In this paper, we propose the low voltage CMOS current mode reference circuit using self-regulator with adaptive biasing technique. It drastically reduces the line sensitivity (LS) of the output voltage and the power supply voltage dependence of the temperature coefficient (TC). The self-regulator used in the proposed circuit adaptively generates the minimum voltage required the reference core circuit following the PVT (process, voltage and temperature) conditions. It makes possible to improve circuit performances instead of slightly increasing minimum power supply voltage. This proposed circuit has been designed and evaluated by SPICE simulation using TSMC 65nm CMOS process with 3.3V (2.5V over-drive) transistor option. From simulation results, LS is reduced to 0.0065%/V under 0.8V < VDD < 3.0V. TC is 67.6ppm/°C under the condition that the temperature range is from -40°C to 125°C and VDD range is from 0.8V to 3.0V. The power supply rejection ratio (PSRR) is less than -80.4dB when VDD is higher than 0.8V and the noise frequency is 100Hz. According to the simulation results, we could confirm that the performances of the proposed circuit are improved compared with the conventional circuit.

In this paper, we propose the novel low voltage CMOS current mode reference circuit. It reduces the minimum supply voltage by consisting the subthreshold two stage operational amplifier (OPAMP) which is regarded as the combination of the proportional to absolute temperature (PTAT) and the complementary to absolute temperature (CTAT) current generators. It makes possible to implement without extra OPAMP. This proposed circuit has been designed and evaluated by SPICE simulation using TSMC 65nm CMOS process with 3.3V (2.5V over-drive) transistor option. From simulation results, the line sensitivity is as good as 0.196%/V under the condition that the range of supply voltage (VDD) is wide as 0.6V to 3.0V. The temperature coefficient is 71ppm/ under the condition that the temperature range is from -40 to 125 and VDD=0.6V. The power supply rejection ratio (PSRR) is -47.7dB when VDD=0.6V and the noise frequency is 100Hz. According to comparing the proposed circuit with prior current mode circuits, we could confirm the performance of the proposed circuit is better than that of prior circuits.

A CMOS bandgap reference circuit without resistors, which can successfully operate under 1V supply voltage is proposed. The improvement is realized by the technique of the voltage divider and a new current source. The most attractive merit is that the proposed circuit breaks the bottleneck of low supply voltage design caused by the constant bandgap voltage value (1.25V). Moreover, the temperature coefficient of the reference voltage Vref is improved by compensating the temperature dependence caused by the current source. The simulation results using a standard CMOS 0.18 um process show that the value of Vref can be achieved around 0.5 V with a minimum supply voltage of 0.85 V. Meanwhile, the temperature coefficient of the output voltage is only 3.5ppm/°C from 0 °C to 70 °C.

This paper proposes an area efficient, low power, fractional CMOS bandgap reference (BGR) utilizing switched-current and current-memory techniques. The proposed circuit uses only one parasitic bipolar transistor and built-in current source to generate reference voltage. Therefore significant area and power reduction is achieved, and bipolar transistor device mismatch is eliminated. In addition, output reference voltage can be set to almost any value. The proposed circuit is designed and simulated in 0.18 µm CMOS process, and simulation results are presented. With a 1.6 V supply, the reference produces an output of about 628.5 mV, and simulated results show that the temperature coefficient of output is less than 13.8 ppm/ in the temperature range from 0 to 100. The average current consumption is about 8.5 µA in the above temperature range. The core circuit, including current source, opamp, current mirrors and switched capacitor filters, occupies less than 0.0064 mm2 (80 µm×80 µm).

This paper presents a resistor-compensation technique for a CMOS bandgap and current reference, which utilizes various high positive temperature coefficient (TC) resistors, a two-stage operational transconductance amplifier (OTA) and a simplified start-up circuit in the 0.35-µm CMOS process. In the proposed bandgap and current reference, numerous compensated resistors, which have a high positive temperature coefficient (TC), are added to the parasitic n-p-n and p-n-p bipolar junction transistor devices, to generate a temperature-independent voltage reference and current reference. The measurements verify a current reference of 735.6 nA, the voltage reference of 888.1 mV, and the power consumption of 91.28 µW at a supply voltage of 3.3 V. The voltage TC is 49 ppm/ in the temperature range from 0 to 100 and 12.8 ppm/ from 30 to 100. The current TC is 119.2 ppm/ at temperatures of 0 to 100. Measurement results also demonstrate a stable voltage reference at high temperature (> 30), and a constant current reference at low temperature (< 70).

In a low dropout (LDO) linear regulator whose reference voltage is supplied by a bandgap reference, double stacked diodes increase the effective junction area ratio in the bandgap reference, which significantly lowers the output spectral noise of the LDO. A low noise LDO with the area-efficient bandgap reference is implemented in 0.18 µm CMOS. An effective diode area ratio of 105 is obtained while the actual silicon area is saved by a factor of 4.77. As a result, a remarkably low output noise of 186 nV/sqrt(Hz) is achieved at 1 kHz. Moreover, the dropout voltage, line regulation, and load regulation of the LDO are measured to be 0.3 V, 0.04%/V, and 0.46%, respectively.

This paper describes the design and results of low cost integrated CMOS local and remote temperature sensors with digital outputs. No trimming is needed to obtain good temperature linearity, so that only one-temperature calibration is needed which greatly reduces testing cost. The base-emitter voltage of the parasitic substrate bipolar transistor is used to measure the local temperature. A diode-connected external bipolar transistor is used to measure the remote temperature. Chopper techniques were used to cancel the offset voltage of the op-amp, so that a precise bandgap voltage can be obtained without resistance trimming. A first order ΣΔ ADC was used to produce the digital output. The local and remote temperature sensors were realized in a 0.6 µm single-poly triple-metal CMOS technology with active area of 0.6 mm2 and 0.65 mm2, respectively. After calibration, the error is 1 for the local temperature sensor over the temperature range of -20 to 130, and 2 for the remote temperature sensor over the range of 0 to 120. The supply currents of the local and remote temperature sensors are 3.5 µA and 38 µA at 8 samples/s, respectively.