Simulation for Timing Verification of Logic Circuits

    Nagisa ISHIURA  Yutaka DEGUCHI  Shuzo YAJIMA  

     
    PAPER

      Vol:
    E75-A No:10
      Page(s):
    1247-1254

    In this paper we propose a new timing verification technique named coded time-symbolic simulation, CTSS. Our interest is on simulation of logic circuits consisting of gates whose delay is specified only by its minimum and maximum values. Conventional logic simulation based on min/max delay model leads to over-pessimistic results. In our new method, the cases of possible delay values of each gate are encoded by binary vectors. The circuit behavior for all the possible combinations of the delay values are simulated based on symbolic simulation by assigning Boolean variables to the binary vectors. This simulation technique can deal with logic circuits containing feedback loops as well as combinational circuits. We implemented an efficient simulator by using shared binary decision diagrams (SBDD's) as internal representation of Boolean functions. We also propose novel techniques of analyzing the results of CTSS.