We fabricated junctions with a porphyrin polyimide (PORPI) monolayer, and then investigated the electron transport properties of the junctions from the current-voltage (I-V) and d2V/dI2-V measurements. Polyimide LB films without porphyrin were used as tunneling barriers. One large peak was seen at a voltage around 1.9 V, due to the excitation of electron transitions in PORPI molecules, whereas a step structure was not observed in the I-V characteristic.

The generation and design of a stationary Markov signal are discussed as an inverse problem, in which one looks for a transition probability when a stationary probability distribution is given. This paper presents a new solution to the inverse problem, which makes it possible to design and generate a Markov random signal with arbitrary probability distribution and an exponential correlation function. Several computer results are illustrated in figures.

We discuss estimation error as a basic problem in formant estimation in the analysis of speech of very short-time duration in the glottal closure of the vowel. We also show in our simulation that good estimation of the first formant is almost impossible with the ordinary method using a waveform cutting. We propose a new method in which the cut waveform, as a discontinuous function of finite time, is mapped to a continuous function defined in the whole time domain; and we show that using this method, the estimation accuracy for low frequency formants can be greatly improved.

Relating to the problem of suppressing the immanent redundancy contained in an image with out vitiating the quality of the resultant approximation, the interpolation of multi-dimensional signal is widely discussed. The minimization of the approximation error is one of the important problems in this field. In this paper, we establish the optimum interpolatory approximation of multi-dimensional orthogonal expansions. The proposed approximation is superior, in some sense, to all the linear and the nonlinear approximations using a wide class of measures of error and the same generalized moments of these signals. Further, in the fields of information processing, we sometimes consider the orthonormal development of an image each coefficient of which represents the principal featurr of the image. The selection of the orthonormal bases becomes important in this problem. The Fisher's criterion is a powerful tool for this class of problems called declustering. In this paper, we will make some remarks to the problem of optimizing the Fisher's criterion under the condition that the quality of the approximation is maintained.

In order to evaluate the effect of testing technologies such as electron beam (EB) testing and focused ion beam (FIB) reconstruction on the VLSI development cycle, the VLSI development period and cost are analyzed by using detailed fault models which make possible to take into consideration the effect of EB and FIB techniques. First, the specifications of fabricated VLSIs and the VLSI development cycle are modeled. Next the faults which can be diagnosed by such testing techniques are modeled. By using the parametric model of the VLSI development cycle, the development period and cost are analyzed. In the fault diagnosis stage, the use of an EB tester or the combinational use of an EB tester and an FIB equipment, instead of a traditional mechanical prober is considered. It is seen that the development period and cost are reduced by using EB and FIB diagnosis equipments by a factor of about 3. The effect of scan path method is also evaluated by making use of the same simulation method. Results show that the scan path design is effective for the reduction in both period and cost in the development cycle.

This report describes 4-2 compressors composed of Complementary Pass-Transistor Logic (CPL). We will show that circuit designs of the 4-2 compressors can be optimized for high speed and small size using only exclusive-OR's and multiplexers. According to a circuit simulation with 0.8µm CMOS device parameters, the maximum propagation delay and the average power consumption per unit adder are 1.32 ns and 11.6 pJ, respectively.

A method to improve the efficiency of dynamic fault imaging (DFI) by fully utilizing the CAD data in the CAD-linked electron beam test system is proposed. In the method, in order to shorten the long acquisition time of the stroboscopic voltage contrast images over the whole area of the chip during the entire test cycle, only the area and phase (time) required for fault tracing are selected by utilizing the CAD data. Furthermore, image processing techniques are combined with the method to improve the efficiency of the DFI. In particular, the signal averaging technique is used in order to improve the signal-to-noise ratio in the stroboscopic images where all voltage information data on the equipotential electrode recognized by the CAD layout data are averaged. This enables us to reduce the acquisition time of images. Moreover, the experimental system is set up so that the image processing can be performed in parallel with the acquisition of the stroboscopic images. The proposed method is applied to part of a 2k-transistor block of a nonpassivated CMOS LSI where a marginal fault is detected. The result shows that the method is an efficient approach to the fully automatic fault diagnosis in the CAD-linked electron beam test system. The proposed method could improve the efficiency of the conventional DFI by a factor of more than 1000.

We propose a fast computation method of stochastic relaxation for the continuous-valued Markov random field (MRF) whose energy function is represented in the quadratic form. In the case of regularization in visual information processing, the probability density function of a state transition can be transformed to a Gaussian function, therefore, the probablistic state transition is realized with Gaussian random numbers whose mean value and variance are calculated based on the condition of the input data and the neighborhood. Early visual information processing can be represented with a coupled MRF model which consists of continuity and discontinuity processes. Each of the continuity or discontinuity processes represents a visual property, which is like an intensity pattern, or a discontinuity of the continuity process. Since most of the energy function for early visual information processing can be represented by the quadratic form in the continuity process, the probability density of local computation variables in the continuity process is equivalent to the Gaussian function. If we use this characteristic, it is not necessary for the discrimination function computation to calculate the summation of the probabilities corresponding to all possible states, therefore, the computation load for the state transition is drastically decreased. Furthermore, if the continuous-valued discontinuity process is introduced, the MRF model can directly represent the strength of discontinuity. Moreover, the discrimination function of this energy function in the discontinuity process, which is linear, can also be calculated without probability summation. In this paper, a fast method for calculating the state transition probability for the continuous-valued MRF on the visual informtion processing is theoretically explained. Next, initial condition dependency, computation time and dependency on the statistical estimation of the condition are investigated in comparison with conventional methods using the examples of the data restoration for a corrupted square wave and a corrupted one-dimensional slice of a natural image.

This paper proposes a new method to determine the shape of a surface by learning the mapping between three image irradiances observed under illumination from three lighting directions and the corresponding surface gradient. The method uses Phong reflectance function to describe specular reflectance. Lambertian reflectance is included as a special case. A neural network is constructed to estimate the values of reflectance parameters and the object surface gradient distribution under the assumption that the values of reflectance parameters are not known in advance. The method reconstructs the surface gradient distribution after determining the values of reflectance parameters of a test object using two step neural network which consists of one to extract two gradient parameters from three image irradiances and its inverse one. The effectiveness of this proposed neural network is confirmed by computer simulations and by experiment with a real object.

Analysis of satellite images requires classificatio of image objects. Since different categories may have almost the same brightness or feature in high dimensional remote sensing data, many object categories overlap with each other. How to segment the object categories accurately is still an open question. It is widely recognized that the assumptions required by many classification methods (maximum likelihood estimation, etc.) are suspect for textural features based on image pixel brightness. We propose an image feature based neural network approach for the segmentation of AVHRR images. The learning algoriothm is a modified backpropagation with gain and weight decay, since feedforward networks using the backpropagation algorithm have been generally successful and enjoy wide popularity. Destructive algorithms that adapt the neural architecture during the training have been developed. The classification accuracy of 100% is reached for a validation data set. Classification result is compared with that of Kohonen's LVQ and basic backpropagation algorithm based pixel-by-pixel method. Visual investigation of the result images shows that our method can not only distinguish the categories with similar signatures very well, but also is robustic to noise.

The number of nodes in a hidden layer of a feed-forward layered network reflects an optimality condition of the network in coding a function. It also affects the computation time and the ability of the network to generalize. When an arbitrary number of hidden nodes is used in designing the network, redundancy of hidden nodes often can be seen. In this paper, a method of reducing hidden nodes is proposed on the condition that a reduced network maintains the performances of the original network within an accepted level of tolerance. This method can be applied to estimate the performances of a network with fewer hidden nodes. The estimated performances indicate the lower bounds of the actual performances of the network. Experiments were performed using the Fisher's IRIS data, a set of SONAR data, and the XOR data for classification. The results suggest that sufficient number of hidden nodes, fewer than the original number, can be estimated by the proposed method.

A network system is proposed for segmenting and extracting multiple moving objects in 2D images. The system uses an interconnected neural network in which grouping factors, such as edge proximity, smoothness of edge orientatio, and smoothness of velocity perpendicular to an edge, are embedded. The system groups edges so that the network energy may be minimized, i.e. edges may be organized into perceptually plausible configuration. Experimantal results are provided to indicate the performance and noise robustness of the system in extracting objects in synthetic images.

New detection method of passivation defect was studied. The method was the Cu decoration method without bias (bias-free Cu decoration). As the result of comparison with conventional method, it was found that a bias-free Cu decoration method was effective, sensitive and simple. In this method, the difference of humidity resistance induced by poor passivation coverage could be evaluated.

Many previous works state that a multiple Sidelobe canceller (MSLC) with two auxiliary antennas is successful in suppressing two interference signals received simultaneously by sidelobes of a main antenna. In this paper, we show that the MSLC does not always guarantee such capability in three dimensional applications where the incident direction of interference signals is defined by two angles (elevation and azimuth). We show the singularity of the autocorrelation matrix for the auxiliary channel signals induces the degradation of the capability by analyzing characteristics of MSLC's in three dimensional applications from the view point of the eigenvalue problem. To overcome this singularity, we propose a novel MSLC controlling the placement of auxiliary antennas by means of switching over three antennas arranged triangularly. Some simulations are conducted to show the effectiveness of the proposed MSLC.

We describe a geometrical optics approach for the analysis of dielectric tapered waveguides. The method is based on the ray-optical treatment for wave-normal rays defined newly to waves of light in open structures. Geometrical optics fields are represented in terms of two kinds of wave-normal rays: leaky rays and guided rays. Since the behavior of these rays is different in the two regions separated at critical incidence, the geometrical optics fields have certain classes of discontinuity in a transition region between leaky and guided regions. Guided wave solutions are given as a superposition of guided rays that zigzag along the guides, all of which are totally reflected upon the interfaces. By including some leaky rays adjacent to the guided rays, we obtain more accurate guided wave solutions. Calculated results are in excellent agreement with wave optics solutions.

Recent developments and case studies regarding VLSI device chip failure analysis are reviewed. The key failure analysis techniques reviewed include EMMS (emission microscopy), OBIC (optical beam induced current), LCM (liquid crystal method), EBP (electron beam probing), and FIB (focused ion beam method). Further, future possibilities in failure analysis, and some promising new tools are introduced.

A new image-based diagnostic method is proposed for use with an E-beam tester. The method features a static fault imaging technique and a navigation map for fault tracing. Static Fault imaging with a dc E-beam enables the fast acquisition of images without any additional hardware. Then, guided by the navigation map derived from CAD data, marginal timing faults can be easily pinpointed. A statistical estimation of the average count of static fault images for various LSI circuits shows that the proposed method can diagnose marginal faults by observing less than thirty faulty images and that a faulty area can be localized with up to five times fewer observations than with the guided-probe method. The proposed method was applied to a 19k-gate CMOS-logic LSI circuit and a marginal timing fault was successfully located.

The origin of and a method of enhancing the Optical Beam Induced Resistance Change (OBIRCH) signal for defect observation in VLSI metal interconnections is discussed based on a numerical analysis of three-dimensional thermal conduction and experimental results. The numerical analysis shows that the OBIRCH signal originates from a slight increase in the resistance of the metal line caused by laser beam heating and that its effect is influenced by the temperature of the metal layer. Both simulations and experimental results suggest that cooling the sample is preferable to detect the OBIRCH signal. The decrease in the total resistance of the metal line without any change in the amount of the resistance increase under laser illumination is found to be the main cause of the OBIRCH signal enhancement under low temperature measurement.

A convenient method for determining emitter and base resistances from small signal measurements has been developed. This method is based on Neugroschel's method, but the frequency has been varied instead of varying β0. It is demonstrated that the base resistance was successfully extracted. The extracted emitter resistance depended on the collector current because of the difference between the exact gm value and the approximated one, IC/VT. It has also been shown that the proposed method is more robust than the conventional impedance-circle method even when cross-talk occurs.

Following a discussion of various testing methods used in the electron beam (EB) test system, new waveform-based and image-based approaches in the CAD-linked electron beam (EB) test system are proposed. A waveform-based automatic tracing algorithm of the transistor-level performance faults is first discussed. Then, the method to improve the efficiency of an image-based method called dynamic fault imaging (DFI) by fully utilizing the CAD data is described. Third, the VLSI development cost is analyzed by using the fault models that make possible to take into consideration the effect of new testing technologies such as EB testing and focused ion beam (FIB) microfabrication. Finally, the future prospects are discussed.