Kwame Osei BOATENG Hiroshi TAKAHASHI Yuzo TAKAMATSU
In this paper, we consider the design for testability of a multiplier based on the modified Booth Algorithm. First, we present a basic array implementation of the multiplier. Next, we introduce testability considerations to derive two C-testable designs. The first of the designs is C-testable under the single stuck-at fault model (SAF) with 10 test patterns. And, the second is C-testable under the cell fault model (CFM) with 33 test patterns.
Chunhee WOO Daehyun LEE Hagbae KIM
When a failure or upset occurring in a controller computer induces a task failure durable for a substantial period, system dynamics apparently deviates from its desirable sample paths, and loses its stability in an extreme case for the period to exceed the hard deadline in a real-time control system. In the paper, we propose an algorithm to combine the deadlines of all elementary tasks (derived formerly by our work) executed in several operation modes with multi-sampling periods. This results in computing the hard deadline of the entire system through modifying task-state equations to capture the effects of task failures and inter-correlations among tasks.
Asynchronous, distributed, decision-making (ADDM) systems constitute a special class of distributed problems and are characterized as large, complex systems wherein the principal elements are the geographically-dispersed entities that communicate among themselves, asynchronously, through message passing and are permitted autonomy in local decision-making. A fundamental property of ADDM systems is stability that refers to their behavior under representative perturbations to their operating environments, given that such systems are intended to be real, complex, and to some extent, mission critical systems, and are subject to unexpected changes in their operating conditions. ADDM systems are closely related to autonomous decentralized systems (ADS) in the principal elements, the difference being that the characteristics and boundaries of ADDM systems are defined rigorously. This paper introduces the concept of stability in ADDM systems and proposes an intuitive yet practical and usable definition that is inspired by those used in Control Systems and Physics. A comprehensive stability analysis on an accurate simulation model will provide the necessary assurance, with a high level of confidence, that the system will perform adequately. An ADDM system is defined as a stable system if it returns to a steady-state in finite time, following perturbation, provided that it is initiated in a steady-state. Equilibrium or steady-state is defined through placing bounds on the measured error in the system. Where the final steady-state is equivalent to the initial one, a system is referred to as strongly stable. If the final steady-state is potentially worse then the initial one, a system is deemed marginally stable. When a system fails to return to steady-state following the perturbation, it is unstable. The perturbations are classified as either changes in the input pattern or changes in one or more environmental characteristics of the system such as hardware failures. Thus, the key elements in the study of stability include steady-state, perturbations, and stability. Since the development of rigorous analytical models for most ADDM systems is difficult, if not impossible, the definitions of the key elements, proposed in this paper, constitute a general framework to investigate stability. For a given ADDM system, the definitions are based on the performance indices that must be judiciously identified by the system architect and are likely to be unique. While a comprehensive study of all possible perturbations is too complex and time consuming, this paper focuses on a key subset of perturbations that are important and are likely to occur with greater frequency. To facilitate the understanding of stability in representative real-world systems, this paper reports the analysis of two basic manifestations of ADDM systems that have been reported in the literature --(i) a decentralized military command and control problem, MFAD, and (ii) a novel distributed algorithm with soft reservation for efficient scheduling and congestion mitigation in railway networks, RYNSORD. Stability analysis of MFAD and RYNSORD yields key stable and unstable conditions.
Teruyuki MIYAJIMA Fumihito BAISHO Kazuo YAMANAKA Kazuhiko NAKAMURA Masahiro AGU
A new phasor model of neural networks is proposed in which the state of each neuron possibly takes the value at the origin as well as on the unit circle. A stability property of equilibria is studied in association with the energy landscape. It is shown that a simple condition guarantees an equilibrium to be asymptotically stable.
I would like to draw the attention of the editorial board of IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences and its readers to a recent paper, Tianruo Yang, "The integrated scheduling and allocation of high-level test synthesis," vol. E82-A, no. 1, January 1999, pp. 145-158. (Here we call this paper the Yang's paper. ) Yang did not give the correct information about the originality of the paper. I will point out that the writings (and the idea accordingly) of section 6 of Yang's paper came from papers [1] and [2].
Thermal stability of anisotropic and isotropic Co alloy thin-film media is investigated. The orientation ratio of CoCrTa(Pt)/Cr media was controlled by the mechanical texture of the NiP/Al substrates. Bulk magnetic properties, delta M curves and time decay of magnetization in the circumferential and radial directions were measured. The maximum magnetic viscosity coefficient calculated from the time decay of magnetization in the circumferential direction was higher than that in the radial direction for a mechanically textured sample, while it was similar in both directions for a non-textured sample. The magnetic viscosity coefficient in the circumferential direction is smaller than that in the radial direction when the reverse field is in the range of the demagnetization field for thin-film recording media. This implies that an anisotropic sample (namely, a sample with a high orientation ratio) will be more thermally stable when it is not exposed to a large external magnetic field.
As many research works are based on some previous results, my paper, namely The Integrated Scheduling and Allocation of High-Level Test Synthesis, makes use of some techniques by T. Kim. However, I did not state explicitly that some parts of my work are based on Kim's approach although I have referred to his paper. I would like to express my deep apology to Kim for not having emphasized Kim's contribution to my work. But my intention was not to steal Kim's ideas. I would like to emphasize the following difference.
Susumu KOBAYASHI Masato EDAHIRO Mikio KUBO
This paper presents an algorithm for the scan-chain optimization problem in multiple-scan design methodology. The proposed algorithm, which consists of four phases, first determines pairs of scan-in and scan-out pins (Phase 1), and then assigns flip-flops to scan-paths by using a graph theoretical method (Phase 2). Next the algorithm decides connection-order of flip-flops in each scan-path by using TSP (Traveling Salesman Problem) heuristics (Phase 3), and finally exchanges flip-flops among scan-paths in order to reduce total scan-path length (Phase 4). Experiments using actual design data show that, for ten scan-paths, our algorithm achieved a 90% reduction in scan-test time at the expense of a 7% total scan-path length increase as compared with the length of a single optimized scan-path. Also, our algorithm produced less total scan-path length than other three possible algorithms in a reasonable computing time.
We analyze the dynamics of self-organizing cortical maps under the influence of external stimuli. We show that if the map is a contraction, then the system has a unique equilibrium which is globally asymptotically stable; consequently the system acts as a stable encoder of external input stimuli. The system converges to a fixed point representing the steady-state of the neural activity which has as an upper bound the superposition of the spatial integrals of the weight function between neighboring neurons and the stimulus autocorrelation function. The proposed theory also includes nontrivial interesting solutions.
Tetsuya UEMURA Pinaki MAZUMDER
A resonant-tunneling-diode (RTD) based sense amplifier circuit design has been proposed for the first time to envision a very high-speed and low-power memory system that also includes refresh-free, compact RTD-based memory cells. By combining RTDs with n-type transistors of conventional complementary metal oxide semiconductor (CMOS) devices, a new quantum MOS (Q-MOS) family of logic circuits, having very low power-delay product and good noise immunity, has recently been developed. This paper introduces the design and analysis of a new QMOS sense amplifier circuit, consisting of a pair of RTDs as pull-up loads in conjunction with n-type pull-down transistors. The proposed QMOS sensing circuit exhibits nearly 20% faster sensing time in comparison to the conventional design of a CMOS sense amplifier. The stability analysis done using phase-plot diagram reveals that the pair of back-to-back connected static QMOS inverters, which forms the core of the sense amplifier, has meta-stable and unstable states which are closely related to the I-V characteristics of the RTDs. The paper also analyzes in details the refresh-free memory cell design, known as tunneling static random access memory (TSRAM). The innovative cell design adds a stack of two RTDs to the conventional one-transistor dynamic RAM (DRAM) cell and thereby the cell can indefinitely hold its charge level without any further periodic refreshing. The analysis indicates that the TSRAM cell can achieve about two orders of magnitude lower stand-by power than a conventional DRAM cell. The paper demonstrates that RTD-based circuits hold high promises and are likely to be the key candidates for the future high-density, high-performance and low-power memory systems.
When designing microwave amplifiers, it is the task to select values of the source (input generator) and load reflection coefficients for the transistor, to achieve certain amplifier performance requirements and ensure stability. For unconditionally stable transistors, simultaneous conjugate matching can be achieved using well-known design formulae. Under this condition, the gain is maximised, and the input and output ports are matched. On the other hand when the transistor is conditionally stable, source and load reflection coefficients are selected using graphical design methods, involving gain and stability circles. To eliminate the reliance on graphical techniques, this paper shows the derivation of explicit design formulae that ensure maximum gain for a minimum specified safety margin, with one port matched. In this work, the safety margin is the distance between the chosen source or load reflection coefficient and its respective stability circle. In a production environment, where the circuit and transistor parameters are subject to random variations, the safety margin therefore makes allowance for such variations. This paper shows that the design problem for conditionally stable transistors can be reduced from the selection of values for two complex variables (port terminations) to the selection of the value for just one scalar variable.
Taewhan KIM Ki-Seok CHUNG C. L. LIU
This paper presents a new data path synthesis algorithm which takes into account simultaneously three important design criteria: testability, design area, and total execution time. We define a goodness measure on the testability of a circuit based on three rules of thumb introduced in prior work on synthesis for testability. We then develop a stepwise refinement synthesis algorithm which carries out the scheduling and allocation tasks in an integrated fashion. Experimental results for benchmark and other circuit examples show that we were able to enhance the testability of circuits significantly with very little overheads on design area and execution time.
Haruo KOBAYASHI Takashi MATSUMOTO
There are two dynamics issues in vision chips: (i) The temporal dynamics issue due to the parasitic capacitors in a CMOS chip, and (ii) the spatial dynamics issue due to the regular array of processing elements in a chip. These issues are discussed in [1]-[3] for the resistor network with only associated parasitic capacitances. However, in this paper we consider also parasitic inductances as well as parasitic capacitances for a more precise network dynamics model. We show that in some cases the temporal stability condition for the network with parasitic inductances and capacitances is equivalent to that for the network with only parasitic capacitances, but in general they are not equivalent. We also show that the spatial stability conditions are equivalent in both cases.
The author proposes a flow control scheme which derives the optimal packet transmission rate from the ACKs of the sending packets. The optimization is based on mathematical programming such as the extremal method and least-squares method. The author proves that the proposed method is fair when the RTT and thepacket length of each sender are the same. It is also shown that the sufficient condition for the proposed method to be optimal and stable generally holds true in packet networks. The performances are examined by computer simulations, and it is found that high throughput is obtained regardless of the network structure.
This paper presents a high-level test synthesis algorithm for operation scheduling and data path allocation. Data path allocation is achieved by a controllability and observability balance allocation technique which is based on testability analysis at register-transfer level. Scheduling, on other hand, is carried out by rescheduling transformations which change the default scheduling to improve testability. Contrary to other works in which the scheduling and allocation tasks are performed independently, our approach integrates scheduling and allocation by performing them simultaneously so that the effects of scheduling and allocation on testability are exploited more effectively. Additionally, since sequential loops are widely recognized to make a design hard-to-test, a complete (functional and topological) loop analysis is performed at register-transfer level in order to avoid loop creation during the integrated test synthesis process. With a variety of synthesis benchmarks, experimental results show clearly the advantages of the proposed algorithm.
Mizuki TAKAHASHI Ryoji SAKURAI Hiroaki NODA Takashi KAMBE
In this paper, we propose a new register transfer level (RT level) testability analysis method. Controllability and observability measures are defined for signal vectors based on the numbers of values they can take. The control part and the datapath part are automatically identified in the given RT level model and distinctive analysis methods are applied. We also describe a DFT point selection method based on our testability measures. In a experiment on a signal processing circuit whose gate count is 7690 including 578 FFs, almost the same fault coverage is achieved with fewer scan FFs than a conventional method based on gate level testability analysis.
Satoshi UEHARA Tsutomu MORIUCHI Kyoki IMAMURA
The maximum order complexity (MOC) of a sequence is a very natural generalization of the well-known linear complexity (LC) by allowing nonlinear feedback functions for the feedback shift register which generates a given sequence. It is expected that MOC is effective to reduce such an instability of LC as an extreme increase caused by the minimum changes of a periodic sequence, i. e. , one-symbol substitution, one-symbol insertion or one-symbol deletion per each period. In this paper we will give the bounds (lower and upper bounds) of MOC for the minimum changes of an m-sequence over GF(q) with period qn-1, which shows that MOC is much more natural than LC as a measure for the randomness of sequences in this case.
Katsumi SAKAKIBARA Michiru HANAOKA Yoshiharu YUBA
The stability of slotted ALOHA systems with various types of capture phenomena and multiple packet reception capability is discussed in conjunction with the cusp catastrophe. The slotted ALOHA systems considered are classified into; 1) single packet reception with geometric capture, 2) independent multiple packet reception with geometric capture, 3) single packet reception with M-out-of-N capture (M N), 4) multiple packet reception with M-out-of-N capture, and 5) single packet reception with perfect capture. First, general expressions for the cusp points and the bifurcation sets are derived. Then, we present explicit formula for the stability of slotted ALOHA systems for the five types of capture and multi-packet reception capability and demonstrate how the bistable behavior is mitigated due to capture effect and multi-packet reception capability.
Hiroshi YOKOYAMA Xiaoqing WEN Hideo TAMAMOTO
The advantage of random testing is that test application can be performed at a low cost in the BIST scheme. However, not all circuits are random pattern testable due to the existence of random pattern resistant faults. In this paper, we present a method for improving the random pattern testability of logic circuits by partial circuit duplication approach. The basic idea is to detect random pattern resistant faults by using the difference between the duplicated part of a circuit and the original part. Experimental results on benchmark circuits show that high fault coverage can be achieved with a very small amount of hardware overhead.
Toshinori HOSOKAWA Toshihiro HIRAOKA Mitsuyasu OHTA Michiaki MURAOKA Shigeo KUNINOBU
We will present a partial scan design method based on n-fold line-up structures in order to achieve high fault efficiency and reduce test pattern generation time for practical LSIs. We will also present a partial scan design method based on the state justification of pure load/hold FFs in order to achieve high fault efficiency and reduce the number of scan FFs for practical LSIs with lots of load/hold FFs. Experimental results for practical LSIs show that our presented methods can achieve high fault efficiency (more than 99%) and reduce the number of scan FFs for the LSI with lots of load/hold FFs.