We have developed two modulator driver ICs that are based on the functional distributed circuit (FDC) topology for over 40-Gb/s optical transmission systems using InP HBT technology. The FDC topology enables both a wide bandwidth amplifier and high-speed digital functions. The none-return-to-zero (NRZ) driver IC, which is integrated with a D-type flip-flop, exhibits 2.6-Vp-p (differential output: 5.2 Vp-p) output-voltage swings with a high signal quality at 43 and 50 Gb/s. The return-to-zero (RZ) driver IC, which is integrated with a NRZ to RZ converter, produces 2.4-Vp-p (differential output: 4.8 Vp-p) output-voltage swings and excellent eye openings at 43 and 50 Gb/s. Furthermore, we conducted electro-optical modulation experiments using the developed modulator driver ICs and a dual drive LiNbO3 Mach-Zehnder modulator. We were able to obtain NRZ and RZ clear optical eye openings with low jitters and sufficient extinction ratios of more than 12 dB, at 43 and 50 Gb/s. These results indicate that the FDC has the potential to achieve a large output voltage and create high-speed functional ICs for over-40-Gb/s transmission systems.

A novel type of optically clocked all-optical flip-flop based on a coupled-mode distributed Bragg reflector laser diode is proposed. The device operates as a bistable laser, where the two lasing modes at different wavelength are switched all-optically by injecting a clock pulse together with a set/reset signal. We employ an analytical model based on the two-mode coupled rate equations to verify the basic operation of the device numerically. Optically clocked flip-flop operation is obtained with a set/reset power of 0.60 mW and clock power of 1.8 mW. The device features simple structure, small footprint, and synchronized all-optical flip-flop operation, which should be attractive in the future digital photonic integrated circuits.

This paper discusses how to cope with dynamic power supply noise in FF timing estimation. We first review the dependence of setup and hold times on supply voltage, and point out that setup time is more sensitive to supply voltage than hold time, and hold time at nominal voltage is reasonably pessimistic. We thus propose a procedure to estimate setup time and clock-to-Q delay taking into account given voltage drop waveforms using an equivalent DC voltage approach. Experimental results show that the proposed procedure estimates setup time and clock-to-Q delay fluctuations well with 5% and 3% errors on average.

Advanced nanometer circuits are susceptible to errors caused by process, voltage, and temperature (PVT) variations or due to a single event upset (SEU). State-of-the-art design-for-variability (DFV)-aware flip-flops (FFs) suffer from their area and timing overheads. By utilizing C-element modules, two types of FFs are proposed for error detection and error correction.

An advantage of an RLD (reconfigurable logic device) such as an FPGA (field programmable gate array) is that it can be customized after being manufactured. Due to the aggressive technology scaling, device density is increasing, and it has become a serious problem in power consumption accordingly. In SoC of embedded systems, power gating is one of the major power reduction techniques. However, it is difficult to adopt SRAM-based RLDs because of the high overhead and SRAM being volatile. In this paper, we describe a TEG (test element group) chip of a reconfigurable logic based FeRAM (ferroelectric random access memory) technology. FeRAM brings reconfigurable logic devices the advantage of being a genuine power gater. The chip employs island-style routing architecture and uses a variable grain logic cell as a logic block. A NV-FF (non-volatile flip-flop), which contains FeRAM, a FF, and power-gating control circuits, is used as both configuration memories and FFs in a logic block. The NV-FF can transmit data between FeRAM and FF automatically when a power source is turned off/on. Thus chip-level power gating is possible. The hibernate/restore time is less than 1 ms. The chip has 1818 logic blocks and an area of 54.76 mm2.

This paper presents a construction of a single-event-upset (SEU) tolerant reset-set (RS) flip-flop (FF). The proposed RS-FF consists of four identical parts which form an interlocking feedback loop just like DICE. The area and average power consumption of the proposed RS-FFs are 1.101.48 and 1.201.63 times smaller than those of the conventional SEU tolerant RS-FFs, respectively.

A dual-mode pulse-triggered flip-flop design supporting functional versatility is presented. A low-complexity unified logic module, consisting of only five transistors, for dual-mode pulse generation is devised using pass transistor logic (PTL). Potential threshold voltage loss problem is successfully resolved to ensure the signal integrity. Despite the extra logic for dual-mode operations, the circuit complexity of the proposed design is comparable to those of the single mode designs. Simulations in different process corners and switching activities prove the competitive performance of proposed design against various single mode designs.

A low power pulse generator design using hybrid logic realization of a 3-input NAND gate is presented. The hybrid logic approach successfully shortens the critical path along the discharging transistor stack and thus reduces the short circuit power consumption during the pulse generation. The combination of pass transistor and full CMOS logic styles in one NAND gate design also helps minimize the required transistor size, which alleviates the loading capacitance of clock tree as well. Simulation results reveal that, compared with prior work, our design can achieve 20.5% and 23% savings respectively in power and circuit area.

In this paper, the scan chain ordering method for BIST-aided scan test for reducing test data and test application time is proposed. In this work, we utilize the simple LFSR without a phase shifter as PRPG and configure scan chains using the compatible set of flip-flops with considering the correlations among flip-flops in an LFSR. The method can reduce the number of inverter codes required for inverting the bits in PRPG patterns that conflict with ATPG patterns. The experimental results for some benchmark circuits are shown to present the feasibility of our test method.

In the recent high-density and low-power VLSIs, the occurrence of soft errors has become a significant problem. Recently, soft errors frequently occur on not only memory system but also logic circuits. Based on this standpoint, some constructions of soft-error-tolerant FFs were proposed. A conventional FF consists of some master and slave latches and C-elements. In the FF, soft error pulses occurring on combinational parts of logic circuits are corrected as long as the width of the pulses is narrow, that is within a specified width. However, error pulses with wide width are neither detected nor corrected in the FF. This paper presents a construction of soft-error-tolerant FFs by modifying the conventional soft-error-tolerant FF. The proposed FFs have the capability to detect error pulses having wide width as well as the capability to correct those having narrow width. The proposed FFs are also capable of detecting hard errors. The evaluation shows the soft-error-tolerant capability, AC characteristics, area overhead and power consumption of the FFs.

A high-speed and ultra-low-voltage divide-by-4/5 counter with dynamic floating input D flip-flop (DFIDFF) is presented in this paper. The proposed DFIDFF and control logic gates are merged to reduce effective capacitance of internal and external nodes, and increase the operating speed of divide-by-4/5 counter. The proposed divide-by-4/5 counter is fabricated in a 0.13-µm CMOS process. The measured maximum operating frequency and power consumption of the counter are 600 MHz and 8.35 µW at a 0.5 V supply voltage. HSPICE simulations demonstrate that the proposed counter (divide-by-4) reduces power-delay product (PDP) by 37%, 71%, and 57% from those of the TGFF counter, Yang's counter [1], and the E-TSPC counter [2], respectively.

Two novel low complexity dual-mode pulse generator designs suitable for FFs with triggering mode control are presented. The proposed designs successfully integrate XOR/OR (AND/XNOR) functions into a unified pass transistor logic (PTL) module to provide control on single- or double-edge operations. The designs use as few as 8 transistors each and ingeniously avoid the signal degradation problem inherent in most PTL circuits. As the only dual-mode designs so far, the proposed designs also outperform rival single-mode designs in both aspects of circuit complexity and power consumption.

Single flux quantum (SFQ) circuit elements have been designed and fabricated using the YBa2Cu3O7-δ ramp-edge junction technology. Logic operations of SFQ circuit elements, such as a toggle flip-flop (T-FF), a set-reset flip-flop (RS-FF), and a 96-junction Josephson transmission line (JTL), were successfully demonstrated, and dc supply current margins were confirmed up to temperatures higher than 30 K. The circuit layout was improved in order to suppress the critical current (Ic) spread that appears during the junction fabrication procedure. By employing the new circuit layout rule, correct operations at temperatures from 27 K to 34 K with dc supply current margins wider than 7% were confirmed for the T-FF with a single output. Moreover, the maximum operating frequencies of T-FFs were measured to be 360 GHz at 4.2 K and 210 GHz at 41 K, which are substantially higher than the values for the circuits with the conventional layout. According to the simulation result, the maximum operating frequency at 40 K was expected to be approximately 50% of the characteristic frequency at a bit error rate (BER) less than 10-6.

This letter presents two high-performance level-converting flip-flops (LCFF) for multi-VDD systems, indirect precharging flip-flop (IPFF) and multi-supply complementary pass-transistor flip-flop (MCPFF). Employing a simple precharging scheme, IPFF provides high operating speed. MCPFF, on the other hand, provides low power operations by implementing the edge-triggering function with complementary pass transistors. Performance comparison indicates that IPFF operates at the highest speed and MCPFF consumes the lowest power among the seven LCFFs under evaluation.

This paper describes the Differential Pass Transistor Pulsed Latch (DPTPL) which enhances D-Q delay and reduce power consumption using NMOS pass transistors and feedback PMOS transistors. The proposed flip-flop uses the characteristic of stronger drivability of NMOS transistor than that of transmission gate if the sum of total transistor width is the same. Positive feedback PMOS transistors enhance the speed of the latch as well as guarantee the full-swing of internal nodes. Also, the power consumption of proposed pulsed latch is reduced significantly due to the reduced clock load and smaller total transistor width compared to conventional differential flip-flops. DPTPL reduces ED by 45.5% over ep-SFF. The simulations were performed in a 0.1 µm CMOS technology at 1.2 V supply voltage with 1.25 GHz clock frequency.

A low-power SuperHTM embedded processor core, the SH-X2, has been designed in 90-nm CMOS technology. The power consumption was reduced by using hierarchical fine-grained clock gating to reduce the power consumption of the flip-flops and the clock-tree, synthesis and a layout that supports the implementation of the clock gating, and several-level power evaluations for RTL refinement. With this clock gating and RTL refinement, the power consumption of the clock-tree and flip-flops was reduced by 35% and 59%, including the process shrinking effects, respectively. As a result, the SH-X2 achieved 6,000 MIPS/W using a Renesas low-power process with a lowered voltage. Its performance-power efficiency was 25% better than that of a 130-nm-process SH-X.

About 20-45% of the total power in any VLSI circuit is consumed by the clocking system and 90% of this power consumption is spent by flip-flops. Wider datapaths, deeper pipelines, and increasing number of registers in modern processors have underscored the importance of the flip-flops. As a result, the flip-flops' performance metrics such as, power, delay, and power delay product will become a crucial factor in overall performance of processors. As technology is moving into deep submicron level, noise immunity and noise generated by any component in a digital device is also becoming a vital factor in circuit design. This paper studies various flip-flop designs for their noise immunity and noise generation metrics. It categorizes the flip-flops and reports extensive simulation results for best representative examples including the newly proposed one from the group (a patent is filed for this flip-flop). It compares power, delay, power delay product, number of transistors, number of clocked transistors, noise immunity, and noise generation for flip-flops that are reported as ones with the best performances in the literature.

This paper proposes two high-performance multi-threshold-voltage CMOS (MTCMOS) F/Fs that are based on the CMOS hybrid-latch F/F and the CMOS semi-dynamic F/F. The proposed F/Fs utilize a clock-gating technique or a data recovery circuit in order to preserve their logic states in the power-down mode. They can change operation modes whether the clock level is high or low, and they provide outputs to fanouts in the power-down mode. When compared with existing clock-free MTCMOS F/Fs, the proposed MTCMOS hybrid-latch F/F shows maximum reduction of average delay, average power, and average power-delay product by 33%, 46%, and 63% for the supply voltage ranging from 0.8 V to 1.2 V. Although outperformed by the MTCMOS hybrid-latch F/F, the proposed MTCMOS semi-dynamic F/F inherits the benefit of the embedded logic from the CMOS SD F/F. Experimental results indicate that the MTCMOS semi-dynamic F/F can be used to implement a logic circuit that is superior to the one designed using the MTCMOS hybrid-latch F/F in speed, power, and area.

This letter describes consecutive zero and one bits detection circuits designed for a 1.25 Gbit/s burst mode laser driver realized in a SiGe 0.35 µm BiCMOS technology with 3.3 V power supply. The architecture is based on a frequency divider and a delay line counting per four consecutive zero or one bits. The detector was designed with high-speed split-output stage flip-flops modified to have a reset input. Experimental results validate the design of the detector.

A new low power edge-triggered and logic embedded flip-flop based on complementary pass transistor circuit is proposed. This flip-flop provides small clock load, short propagation delay, single-phase clock scheme and small layout area. The flip-flop can reduce 35.2% power consumption while improving 24.7% propagation delay in comparison to conventional transmission-gate master-slave flip-flop in a standard 0.35 µm CMOS technology at 1.5 V power supply. In addition, logic functions can be embedded in the flip-flop. In 2-inputs multiplexer and flip-flop circuit, the proposed circuit can reduce 28.0% power consumption and improve 20.3% propagation delay compared to conventional circuit.