This paper presents a fully digital modulation calibration technique for channel mismatch of TIADC at any frequency. By pre-inputting a test signal in TIADC, the mismatch errors are estimated and stored, and the stored values will be extracted for compensation when the input signal is at special frequency which can be detected by a threshold judgement module, thus solving the problem that the traditional modulation calibration algorithm cannot calibrate the signal at special frequency. Then, by adjusting the operation order among the error estimation coefficient, modulation function and input signal in the calibration loop, further, the order of correlation and modulation in the error estimation module, the complexity of the proposed calibration algorithm is greatly reduced and it will not increase with the number of channels of TIADC. What's more, the hardware consumption of filters in calibration algorithm is greatly reduced by introducing a CSD (Canonical Signed Digit) coding technique based on Horner's rule and sub-expression sharing. Applied to a four-channel 14bit 560MHz TIADC system, with input signal at 75.6MHz, the FPGA verification results show that, after calibration, the spurious-free dynamic range (SFDR) improves from 33.47dB to 99.81dB and signal-to-noise distortion ratio (SNDR) increases from 30.15dB to 81.89dB.

This report describes an all-digital phase-locked loop (ADPLL) using a temperature compensated settling time reduction technique. The novelty of this work is autonomous oscillation control word estimation without a look-up table or memory circuits. The proposed ADPLL employs a multi-phase digitally controlled oscillator (DCO). In the proposed estimation method, the optimum oscillator tuning word (OTW) is estimated from the DCO frequency characteristic in the setup phase of ADPLL. The proposed ADPLL, which occupies 0.27×0.36mm2, is fabricated by a 65 nm CMOS process. The temperature compensation PLL controller (TCPC) is implemented using an FPGA. Although the proposed method has 20% area overhead, measurement results show that the 47% settling time is reduced. The average settling time at 25°C is 3µs. The average reduction energy is at least 42% from 0°C to 100°C.

A 4th-order programmable continuous-time filter (CTF) for hard-disk-drive (HDD) read channels was developed with 65-nm CMOS process technology. The CTF cutoff frequency and boost are programmable by switching units of the operational trans-conductance amplifier (OTA) banks and the capacitor banks. The switches are operated by lifted local-supply voltage to reduce on-resistance of the transistors. The CTF characteristics were robust against process technology variations and supply voltage and temperature ranges due to the introduction of a digitally assisted compensation scheme with analog auto-tuning circuits and digital calibration sequences. The digital calibration sequences, which fit into the operation sequence of the HDD read channel, compensate for the tuning circuits of the process technology variations, and the tuning circuits compensate for the CTF characteristics over the supply voltage and temperature ranges. As a result, the CTF had a programmability of 100–1000-MHz cutoff frequency and 0–12-dB boost.

Along with the miniaturization of CMOS-LSIs, control methods for LSIs have been extensively developed. The most predominant method is to digitize observed values as early as possible and to use digital control. Thus, many types of analog-to-digital converters (ADCs) have been developed such as temperature, time, delay, and frequency converters. ADCs are the easiest circuits into which digital correction methods can be introduced because their outputs are digital. Various types of calibration method have been developed, which has markedly improved the figure of merits by alleviating margins for device variations. The above calibration and correction methods not only overcome a circuit's weak points but also give us the chance to develop quite new circuit topologies and systems. In this paper, several digital calibration and correction methods for major analog-to-digital converters are described, such as pipelined ADCs, delta-sigma ADCs, and successive approximation ADCs.

This paper discusses recent trends in the area of low-power, high-performance A/D conversion. We examine survey data collected over the past twelve years to show that the conversion energy of ADCs has halved every two years, while the speed-resolution product has doubled approximately only every four years. A closer inspection on the impact of technology scaling, and developments in ADC design are then presented to explain the observed trends. Finally, we review opportunities in digitally assisted design for the most popular converter architectures.

This paper reviews techniques for digitally assisted pipeline ADCs. Errors of pipeline ADCs originated by capacitor mismatch, finite amplifier gain, incomplete settling and offset can be corrected in digital-domain foreground or background calibrations. In foreground calibrations, the errors are measured by reconfiguration of the building blocks of pipeline ADC or using an INL plot without reconfiguration. In background calibrations, the errors are measured with random signal and continuously corrected while simultaneously performing the normal A/D conversions. Techniques for measuring and correcting the errors at foreground and background are reviewed and a unified approach to the description of the principle of background calibration of gain errors is presented.

A new digital calibration scheme for a 14 bit binary weighted current-steering digital-to-analog converter (DAC) is presented. This scheme uses a simple current comparator for the current measurement instead of a high-resolution ADC. Therefore, a faster calibration cycle and smaller additional circuits are possible compared to the scheme with the high-resolution ADC. In the proposed calibration scheme, the lowest 8 bit part of the DAC is used for both error correction and normal operation. Therefore, the extra DACs required for calibration are only a 3 bit DAC and a 6 bit DAC. Nevertheless, a large calibration range is achieved. Full 14 bit resolution is achieved with a small chip-area. The simulation results show that DNL and INL after calibration are 0.26 LSB and 0.46 LSB, respectively. They also show that the spurious free dynamic range is 83 dB (57 dB) for signals of 24 kHz (98 MHz) at 200 Msps update rate.

A digital calibration technique, which corrects errors due to capacitor mismatch in pipelined ADC and directly measures the error coefficients using the ADC INL plot, is described. The proposed technique can be applied for various types of pipelined ADC architectures. Test results using an implemented 10-bit pipelined ADC show that the ADC achieves a peak signal-to-noise-and-distortion ratio of 56.5 dB, a peak integral non-linearity of 0.3 LSB, and a peak differential non-linearity of 0.3 LSB using the digital calibration.