In a typical SoC (System-on-Chip) design, a huge peak current often occurs near the time of an active clock edge because of aggregate switching of a large number of transistors. The number of aggregate switching transistors can be lessened if the SoC design can use a clock scheme of mixed rising and falling triggering edges rather than one of pure rising (falling) triggering edges. In this paper, we propose a clock-triggering-edge assignment technique and algorithms that can assign either a rising triggering edge or a falling triggering edge to each clock of each IP core of a given IP-based SoC/NoC (Network-on-Chip) design. The goal of the algorithms is to reduce the peak current of the design. Our proposed technique has been implemented as a software system. The system can use an LP technique to find an optimal or suboptimal solution within several seconds. The system also can use an ILP technique to find an optimal solution, but the ILP technique is not suitable to be used to solve a complex design. Experimental results show that our algorithms can reduce peak currents up to 56.3%.

With the advent of the deep submicron age, circuit performance is strongly impacted by process variations and the influence on the circuit delay to the power-supply voltage increases more and more due to CMOS feature size shrinkage. Power grid optimization which considers the timing error risk caused by the variations and IR drop becomes very important for stable and hi-speed operation of system-on-chip. Conventionally, a lot of power grid optimization algorithms have been proposed, and most of them use IR drop as their object functions. However, the IR drop is an indirect metric and we suspect that it is vague metric for the real goal of LSI design. In this paper, first, we propose an approach which uses the "timing error risk caused by IR drop" as a direct objective function. Second, the critical path map is introduced to express the existence of critical paths distributed in the entire chip. The timing error risk is decreased by using the critical path map and the new objective function. Some experimental results show the effectiveness.

It's a trend to consider the power supply integrity at early stage to improve the design quality. Specifically, floorplanning process is modified to improve the power supply as well. In the modified floorplanning process, both the floorplan and power/ground (P/G) network are adjusted to search for optimal floorplan as well as the most robust power supply. In this paper, we propose a novel algorithm to carry out this modified floorplanning. A new analytical method is proposed to estimate the voltage drop while the floorplan is varying constantly. This fast analytical voltage drop estimating method is plugged into the modified floorplanner to speed up the whole floorplanning process. Compared with previous methods, our algorithm can search for the optimal floorplan with consideration of power supply integrity more efficiently and therefore leads to better results. Furthermore, this paper also proposes a novel heuristic method to optimize the topology of P/G network. This optimization algorithm could construct a more robust power supply system. Experimental results show the method can speedup the IR-drop aware floorplanning process by about 10 times and reduce the routing area of P/G network while maintaining the floorplan quality and power supply integrity.

Accurate on-chip 100-ps/100-µV waveform measurements of signal transition in a large-scale digital integrated circuit clearly demonstrates the correlation of dynamic delay variation with power supply noise waveforms. In addition to the linear dependence of delay increase with the height of static IR drop, the distortion of a signal waveform during a logic transition that is induced by dynamic power supply noise causes significant delay variation. However, an analysis reveals that average modeling of dynamic power supply noise, which is often used in conventional simulation techniques, cannot match the experimentally measured values. Our proposed circuit simulation technique, which incorporates time-domain power supply noise waveform macro models along with parasitic impedance networks, reproduces the delay variation well, even with a relative timing difference among different clock domains. Such basic knowledge can be applied in precise delay calculations that consider dynamic power supply noise, a crucial factor in deep sub-100-nm LSI design.

We propose a semi-dynamic timing analysis flow applicable to large-scale circuits that takes into account dynamic power-supply drop. Logic delay is accurately estimated in the presence of power-supply noise through timing correction as a function of power-supply voltage during operation, where a time-dependent power-supply noise waveform is derived by way of a vectorless technique. Measurements and analysis of dynamic supply-noise waveforms and associated delay changes were performed on a sub-100-nm CMOS test circuit with embedded on-chip noise detectors and delay monitors. The proposed analysis technique was extended and applied to a test digital circuit with more than 10 million gates and validated toward a multi-10-million-gate CMOS SoC design.

Dynamic power supply noise measurements with resolutions of 100 ps and 100 µV for 100 ns and 1 V ranges are performed at various operating frequencies up to 400 MHz on multiple points in a low power register file and SRAM for product chips by using on-chip noise detectors. The measurements show that the noises are clearly emphasized in frequency domains by the interaction of circuit operations and bias network's AC transfers. A proposed design methodology that covers a fast SPICE simulator and parasitic extractors can predict dynamic noises from power supplies, ground, well, and substrate interactions to provide robustness to the design of low power body bias control circuitry.

This paper compares a stub and a decoupling capacitor for power supply noise reduction. A quarter-length stub attached to the power supply line of an LSI chip works as a band-eliminate filter, and suppresses the power supply bounce of the designed frequency. The conditions where the stub is more effective than the same-area decoupling capacitor are clarified. The stub will work more efficiently and on-chip integration will be possible on high frequency operation LSIs.

A high-speed 32-bit RISC microcontroller has been developed. In order to realize high-speed operation with minimum hardware resource, we have developed new design and analysis methods such as a clock distribution, a bus-line layout, and an IR drop analysis. As a result, high-speed operation of 400 MHz has been achieved with power dissipation of 0.96 W at 1.8 V.

An on-chip, 64-Mb, embedded, DRAM MPEG-2 encoder LSI with a multimedia processor has been developed. To implement this large-scale and high-speed LSI, we have developed the hierarchical skew control of multi-clocks, with timing verification, in which cross-talk noise is considered, and simple measures taken against the IR drop in the power lines through decoupling capacitors. As a result, the target performance of 263 MHz at 1.5 V has been successfully attained and verified, the cross-talk noise has been considered, and, in addition, it has become possible to restrain the IR drop to 166 mV in the 162 MHz operation block.