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[Keyword] all-digital(10hit)

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  • A Fully-Synthesizable 10.06Gbps 16.1mW Injection-Locked CDR in 28nm FDSOI

    Aravind THARAYIL NARAYANAN  Wei DENG  Dongsheng YANG  Rui WU  Kenichi OKADA  Akira MATSUZAWA  

     
    PAPER

      Vol:
    E100-C No:3
      Page(s):
    259-267

    An all-digital fully-synthesizable PVT-tolerant clock data recovery (CDR) architecture for wireline chip-to-chip interconnects is presented. The proposed architecture enables the co-synthesis of the CDR with the digital core. By eliminating the resource hungry manual layout and interfacing steps, which are necessary for conventional CDR topologies, the design process and the time-to-market can be drastically improved. Besides, the proposed CDR architecture enables the re-usability of majority of the sub-systems which enables easy migration to different process nodes. The proposed CDR is also equipped with a self-calibration scheme for ensuring tolerence over PVT. The proposed fully-syntehsizable CDR was implemented in 28nm FDSOI. The system achieves a maximum data rate of 10.06Gbps while consuming a power of 16.1mW from a 1V power supply.

  • A Design of 0.7-V 400-MHz All-Digital Phase-Locked Loop for Implantable Biomedical Devices

    Jungnam BAE  Saichandrateja RADHAPURAM  Ikkyun JO  Weimin WANG  Takao KIHARA  Toshimasa MATSUOKA  

     
    PAPER

      Vol:
    E99-C No:4
      Page(s):
    431-439

    A low-voltage controller-based all-digital phase-locked loop (ADPLL) utilized in the medical implant communication service (MICS) frequency band was designed in this study. In the proposed design, controller-based loop topology is used to control the phase and frequency to ensure the reliable handling of the ADPLL output signal. A digitally-controlled oscillator with a delta-sigma modulator was employed to achieve high frequency resolution. The phase error was reduced by a phase selector with a 64-phase signal from the phase interpolator. Fabricated using a 130-nm CMOS process, the ADPLL has an active area of 0.64 mm2, consumes 840 µW from a 0.7-V supply voltage, and has a settling time of 80 µs. The phase noise was measured to be -114 dBc/Hz at an offset frequency of 200 kHz.

  • A Varactor-Based All-Digital Multi-Phase PLL with Random-Sampling Spur Suppression Techniques

    Chia-Wen CHANG  Kai-Yu LO  Hossameldin A. IBRAHIM  Ming-Chiuan SU  Yuan-Hua CHU  Shyh-Jye JOU  

     
    PAPER-Integrated Electronics

      Vol:
    E99-C No:4
      Page(s):
    481-490

    This paper presents a varactor-based all-digital phase-locked loop (ADPLL) with a multi-phase digitally controlled oscillator (DCO) for near-threshold voltage operation. In addition, a new all-digital reference spur suppression (RSS) circuit with multiple phases random-sampling techniques to effectively spread the reference clock frequency is proposed to randomize the synchronized DCO register behavior and reduce the reference spur. Because the equivalent reference clock frequency is reserved, the loop behavior is maintained. The area of the proposed spur suppression circuit is only 4.9% of the ADPLL (0.038 mm2). To work reliably at the near-threshold region, a multi-phase DCO with NMOS varactors is presented to acquire precise frequency resolution and high linearity. In the near-threshold region (VDD =0.52 V), the ADPLL only dissipates 269.9 μW at 100 MHz output frequency. It has a reference spur of -52.2 dBc at 100 MHz output clock frequency when the spur suppression circuit is deactivated. When the spur suppression circuit is activated, the ADPLL shows a reference spur of -57.3 dBc with the period jitter of 0.217% UI.

  • A Near-Threshold Cell-Based All-Digital PLL with Hierarchical Band-Selection G-DCO for Fast Lock-In and Low-Power Applications

    Chia-Wen CHANG  Yuan-Hua CHU  Shyh-Jye JOU  

     
    PAPER-Integrated Electronics

      Vol:
    E98-C No:8
      Page(s):
    882-891

    This paper presents a cell-based all-digital phase-locked loop (ADPLL) with hierarchical gated digitally controlled oscillator (G-DCO) for low voltage operation, wide frequency range as well as low-power consumption. In addition, a new time-domain hierarchical frequency estimation algorithm (HFEA) for frequency acquisition is proposed to estimate the output frequency in 1.5MF (MF = 3 in this paper) cycles and this fast lock-in time is suitable to the dynamic voltage frequency scaling (DVFS) systems. A hierarchical G-DCO is proposed to work at low supply voltage to reduce the power consumption and at the same time to achieve wide frequency range and precise frequency resolution. The core area of the proposed ADPLL is 0.02635 mm2. In near-threshold region (VDD = 0.36 V), the proposed ADPLL only dissipates 68.2 µW and has a rms period jitter of 1.25% UI at 60 MHz output clock frequency. Under 0.5 V VDD operation, the proposed ADPLL dissipates 404.2 µW at 400 MHz. The fast lock-in time of 4.489 µs and the low jitter performance below 0.5% UI at 400 MHz output clock frequency in the proposed ADPLL are suitable in event-driven or DVFS applications.

  • An All-Digital Reconfigurable Time-Domain ADC for Low-Voltage Sensor Interface in 65nm CMOS Technology

    Yu HOU  Takamoto WATANABE  Masaya MIYAHARA  Akira MATSUZAWA  

     
    PAPER

      Vol:
    E98-A No:2
      Page(s):
    466-475

    An all-digital time-domain ADC, abbreviated as TAD, is presented in this paper. All-digital structure is intrinsically compatible with the scaling of CMOS technology, and can satisfy the great demand of miniaturized and low-voltage sensor interface. The proposed TAD uses an inverter-based Ring-Delay-Line (RDL) to transform the input signal from voltage domain to time domain. The voltage-modulated time information is then digitized by a composite architecture namely “4-Clock-Edge-Shift Construction” (4CKES). TAD features superior voltage sensitivity and 1st-order noise shaping, which can significantly simplify the power-hungry pre-conditioning circuits. Reconfigurable resolution can be easily achieved by applying different sampling rates. A TAD prototype is fabricated in 65nm CMOS, and consumes a small area of 0.016mm2. It achieves a voltage resolution of 82.7µV/LSB at 10MS/s and 1.96µV/LSB at 200kS/s in a narrow input range of 0.1Vpp, merely under 0.6V supply. The highest SNR of TAD prototype is 61.36dB in 20kHz bandwidth at 10MS/s. This paper also analyzes the nonideal effects of TAD and discusses the potential solutions. As the principal drawback, nonlinearity of TAD can be compensated by the differential-setup and digital calibration.

  • All-Digital Wireless Transceiver with Sub-Sampling Demodulation and Burst-Error Correction

    Sanad BUSHNAQ  Makoto IKEDA  Kunihiro ASADA  

     
    PAPER-Circuit Design

      Vol:
    E95-A No:12
      Page(s):
    2234-2241

    In this paper, an all-digital wireless transceiver for near-field communication (NFC) is presented. A novel modulation technique that allows employing only all-digital components in the transceiver is used. The front-end uses all-digital sub-sampling for carrier demodulation, which does not need synchronization circuitry. Burst-errors generated by the front-end are corrected in baseband using hamming code and interleaving techniques. Experimentally, the all-digital transceiver was tested on FPGAs that performed successful wireless communication at range/diameter equal to 1, which is higher than recent NFC research. Our transceiver uses only all-digital components, and consumes less area compared to other research.

  • A 0.357 ps Resolution, 2.4 GHz Time-to-Digital Converter with Phase-Interpolator and Time Amplifier

    YoungHwa KIM  AnSoo PARK  Joon-Sung PARK  YoungGun PU  Hyung-Gu PARK  HongJin KIM  Kang-Yoon LEE  

     
    PAPER-Integrated Electronics

      Vol:
    E94-C No:12
      Page(s):
    1896-1901

    In this paper, we propose a two-step TDC with phase-interpolator and time amplifier to satisfy high resolution at 2.4 GHz input frequency by implementing delay time less than that of an inverter delay. The accuracy of phase-interpolator is improved for process variation using the resistor automatic-tuning circuit. The gain of time amplifier is improved using the delay time difference between two delay cells. It is implemented in a 0.13 µm CMOS process with a die area of 0.68 mm2. And the power consumption is 14.4 mW at a 1.2 V supply voltage. The resolution and input frequency of the TDC are 0.357 ps and 2.4 GHz, respectively.

  • High Gain and Wide Range Time Amplifier Using Inverter Delay Chain in SR Latches

    Jaejun LEE  Sungho LEE  Yonghoon SONG  Sangwook NAM  

     
    LETTER-Electronic Circuits

      Vol:
    E92-C No:12
      Page(s):
    1548-1550

    This paper presents a time amplifier design that improves time resolution using an inverter chain delay in SR latches. Compared with the conventional design, the proposed time amplifier has better characteristics such as higher gain, wide range, and small die size. It is implemented using 0.13 µm standard CMOS technology and the experimental results agree well with the theory.

  • Analysis and Design of Direct Reference Feed-Forward Compensation for Fast-Settling All-Digital Phase-Locked Loop

    Win CHAIVIPAS  Akira MATSUZAWA  

     
    PAPER-Analog and Communications

      Vol:
    E90-C No:4
      Page(s):
    793-801

    A method for shortening of the settling time in all digital phase-locked loops is proposed. The method utilizes self monitoring to obtain the parameters necessary for feed-forward compensation. Analysis shows that by employing this technique both fast settling and good stability can be achieved simultaneously. Matlab and Verilog-AMS simulation shows that typical settling speed can be reduced to less than one tenth compared to a system without the feed-forward compensation, by merely employing the feed-forward compensation system. Further more a design example shows that this settling time can be decreased further to less than one fifteenth through design considerations when compared to a speed optimized phase-locked loop design system without direct reference feed-forward compensation.

  • An All-Digital CMOS Duty Cycle Correction Circuit with a Duty-Cycle Correction Range of 15-to-85% for Multi-Phase Applications

    Jang-Jin NAM  Hong-June PARK  

     
    LETTER-Electronic Circuits

      Vol:
    E88-C No:4
      Page(s):
    773-777

    An all-digital CMOS duty cycle correction (DCC) circuit with a fixed rising edge was proposed to achieve the wide correction ranges of input duty cycle and PVT variations, the low standby power and the fast recovery from the standby mode for use in multi-phase clock systems. SPICE simulations showed that this DCC adjusts the output duty cycle to 500.7% for the wide range of input duty cycle from 15% to 85% at the input frequency of 1 GHz, within the commercial range of PVT corners. The all-digital implementation and the use of a toggle flip flop at the input stage enabled the wide correction ranges of PVT variations and input duty cycle, respectively.