Since semiconductor memory chip has been growing rapidly in its capacity, memory testing has become a crucial problem in RAMs. This paper proposes a new RAM test algorithm, called generalized marching test (GMT), which detects static and dynamic pattern sensitive faults (PSF) in RAM chips. The memory array with N cells is partitioned into B sets in which every two cells has a cell-distance of at least d. The proposed GMT performs the ordinary marching test in each set and finally detects PSF having cell-distance d. By changing the number of partitions B, the GMT includes the ordinary marching test for B1 and the walking test for BN. This paper demonstrates the practical GMT with B2, capable of detecting PSF, as well as other faults, such as cell stuck-at faults, coupling faults, and decoder faults with a short testing time.

To speed up a guided-probe diagnosis process, the number of probed lines needs to be reduced. This paper presents two efficient probing line determination methods by which the number of probed lines is either small or minimum. The concept of fault probability is introduced to reflect the fact that not all gates have the same probability to be faulty. Experimental results show the effectiveness of the proposed methods.

In this paper, we present an efficient method for the fault simulation of the reconvergent fan-out stem. Our method minimizes the fault propagating region by analyzing the topology of the circuit, whose region is smaller than that of Tulip's. The efficiency of our method is illustrated by experimental results for a set of benchmark circuits.

Existing algorithmic debugging methods which can locate faults under the guidance of a system have a number of shortcomings. For example, some cannot be applied to imperative languages with side effects; some can locate a faulty function but cannot locate a faulty statement; and some cannot detect faults related to missing statements. This paper presents an algorithmic critical slice-based fault-locating method for imperative languages. Program faults are first classified into two categories: wrong-value faults and missing-assignment faults. The critical slice with respect to a variable-value error is a set of statements such that (1) a wrong-value fault contained in any instruction in the critical slice may have caused that variable-value error, and (2) a wrong-value fault contained in any instruction outside the critical slice could never have caused that variable-value error. The paper also classifies errors found during program testing into three categories: wrong-output errors, missing-output errors, and infinite-loop errors with no output. It finally shows that it is possible to algorithmically locate any fault, including missing statements, for each type of error.

This paper presents a general form and a set of basic gates to implement (K+1)-valued PLA structure logic circuits. A complete fault analysis on the proposed circuit has been done and it is shown that all fanout stem faults can be collapsed to branch faults. A procedure for fault collapsing is derived. For any function implemented in the (K+1)-valued circuit, the number of remaining faults is smaller than that of the 2-valued circuit after the collapsing, where the value of K is dependent on the number of outputs and the assignment of the OR plane of the 2-valued logic circuit.

Generally it is said that a fuzzy control system has fault tolerant properties, but it is not clearly studied. In this paper, first, the influence of faults in fuzzy control systems is examined. Errors given by fault simulation are not negligible. However, no fault detecting method is applied in the realized fuzzy control systems. Then a fault-checking method to detect faults is proposed in this paper.

This paper first clarifies the logic construction of safety control for the operation of a power press and then describes fail-safe dual two-rail system signal processing and fail-safe multiple-valued logic operations as methods for achieving this control as a fail-safe system. It finally shows a circuit for generating fail-safe two-rail run button signals based on ternary logic for concrete operation of the power press and an operation control circuit for confirming brake performance for each cycle of slide operation by using the run button signals. The control circuit uses such multiple-valued logic operations that binary logic signals that do not erroneously go logic 1 are added to a multiple-valued logic signal and the multiple-valued logic signal is converted to a binary logic signal that does not erroneously go logic 1 by a threshold operation.

A fail-safe logic operation refers to such a processing operation that the output assumes the logical value zero when the operation circuit fails. The fail-safe multiple-valued logic operation is proposed as one method of logic operation. Section 2 defines the fail-asfe multiple-valued logic operation and presents an example of method for accomplishing the fail-safe multiple-valued logic operation. Section 3 describes the method of designing a fail-safe threshold operation device (window comparator) as basic device in the fail-safe multiple-valued logic operation in consideration of LSI implementation and shows an example of prototype fail-safe window comparator. This operation device has higher and lower thresholds. It oscillates and produces an operational output signal only when the input signal level falls between the higher and lower thresholds. Unless the fail-safe window comparator is supplied with input signals of higher voltage than the power supply voltage, it dose not form a feedbadk loop as required for it to oscillate. This characteristic prevents the device from erroneously producing an output signal when any failure occurs in the amplifiers comprising the oscillation circuit. The window comparator can be built as a fail-safe threshold operation device. The fail-safe characteristic is utilized in its LSI implementation. Section 4 verifies the fail-safe property of the prortotype fail-safe window comparator. It is shown that even when the LSI develops failures not evident from outsid (latent failures), it does not lose the operational function and maintains the fail-safe characteristic.

The Memory-Based Reasoning (MBR) is one of the mainstay approaches in massively parallel artificial intelligence research. However, it has not been explored from the viewpoint of hardware implementation. This paper demonstrates high robustness of the MBR, which is suitable for hardware implementation using Wafer Scale Integration (WSI) technology, and proposes a design of WSI-MBR hardware. The robustness is evaluated by a newly developed WSI-MBR simulator in the English pronunciation reasoning task, generally known as MBRTalk. The results show that defects or other fluctuations of device parameters have only minor impacts on the performances of the WSI-MBR. Moreover, it is found that in order to get higher reasoning accuracy, the size of the MBR database is much more crucial than the computation resolution. These features are proved to be caused by the fact that MBR does not rely upon each single data unit but upon a bulk data set. Robustness in the other MBR tasks can be evaluated in the same manner as discussed in this paper. The proposed WSI-MBR processor takes advantage of benefits discovered in the simulation results. The most area-demanding circuits--that is, multipliers and adders--are designed by analog circuits. It is expected that the 1.7 million processors will be integrated onto the 8-inch silicon wafer by the 0.3 µm SRAM technology.

Robust-fault tolerance is a property that a computational result becomes nearly equal to the correct one at the occurrence of faults in digital system. There are many cases where the safety of digital control systems can be maintained if the property is satisfied. In this paper, robust-fault-tolerant three-valued arithmetic modules such as an adder and a multiplier are proposed. The positive and negative integers are represented by the number of 1's and 1's, respectively. The design concept of the arithmetic modules is that a fault makes linearly additive effect with a small value to the final result. Each arithmetic module consists of identical submodules linearly connected, so that multi-stage structure is formed to generate the final output from the last submodule. Between the input and output digits in the submodule some simple functional relation is satisfied with respect to the number of 1's and 1's. Moreover, the output digit value depends on very small portion of the submodules including the input digits. These properties make the linearly additive effect with a small value to the final result in the arithmetic modules even if multiple faults are occurred at the input and output of any gates in the submodules. Not only direct three-valued representation but also the use of three-valued logic circuits is inherently suitable for efficient implementation of the arithmetic VLSI system. The evaluation of the robust-fault-tolerant three-valued arithmetic modules is done with regard to the chip size and the speed using the standard CMOS design rule. As a result, it is made clear that the chip size can be greatly reduced.

A typical fault-tolerance technique of systolic arrays is to include redundant processors and links so that the array is reconfigurable when some processors fail. Another typical technique is to implement each processor by a majority voter and N (N3) copies of processors so that the faults of up to N-2 copies of processors can be masked without reconfiguration. This paper proposes a systolic linear array called reconfigurable modular redundant linear array (RMA) that combines these techniques with N4. When up to 2 copies of each processor fail in RMA, the faults can be masked without reconfiguration. When some voters or more than 2 copies of a processor fail, RMA can be reconfigured by specifying a new switch pattern. In order to perform reconfiguration efficiently, we present a reconfiguration algorithm with time complexity O (n), where n is the number of processors in RMA.

The self-checking design using 2-rail logic is one of the most popular design of self-shecking circuits. Even for a self-checking circuit, a test is necessary after VLSI chip or system fabrication, at each time the system is powered, and, under certain circumstances, in the case of maintenance. Therefore, an easy test scheme is desirable for that circuit. A new design method for a 2-rail logic combinational circuit is proposed, where stuck-open and sutck-on faults FETs can be easily detected. In the proposed circuit design, 4 FETs are added to each gate in a conventional 2-rail logic circuit. Two logical gates, DOR and DAND, are also added to the circuit as fault observing gates. Each test consists of a sequence of 3 input vectors, that is, a type of 3-pattern test, ti1ti2ti3. A test can be easily generated and fault observation is easy. Stuck-at fault and stuck-open fault on lines and almost all multiple faults can also be detected by the test. A gate construction method, test generation method, circuit construction method, and several discussions including gate delay increasing are presented.

This paper proposes a new fault tolerant intercommunication scheme for real-time operations and three new interconnection networks to construct a fault tolerant multi-processor system for pipeline processings. The proposed intercommunication scheme using bank memory switching technique has an advantage to make a fault tolerant pipeline system so that it can detect any failure caused in a processing element of the system. In addition, it can overcome conventional problems caused in interconnection circuits to flow data with one way direction such as a pipeline processing.

In developing the SXO operating system for the SURE SYSTEM 2000 continuous operation system, we aimed to create an unprecedentedly high software and hardware fault tolerance. We devised a fault tolerant architecture and various methodologies to ensure fault tolerance. We implemented these techniques systematically throughout operating system development. In the design stage, we developed a design methodology called the recovery process chart to verify that recovery mechanisms were complete. In the manufacturing stage, we applied the concept of critical routes to recovery and other processes essential to high dependability. We also developed a method of finding critical routes in a recovery process chart. In the test stage, we added an artificial software fault injection mechanism to the operating system. It generates various reproducible errors at appropriate times and reduces the number of personnel needed for test, making system reliability evaluation easy.

In complex self-checking systems several blocks (i.e. functional blocks and checkers) are embedded. In order to check the self-checking properties of such blocks we need to know the set of vectors they receive from the blocks feeding their inputs (i.e. the code word output spaces of the source blocks). In a complex system the computation of the output spaces by means of exhaustive simulation of the system is intractable. In this paper we present a tool which performs this computation with low CPU time. Some other tools allowing to verify the self-checking properties of embedded blocks (like the strongly fault secure property of embedded PLAs and the self-testing property of embedded checkers), have also been developed and experimented.

This paper describes a nonstationary spectral analysis method and its application to prognosis and diagnosis of automobiles. An instantaneous frequency spectrum is considered first at a single point of time based on the instantaneous representation of autocorrelation. The spectral distortion is then considered on two-dimensional spectrum, and the filtering is introduced into the instantaneous autocorrelations. By the above procedure, the Instantaneous Covariance method (ICOV), the Instantaneous Maximum Entropy Method (IMEM), and the Wigner method are shown and they are unified. The IMEM is used for the time-dependent spectral estimation of vibration and acoustic sound signals of automobiles. A multi-dimensional (M-D) space is composed based on the variables which are obtained by the IMEM. The M-D space is transformed into a simple two-dimensional (2-D) plane by a projection matrix chosen by the experiments. The proposed method is confirmed useful to analyze nonstationary signals, and it is expected to implement automatic supervising, prognosis and diagnosis for a traffic system.

Synchronous clocks are an essential requirement for a variety of distributed system applications. Many of these applications are safety-critical and require fault tolerance. In this paper, a general probabilistic clock synchronization model is presented. This model is uniformly probabilistic, incorporating random message delays, random clock drifts, and random fault occurrences. The model allows faults in any system component and of any type. Also, a new Sliding Window Clock Synchronization Algorithm (SWA) providing increased fault tolerance is proposed. The probabilistic model is used for an evaluation of SWA which shows that SWA is capable of tolerating significantly more faults than other algorithms and that the synchronization tightness is as good or better than that of other algorithms.

This paper describes a new method for verifying designs at the RTL with respect to their specifications at the functional level. The base of the verification method shown here is the translation of the specification and design representations to graph models, where the descriptions common to both representations have a symbolic representation. These symbol labeled graphs are then simplified and, by solving the all node-pair path expression problem for them, a pair of regular expressions is obtained for every two nodes in the graphs. The first regular expression in each pair represents the flow of control and the second one the flow of data between the corresponding nodes. The process of verification is carried out by checking whether or not every pair of regular expressions of the specification has a corresponding pair in the design.

When a group of developers are involved in the distributed development of some software product, they must communicate with one another frequently to exchange information about the product. To reduce the penalty of communication, the support environment should provide developers with their necessary information and update the information automatically while the product is modified by developers. Furthermore, the environment must meet the following requirements despite of workstation failures: whether a specific information is correct or not should always be decidable; as much information as possible should be updated correctly and efficiently. This paper presents a framework to construct such a fault-tolerant environment based on attribute grammars. In the framework, a product is represented by an attributed tree, which is partitioned into several subtrees {T1,,Tm}. Attribute values in each subtree Ti(1im) express the information about the product required by a developer. We introduce a set of redundant data and algorithms to meet the fault-tolerance requirements mentioned above. The correctness of an attribute value in Ti can then be decided in O(mn0log n) time, where n0n, and n is the number of attribute instances in Ti. All available attribute values can be updated with time complexity O(m2n1 log n) and communication complexity O(m2), where n1 is the number of attribute instances that must be reevaluated.

Strongly Fault-Secure (SFS) circuits are known to achieve the TSC goal of producing a non-codeword as the first erroneous output due to a fault. Strongly Code-Disjoint (SCD) circuits always map non-codeword inputs to non-codeword outputs even in the presence of faults so long as the faults are undetectable. This paper presents a new generalized design method for the SFS and SCD realization of combinational circuits. The proposed design is simple, and always gives an SFS and SCD combinational circuit which implements any given logic function. The resulting SFS/SCD circuits can be connected in cascade with each other to construct a larger SFS/SCD circuit if each interface is fully exercised.