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3261-3280hit(3430hit)

  • An Optimal Time for Software Testing under the User's Requirement of Failure-Free Demonstration before Release

    Byung Chul CHO  Kyung Soo PARK  

     
    PAPER-Reliability, Availability and Vulnerability

      Vol:
    E77-A No:3
      Page(s):
    563-570

    A new approach to the problem of optimal software testing time is described. Most models implicitly assume the testing is terminated at the end of a prescribed period of time without user's approval. It means the release time and the in-service reliability are determined unilaterally by the developer. If software developer uses and maintains it, the assumption is appropriate. But, it may be inappropriate, if a software requiring more stringent reliability is developed by second party on a contract basis. In this case, the time of release is usually determined with the user's approval. To overcome the weaknesses of the assumption, a two stage testing with failure-free release policy is proposed. A software, after being tested by the developer for some time (in-house testing), is transferred to acceptance testing performed jointly with the user. During the acceptance testing, it is released when τ units of time specified by user is observed to be failure-free for the first time. The policy may be attractive to a user because he can determine the time of release, and extend the testing time by increasing τ. A software cost model for the policy is developed. For the software developer, an optimal in-house testing time minimizing software cost, and various quantities of interests, such as expected periods of acceptance testing, are derived based on the Jelinski-Moranda software reliability model. Finally, numerical examples are shown to illustrate the results.

  • LAN Internetworking through Broadband ISDN

    Masayuki MURATA  Hideo MIYAHARA  

     
    INVITED PAPER

      Vol:
    E77-B No:3
      Page(s):
    294-305

    A local area network (LAN) can now provide high-speed data communications in a local area environment to establish distributed processing among personal computers and workstations, and the need for interconnecting LANs, which are geographically distributed, is naturally arising. Asynchronous Transfer Mode (ATM) technology has been widely recognized as a promising way to provide the high-speed wide area networks (WAN) for Broadband Integrated Services Digital Network (B-ISDN), and the commercial service offerings are expected in the near future. The ATM network seems to have a capability as a backbone network for interconnecting LANs, and the LAN interconnection is expected to be the first service in ATM networks. However, there remain some technical challenges for this purpose; one of the main difficulties in LAN interconnection is the support of connectionless traffic by the ATM network, which is basically a connection-oriented network. Another one is the way of achieving the very high-speed data transmission over the ATM network. In this paper, we first discuss a LAN internetworking methodology based on the current technology. Then, the recent deployments of LAN interconnection methods through B-ISDN are reviewed.

  • Total High Performance Time and Design of Degradable Real-Time Systems

    Masaharu AKATSU  Tomohiro MURATA  Kenzo KURIHARA  

     
    PAPER-Concurrent Systems, Discrete Event Systems and Petri Nets

      Vol:
    E77-A No:3
      Page(s):
    510-516

    This paper proposes the Total High Performance Time as a performance-related reliability measure in degradable/recoverable real-time systems. This measure reflects the effect of system behavior in pending states that are temporary states between the normal state and degraded states where the system operates in a degraded mode as a consequence of component failures. Such systems have to perform not only normal procedures but also error/recovery procedures in pending states, so the performance there is lower than that in the degraded states. In real-time systems, if performance is less than a lower limit, the response time for on-line transactions cannot meet the deadline. The consequences of failing to meet the deadline could be system failure. Therefore, the system reliability is affected significantly by whether the performance there is higher than the lower limit or not. A state where the level of performance is higher than the lower limit is called a High Performance State. We define the Total High Performance Time as the total time that the system spends operating in High Performance States. Moreover, this paper explains how to utilize the Total High Performance Time in system design. We model a method of controlling a system in pending states by using Extended Stochastic Petri Nets and obtain the characteristics necessary for evaluating the Total High Performance Time by analyzing the model. This approach is applied to a storage system that controls mirrored disks, and shown to be helpful for designing a method of controlling a system in pending states, which has been considered difficult because of the trade-off between performance and reliability.

  • Stochastic Gradient Algorithms with a Gradient-Adaptive and Limited Step-Size

    Akihiko SUGIYAMA  

     
    PAPER-Adaptive Signal Processing

      Vol:
    E77-A No:3
      Page(s):
    534-538

    This paper proposes new algorithms for adaptive FIR filters. The proposed algorithms provide both fast convergence and small final misadjustment with an adaptive step size even under an interference to the error. The basic algorithm pays special attention to the interference which contaminates the error. To enhance robustness to the interference, it imposes a special limit on the increment/decrement of the step-size. The limit itself is also varied according to the step-size. The basic algorithm is extended for application to nonstationary signals. Simulation results with white signals show that the final misadjustment is reduced by up to 22 dB under severe observation noise at a negligible expense of the convergence speed. An echo canceler simulation with a real speech signal exhibits its potential for a nonstationary signal.

  • Service Aspects of Future Private Networks

    Kensaku KINOSHITA  Toshihiko WAKAHARA  Katsuhiko HARUTA  Shozo KUMON  

     
    INVITED PAPER

      Vol:
    E77-B No:3
      Page(s):
    306-313

    This paper describes a future private network service and the system configurations for providing it. Technologies and service trends in local area and wide area networks are shown. As network services become more diversified and integrated, it becomes more difficult for users to use the networks effectively. This paper shows how this problem can be solved by using virtual network technology to attain seamless networking. It also presents the concept of group networking among many parties, which can be used as the basis for a virtual private network.

  • Representation of Surfaces on 5 and 6 Sided Regions

    Caiming ZHANG  Takeshi AGUI  Hiroshi NAGAHASHI  

     
    PAPER-Image Processing, Computer Graphics and Pattern Recognition

      Vol:
    E77-D No:3
      Page(s):
    326-334

    A C1 interpolation scheme for constructing surface patch on n-sided region (n5, 6) is presented. The constructed surface patch matches the given boundary curves and cross-boundary slopes on the sides of the n-sided region (n5, 6). This scheme has relatively simple construction, and offers one degree of freedom for adjusting interior shape of the constructed interpolation surface. The polynomial precision set of the scheme includes all the polynomials of degree three or less. The experiments for comparing the proposed scheme with two schemes proposed by Gregory and Varady respectively and also shown.

  • Automatic Tracing of Transistor-Level Performance Faults with CAD-Linked Electron Beam Test System

    Katsuyoshi MIURA  Koji NAKAMAE  Hiromu FUJIOKA  

     
    PAPER-Computer Aided Design (CAD)

      Vol:
    E77-A No:3
      Page(s):
    539-545

    An automatic tracing algorithm of the transistor-level performance faults in the waveform-based approach with CAD-linked electron beam test system which utilizes a transistor-level circuit data in CAD database is proposed. Performance faults mean some performance measure such as the temporal parameters (rise time, fall time and so on) lies outside of the specified range in a VLSI. Problems on automatic fault tracing in the transistor level are modeled by using graphs. Combinational circuits which consist of MOS transistors are considered. A single fault is assumed to be in a circuit. The algorithm utilizes Depth-First Search algorithm where faulty upstream interconnections are searched as deeply as possible. Treatment of the faults on downstream interconnections and on unmeasurable interconnections is given. Application of this algorithm to the 2k-transistor block of a CMOS circuit showed its validity in the simulation.

  • A Preferential Constraint Satisfaction Technique for Natural Language Analysis

    Katashi NAGAO  

     
    PAPER

      Vol:
    E77-D No:2
      Page(s):
    161-170

    In this paper, we present a new technique for the semantic analysis of sentences, including an ambiguity-packing method that generates a packed representation of individual syntactic and semantic structures. This representation is based on a dependency structure with constraints that must be satisfied in the syntax-semantics mapping phase. Complete syntax-semantics mapping is not performed until all ambiguities have been resolved, thus avoiding the combinatorial explosions that sometimes occur when unpacking locally packed ambiguities. A constraint satisfaction technique makes it possible to resolve ambiguities efficiently without unpacking. Disambiguation is the process of applying syntactic and semantic constraints to the possible candidate solutions (such as modifiees, cases, and wordsenses) and removing unsatisfactory condidates. Since several candidates often remain after applying constraints, another kind of knowledge to enable selection of the most plausible candidate solution is required. We call this new knowledge a preference. Both constraints and preferences must be applied to coordination for disambiguation. Either of them alone is insufficient for the purpose, and the interactions between them are important. We also present an algorithm for controlling the interaction between the constraints and the preferences in the disambiguation process. By allowing the preferences to control the application of the constraints, ambiguities can be efficiently resolved, thus avoiding combinatorial explosions.

  • Electrocapillarity Optical Switch

    Makoto SATO  

     
    PAPER

      Vol:
    E77-B No:2
      Page(s):
    197-203

    To realize a high performance optical subscriber network a route reconnect switch is desired which has bistability, polarization and wavelength independence and compactness. This paper proposes an electrocapillarity optical (ECO) switch, in which a micro-mirror formed by a mercury droplet is driven by electrocapillarity. This switch has a potential for use in bistable waveguide matrix switches, which are suitable for route reconnection in the optical subscriber network. A theoretical model is presented that the driving force of the electrocapillarity originates in an electrically induced gradient in the surface tension of the mercury-electrolyte interface where an electrical double layer is formed. The experimentally obtained relation between the flow velocity of a mercury droplet and the electric current in an electrocapillary system is well described by this model. A prototype of the ECO switch is made using a resin molded single-mode fiber with a slit sawed in it in which a electrocapillary system is made. Optical switching is demonstrated and possible improvements in switching performance are discussed.

  • Parallel Photonic Devices and Concepts Good for Optical Interconnects

    Kenichi IGA  

     
    INVITED PAPER

      Vol:
    E77-C No:1
      Page(s):
    9-14

    In this paper, we present some novel concepts and photonic devices for use in optical interconnects. First, we review the progress of surface emitting lasers while featuring materials and performances including thresholds, power output, RIN, linewidth, and so on. Advanced technology for aiming at spontaneous emission control, photon recycling, polarization control, wavelength tuning, integration etc. will be considered. Then we touch on some other possible devices for optical interconnects. Lastly, we discuss on lightwave subsystems applying these devices and concepts.

  • Reliability of a 3-State System Subject to Flow Quantity Constraint

    Tetsushi YUGE  Masafumi SASAKI  Shigeru YANAGI  

     
    PAPER-System Reliability

      Vol:
    E77-A No:1
      Page(s):
    129-133

    This paper presents two approaches for computing the reliability of complex networks subject to two kinds of failure, open failure and shorted failure. The reliabilities of some series-parallel networks are considered by many analysts. However a practical system is more complex. The methods given in this paper can be applied not only to a series-parallel network but also to a non-series-parallel network which is composed of non-identical and independent components subject to two kinds of failure. This paper also deals with a network subject to flow quantity constraint such as the one which is required to control j or more separate paths. For such a system it is difficult to obtain system reliability because the number of states to be considered in this system is extremely large compared to a conventional 2-state device system. In this paper we obtain the reliabilities for such systems by a combinatorial approach and by a simulation approach.

  • Some Remarks on MTBF's for Non-homogeneous Poisson Processes

    Hirofumi KOSHIMAE  Hiroaki TANAKA  Shunji OSAKI  

     
    PAPER-System Reliability

      Vol:
    E77-A No:1
      Page(s):
    144-149

    Non-homogeneous Poisson Processes (NHPP's) can be applied for analyzing reliability growth models for hardware and/or software. Evaluating the Mean Time Between Failures (MTBF's) for such processes, we can evaluate the present status (the degree of improvement). However, it is difficult to evaluate the MTBF's for such processes analytically except the simplest cases. The so-called instantaneous MTBF's which can be easily evaluated are applied in practice instead of the exact MTBF's. In this paper, we discuss both MTBF's analytically, and derive the conditions for the existence of both exact and instantaneous MTBF's. We further illustrate both MTBF's for the Weibull process and S-shaped reliability growth model numerically.

  • Optimal Free-Sensors Allocation Problem in Safety Monitoring System

    Kenji TANAKA  Keiko SAITOH  

     
    LETTER-Reliability and Safety

      Vol:
    E77-A No:1
      Page(s):
    237-239

    This paper proposes an optimal free-sensors allocation problem (OFSAP) in safety monitoring systems. OFSAP is the problem of deciding the optimal allocation of several sensors, which we call free sensors, to plural objects. The solution of OFSAP gives the optimal allocation which minimizes expected losses caused by failed dangerous (FD)-failures and failed safe (FS)-failures; a FD-failure is to fail to generate an alarm for unsafe object and a FS-failure is to generate an alarm for safe object. We show an unexpected result that a safer object should be monitored by more sensors under certain conditions.

  • A Factored Reliability Formula for Directed Source-to-All-Terminal Networks

    Yoichi HIGASHIYAMA  Hiromu ARIYOSHI  Isao SHIRAKAWA  Shogo OHBA  

     
    PAPER-System Reliability

      Vol:
    E77-A No:1
      Page(s):
    134-143

    In a probabilistic graph (network), source-to-all-terminal (SAT) reliability may be defined as the probability that there exists at least one path consisting only of successful arcs from source vertex s to every other vertex. In this paper, we define an optimal SAT reliability formula to be the one with minimal number of literals or operators. At first, this paper describes an arc-reductions (open- or short-circuiting) method for obtaining a factored formula of directed graph. Next, we discuss a simple strategy to get an optimal formula being a product of the reliability formulas of vertex-section graphs, each of which contains a distinct strongly connected component of the given graph. This method reduces the computing cost and data processing effort required tu generate the optimal factored formula, which contains no identical product terms.

  • The Enhancement of Electromigration Lifetime under High Frequency Pulsed Conditions

    Kazunori HIRAOKA  Kazumitsu YASUDA  

     
    PAPER-Reliability Testing

      Vol:
    E77-A No:1
      Page(s):
    195-203

    Experimental evidence of a two-step enhancement in electromigration lifetime is presented through pulsed testing that extends over a wide frequency range from 7 mHz to 50 MHz. It is also found, through an accompanying failure analysis, that the failure mechanism is not affected by current pulsing. Test samples were the lowew metal lines and the through-holes in double-level interconnects. The same results were obtained for both samples. The testing temperature of the test conductor was determined considering the Joule heating to eliminate errors in lifetime estimation due to temperature errors. A two-step enhancement in lifetime is extracted by normalizing the pulsed electromigration lifetime by the continuous one. The first step occurs in the frequency range from 0.1 to 10 kHz where the lifetime increases with (duty ratio)-2 and the second step occurs above 100 kHz with (duty ratio)-3. The transition frequency in the first-step enhancement shifts to the higher frequency region with a decrease in stress temperature or an increase in current density, whereas the transition frequency in the second step is not affected by these stress conditions. The lifetime enhancement is analyzed in relation to the relaxation process during the current pulsing. According to the two-step behavior, two distinct relaxation times are assumed as opposed to the single relaxation time in other proposed models. The results of the analysis agree with the experimental results for the dependence on the frequency and duty ratio of pulses. The two experimentally derived relaxation times are about 5 s and 1 µs.

  • Software Reliability Measurement and Assessment with Stochastic Differential Equations

    Shigeru YAMADA  Mitsuhiro KIMURA  Hiroaki TANAKA  Shunji OSAKI  

     
    PAPER-Software Reliability

      Vol:
    E77-A No:1
      Page(s):
    109-116

    In this paper, we propose a plausible software reliability growth model by applying a mathematical technique of stochastic differential equations. First, we extend a basic differential equation describing the average behavior of software fault-detection processes during the testing phase to a stochastic differential equation of ItÔ type, and derive a probability distribution of its solution processes. Second, we obtain several software reliability measures from the probability distribution. Finally, applying a method of maximum-likelihood we estimate unknown parameters in our model by using available data in the actual software testing procedures, and numerically show the stochastic behavior of the number of faults remaining in the software system. Further, the model is compared among the existing software reliability growth models in terms of goodness-of-fit.

  • Improvement of "Soft Breakdown" Leakage of off-State nMOSFETs Induced by HBM ESD Events Using Drain Engineering for LDD Structure

    Ikuo KURACHI  Yasuhiro FUKUDA  

     
    PAPER-Failure Physics and Failure Analysis

      Vol:
    E77-A No:1
      Page(s):
    166-173

    Leakage enhancement after an ESD event has been analyzed for output buffer LDD MOSFETs. The HBM ESD failure threshold for the LDD MOSFETs is only 200-300 V and the failure is the leakage enhancement of the off-state MOSFETs called as "soft breakdown" leakage. This leakage enhancement is supposed to be caused by trapped electrons in the gate oxide and/or creation of interface states at the gate overlapped drain region due to snap-back stress during the ESD event. The mechanism of the lekage can be explained by band-to-band and/or interface state-to-band tunneling of electrons. The improvement of the HBM ESD threshold has been also evaluated by using two types of drain engineering which are additional arsenic implantation for the output LDD MOSFETs and "offset" gate MOSFET as a protection circuit for the output pins. By using these drain engineering, the threshold can be improved to more than 2000 V.

  • Demonstrating Possession without Revealing Factors

    Hiroki SHIZUYA  Kenji KOYAMA  Toshiya ITOH  

     
    PAPER

      Vol:
    E77-A No:1
      Page(s):
    39-46

    This paper presents a zero-knowledge interactive protocol that demonstrates two factors a and b of a composite number n (=ab) are really known by the prover, without revealing the factors themselves. Here the factors a and b need not be primes. The security of the protocol is based on the difficulty of computing discrete logarithms modulo a large prime.

  • A Combined Fast Adaptive Filter Algorithm with an Automatic Switching Method

    Youhua WANG  Kenji NAKAYAMA  

     
    PAPER-Adaptive Signal Processing

      Vol:
    E77-A No:1
      Page(s):
    247-256

    This paper proposes a new combined fast algorithm for transversal adaptive filters. The fast transversal filter (FTF) algorithm and the normalized LMS (NLMS) are combined in the following way. In the initialization period, the FTF is used to obtain fast convergence. After converging, the algorithm is switched to the NLMS algorithm because the FTF cannot be used for a long time due to its numerical instability. Nonstationary environment, that is, time varying unknown system for instance, is classified into three categories: slow time varying, fast time varying and sudden time varying systems. The NLMS algorithm is applied to the first situation. In the latter two cases, however, the NLMS algorithm cannot provide a good performance. So, the FTF algorithm is selected. Switching between the two algorithms is automatically controlled by using the difference of the MSE sequence. If the difference exceeds a threshold, then the FTF is selected. Other wise, the NLMS is selected. Compared with the RLS algorithm, the proposed combined algorithm needs less computation, while maintaining the same performance. Furthermore, compared with the FTF algorithm, it provides numerically stable operation.

  • Two-Dimensional Active Imaging of Conducting Objects Buried in a Dielectric Half-Space

    Yiwei HE  Toru UNO  Saburo ADACHI  Takunori MASHIKO  

     
    PAPER

      Vol:
    E76-B No:12
      Page(s):
    1546-1551

    A two-dimensional quasi-exact active imaging method for detecting the conducting objects buried in a dielectric half-space is proposed. In this imaging method, an image function which is a projection of buried object to an arbitrary direction, is introduced exactly by taking account of the presence of the planar boundary. The image function is synthesized from the scattering fields which are measured by moving a transmitting antenna (a current source) and a receiving antenna (an observation point) simultaneously along the ground surface. The scattering field is generated by the physical optics current assumed on the surface of buried object. Because the effectiveness of physical optics approximation has been confirmed for this problem, this is a quasi-exact active imaging method. The validity of this imaging method is confirmed by some numerical simulations and an experiment.

3261-3280hit(3430hit)