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[Keyword] clock generator(10hit)

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  • A 8 Phases 192MHz Crystal-Less Clock Generator with PVT Calibration

    Ting-Chou LU  Ming-Dou KER  Hsiao-Wen ZAN  Jen-Chieh LIU  Yu LEE  

     
    PAPER-VLSI Design Technology and CAD

      Vol:
    E100-A No:1
      Page(s):
    275-282

    A multi-phase crystal-less clock generator (MPCLCG) with a process-voltage-temperature (PVT) calibration circuit is proposed. It operates at 192 MHz with 8 phases outputs, and is implemented as a 0.18µm CMOS process for digital power management systems. A temperature calibrated circuit is proposed to align operational frequency under process and supply voltage variations. It occupies an area of 65µm × 75µm and consumes 1.1mW with the power supply of 1.8V. Temperature coefficient (TC) is 69.5ppm/°C from 0 to 100°C, and 2-point calibration is applied to calibrate PVT variation. The measured period jitter is a 4.58-ps RMS jitter and a 34.55-ps peak-to-peak jitter (P2P jitter) at 192MHz within 12.67k-hits. At 192MHz, it shows a 1-MHz-offset phase noise of -102dBc/Hz. Phase to phase errors and duty cycle errors are less than 5.5% and 4.3%, respectively.

  • 1.5-GHz Spread-Spectrum PHY Using Reference Clock with 400-ppm Frequency Tolerance for SATA Application

    Takashi KAWAMOTO  Masato SUZUKI  Takayuki NOTO  

     
    PAPER

      Vol:
    E98-A No:2
      Page(s):
    485-491

    A serial ATA PHY fabricated in a 0.15-µm CMOS process performs the serial ATA operation in an asynchronous transition by using large variation in the reference clock. This technique calibrates a transmission signal frequency by utilizing the received signal. This is achieved by calibrating the divide ratio of a spread-spectrum clock generator (SSCG). This technique enables a serial ATA PHY to use reference oscillators with a production-frequency tolerance of less than 400ppm, i.e., higher than the permissible TX frequency variations (i.e., 350ppm). The calibrated transmission signal achieved a total jitter of 3.9ps.

  • Wide Frequency-Range Spread-Spectrum Clock Generator with Digital Modulation Control

    Takashi KAWAMOTO  Masato SUZUKI  Takayuki NOTO  

     
    PAPER-Electronic Circuits

      Vol:
    E96-C No:6
      Page(s):
    935-941

    A technique that enables a SSCG to fine-tune an output signal frequency and a spread ratio is presented. Proposed SSCG achieves the output signal frequency from 1.2 GHz to 3.0 GHz and the spread ratio from 0 to 30000 ppm. The fine-tuning technique achieves 30 ppm adjustment of the output signal frequency and 200 ppm adjustment of the spread ratio. This technique is achieved by controlling a triangular modulation signal characteristics generated by a proposed digital controlled wave generator. A proposed multi-modulus divider can have a divide ratio of 4/5 and 8/9. This SSCG has been fabricated in a 0.13-µm CMOS process. The output signal frequency-range and the spread ratio are achieved fluently from 0.1 to 3.0 GHz and from 0 to 30000 ppm, respectively. EMI noise is suppressed at less than 17.1 dB at the output signal frequency of 3.0 GHz and spread ratio of 30000 ppm.

  • A 0.5-V, 0.05-to-3.2 GHz LC-Based Clock Generator for Substituting Ring Oscillators under Low-Voltage Condition

    Wei DENG  Kenichi OKADA  Akira MATSUZAWA  

     
    PAPER-Electronic Circuits

      Vol:
    E95-C No:7
      Page(s):
    1285-1296

    This paper investigates a clock frequency generator for ultra-low-voltage sub-picosecond-jitter clock generation in future 0.5-V LSI and power aware LSI. To address the potential possible solution for ultra-low-voltage applications, a 0.5 V clock frequency generator is proposed and implemented. Significant performances, in terms of sub 1-ps jitter, 50 MHz-to-6.4 GHz frequency tuning range with 2 bands and sub 1-mW PDC, demonstrated the viable replacement of ring oscillators in low-voltage and low-jitter clock generator.

  • A Clock Generator with Clock Period, Duty-Ratio and I/Q-Balance Adjustment Capabilities for On-Chip Timing-Margin Tests

    Shunichi KAERIYAMA  Mikihiro KAJITA  Masayuki MIZUNO  

     
    PAPER-Integrated Electronics

      Vol:
    E94-C No:1
      Page(s):
    102-109

    A 4-phase clock generator, which can dynamically change clock frequencies, duty ratios and I/Q balance, is proposed for on-chip timing margin testing. The clock generator macro is integrated into the microprocessor chip of the supercomputer SX-9, which is fabricated with a 65 nm CMOS technology. It demonstrates frequency syntheses of 1.68 GHz to 3 GHz range, an instant frequency change capability for timing margin testing, duty ratio and I/Q balance adjustments of -12.5 ps to 9.4 ps with a 3.125 ps step resolution.

  • A Pseudo Fractional-N Clock Generator with 50% Duty Cycle Output

    Wei-Bin YANG  Yu-Lung LO  Ting-Sheng CHAO  

     
    PAPER

      Vol:
    E93-C No:3
      Page(s):
    309-316

    A proposed pseudo fractional-N clock generator with 50% duty cycle output is presented by using the pseudo fractional-N controller for SoC chips and the dynamic frequency scaling applications. The different clock frequencies can be generated with the particular phase combinations of a four-stage voltage-controlled oscillator (VCO). It has been fabricated in a 0.13 µm CMOS technology, and work with a supply voltage of 1.2 V. According to measured results, the frequency range of the proposed pseudo fractional-N clock generator is from 71.4 MHz to 1 GHz and the peak-to-peak jitter is less than 5% of the output period. Duty cycle error rates of the output clock frequencies are from 0.8% to 2% and the measured power dissipation of the pseudo fractional-N controller is 146 µW at 304 MHz.

  • A Low-Jitter Area-Efficient LC-VCO Based Clock Generator in 0.13-µm CMOS

    Joonhee LEE  Sungjun KIM  Sehyung JEON  Woojae LEE  SeongHwan CHO  

     
    LETTER-Electronic Circuits

      Vol:
    E92-C No:4
      Page(s):
    589-591

    This letter presents an ultra low-jitter clock generator that employs an area-efficient LC-VCO. In order to fully utilize the area of the on-chip inductor, the loop filter of a phase locked loop (PLL) is located underneath the inductor. A prototype chip implemented in 0.13 µm CMOS process achieves 105 MHz to 225 MHz of clock frequency while consuming 4.2 mW from 1.2 V supply. The measured rms jitter and normalized rms jitter of the proposed clock generator are 2.8 ps and 0.031% at 105 MHz, respectively.

  • A Low-Power Low-Noise Clock Signal Generator for Next-Generation Mobile Wireless Terminals

    Akihide SAI  Daisuke KUROSE  Takafumi YAMAJI  Tetsuro ITAKURA  

     
    LETTER

      Vol:
    E91-A No:2
      Page(s):
    557-560

    Sampling clock jitter degrades the dynamic range of an analog-to-digital converter (ADC). In this letter, a low-power low-noise clock signal generator for ADCs is described. As a clock signal generator, a ring-VCO-based charge pump PLL is used to reduce power dissipation within a given jitter specification. The clock signal generator is fabricated on a CMOS chip with 200-MSPS 10-bit ADC. The measured results show that the ADC keeps a 60-MHz input bandwidth and 53-dB dynamic range and a next-generation mobile wireless terminal can be realized with the ADCs and the on-chip low-power clock generator.

  • Efficient Memory Utilization for High-Speed FPGA-Based Hardware Emulators with SDRAMs

    Kohei HOSOKAWA  Katsunori TANAKA  Yuichi NAKAMURA  

     
    PAPER-System Level Design

      Vol:
    E90-A No:12
      Page(s):
    2810-2817

    FPGA-based hardware emulators are often used for the verification of LSI functions. They generally have dedicated external memories, such as SDRAMs, to compensate for the lack of memory capacity in FPGAs. In such a case, access between the FPGAs and the dedicated external memory may represent a major bottleneck with respect to emulation speed since the dedicated external memory may have to emulate a large number of memory blocks. In this paper, we propose three methods, "Dynamic Clock Control (DCC)," "Memory Mapping Optimization (MMO)," and "Efficient Access Scheduling (EAS)," to avoid this bottleneck. DCC controls an emulation clock dynamically in accord with the number of memory accesses within one emulation clock cycle. EAS optimizes the ordering of memory access to the dedicated external memory, and MMO optimizes the arrangement of the dedicated external memory addresses to which respective memories will be emulated. With them, emulation speed can be made 29.0 times faster, as evaluated in actual LSI emulations.

  • A PLL-Based Programmable Clock Generator with 50-to 350-MHz Oscillating Range for Video Signal Processors

    Junichi GOTO  Masakazu YAMASHINA  Toshiaki INOUE  Benjamin S. SHIH  Youichi KOSEKI  Tadahiko HORIUCHI  Nobuhisa HAMATAKE  Kouichi KUMAGAI  Tadayoshi ENOMOTO  Hachiro YAMADA  

     
    PAPER-Processor Interfaces

      Vol:
    E77-C No:12
      Page(s):
    1951-1956

    A programmable clock generator, based on a phase-locked loop (PLL) circuit, has been developed with 0.5 µm CMOS triple-layer Al interconnection technology for use as an on-chip clock generator in a 300-MHz video signal processor. The PLL-based clock generator generates a clock signal whose frequency ranges from 50 to 350 MHz which is an integral multiple, from 2 to 16, of an external clock frequency. In order to achieve stable operation within this wide range, a voltage controlled oscillator (VCO) with selectable low VCO gain characteristics has been developed. Experimental results show that the clock generator generates a 297-MHz clock with a 27-MHz external clock, with jitter of 180 ps and power dissipation of 120 mW at 3.3-V power supply, and it can also oscillate up to 348 MHz with a 31.7-MHz external clock.