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[Keyword] Ti(30728hit)

30001-30020hit(30728hit)

  • Effect of Noise-Only-Paths on the Performance Improvement of Post-Demodulation Selection Diversity in DS/SS Mobile Radio

    Akihiro HIGASHI  Tadashi MATSUMOTO  Mohsen KAVEHRAD  

     
    PAPER-Radio Communication

      Vol:
    E76-B No:4
      Page(s):
    438-443

    The path diversity improvement inherent in direct sequence spread spectrum (DS/SS) signalling under multi-path propagation environments is investigated for mobile/personal radio communications systems that employ DPSK modulation. The bit error rate (BER) performance of post-demodulation selection diversity reception is theoretically analyzed in the presence of noise-only-paths in the time window for diversity combining. Results of laboratory experiments conducted to evaluate the BER performance are also presented. It is shown that the experimental results agree well with the theoretical BER.

  • Copper Adsorption Behavior on Silicon Substrates

    Yoshimi SHIRAMIZU  Makoto MORITA  Akihiko ISHITANI  

     
    PAPER-Process Technology

      Vol:
    E76-C No:4
      Page(s):
    635-640

    Copper contamination behavior is studied, depending on the pH level, conductivity type P or N of a silicon substrate, and contamination method of copper. If the pH level of a copper containing solution is adjusted by using ammonia, copper atoms and ammonia molecules produce copper ion complexes. Accordingly, the amount of copper adsorption on the substrate surface is decreased. When N-type silicon substrates are contaminated by means of copper containing solutions, copper atoms on the surfaces diffuse into bulk crystal even at room temperature. But for P-type silicon substrates, copper atoms are transferred into bulk crystal only after high temperature annealing. In the case of silicon substrates contaminated by contact with metallic copper, no copper atom diffusion into bulk crystal was observed. The above mentioned copper contamination behavior can be explained by the charge transfer interaction of copper atoms with silicon substrates.

  • Low-Temperature Reactive Ion Etching for Multi-Layer Resist

    Tetsuo SATO  Tomoaki ISHIDA  Masahiro YONEDA  Kazuo NAKAMOTO  

     
    PAPER-Process Technology

      Vol:
    E76-C No:4
      Page(s):
    607-612

    The effects of low temperature etching for sub-half micron multi-layer resist are investigated. The low temperature etching with pure O2 gas provides higher anisotropic profiles than with an additional gas such as Cl2, N2. This is caused by the difference in the formative process of the side wall protection. With pure O2 gas at 80, highly anisotropic profiles for 0.35 µm patterns can be performed while the maximum tolerable width loss is below 0.03 µm.

  • Characterizing Film Quality and Electromigration Resistance of Giant-Grain Copper Interconnects

    Takahisa NITTA  Tadahiro OHMI  Tsukasa HOSHI  Toshiyuki TAKEWAKI  Tadashi SHIBATA  

     
    PAPER-Process Technology

      Vol:
    E76-C No:4
      Page(s):
    626-634

    The performance of copper interconnects formed by the low-kinetic-energy ion bombardment process has been investigated. The copper films formed on SiO2 by this technology under a sufficient amount of ion energy deposition exhibit perfect orientation conversion from Cu (111) to Cu (100) upon post-metallization thermal annealing. We have discovered such crystal orientation conversion is always accompanied by a giant-grain growth as large as 100 µm. The copper film resistivity decreases due to the decrease in the grain boundary scattering, when the giant-grain growth occurs in the film. The resistivity of giant-grain copper film at a room temperature is 1.76 µΩcm which is almost equal to the bulk resistivity of copper. Furthermore, a new-accelerated electromigration life-test method has been developed to evaluate copper interconnects having large electromigration resistance within a very short period of test time. The essence of the new method is the acceleration by a large-current-stress of more than 107 A/cm2 and to utilize the self heating of test interconnect for giving temperature stress. In order to avoid uncontrollable thermal runaway and resultant interconnect melting, we adopted a very efficient cooling system that immediately removes Joule heat and keeps the interconnect temperature constant. As a result, copper interconnects formed by the low-kinetic-energy ion bombardment process exhibit three orders of magnitude longer lifetime at 300 K than Al alloy interconnects.

  • TiN as a Phosphorus Outdiffusion Barrier Layer for WSix/Doped-Polysilicon Structures

    John M. DRYNAN  Hiromitsu HADA  Takemitsu KUNIO  

     
    PAPER-Process Technology

      Vol:
    E76-C No:4
      Page(s):
    613-625

    Phosphorus-doped amorphous or polycrystalline silicon can yield a conformal, low resistance, thermallystable plug for the high-aspect-ratio, sub-half-micron contactholes found in current development prototypes of future 64 and 256 Mega-bit DRAMs. When directly contacted to a silicide layer, however, such as WSix found in polycide gate or bit line metallization/contact structures, the outdiffusion of phosphorus from the doped-silicon layer into the silicide can occur, resulting in an increase in resistance. The characteristics of both the doped-silicon and WSix layers influence the outdiffusion. The grain size of the doped silicon appears to control diffusion at the WSix/doped-silicon interface while the transition of WSix from an as-deposited amorphous to a post-annealed polycrystalline state appears to help cause uniform phosphorus diffusion throughout the silicide film. The results of phosphorus pre-doping of the silicide to reduce the effects of outdiffusion are dependent upon the relative material volumes and interfacial areas of the layers. Due to the effectiveness of the TiN barrier layer/Ti contact layer structure used in Al-based contacts, Ti and TiN were evaluated on their ability to prevent phosphorus outdiffusion. Ti reacts easily with doped silicon and to some extent with WSix, thereby allowing phosphorus to outdiffuse through the TiSix into the overlying WSix. TiN, however, is very effective in preventing phosphorus outdiffusion and preserving polycide interface smoothness. A WSix/TiN/Ti metallization layer on an in situ-doped (ISD) silicon layer with ISD silicon-plugged contactholes yields contact resistances comparable to P+-implanted or non-implanted WSix layers on similar ISD layers/plugs for contact sizes greater than approximately 0.5 µm but for contacts of 0.4 µm or below the trend in contact resistance is lowest for the polycide with TiN barrier/Ti contact interlayers. A 20 nm-thick TiN film retains its barrier characteristics even after a 4-hour 850 anneal and is applicable to the silicide-on-doped-silicon structures of future DRAM and other ULSI devices.

  • A Comparative Study of High-Field Endurance for NH3-Nitrided and N2O-Oxynitrided Ultrathin SiO2 Films

    Hisashi FUKUDA  

     
    PAPER-Device Technology

      Vol:
    E76-C No:4
      Page(s):
    511-518

    Two kinds of nitrided ultrathin (510 nm) SiO2 films were formed on the silicon (100) face using rapid thermal NH3-nitridation (RTN) and rapid thermal N2O-oxynitridation (RTON) technologies. The MOS capacitors with RTN SiO2 film showed that by Fowler-Nordheim (F-N) electron injection, both electron trap density and low-field leakage increase by the NH3-nitridation. In addition, the charge-to-breakdown (QBD) value decreases owing to NH3-nitridation. By contrast, RTON SiO2 films exhibited extremely low electron trap density, almost no increase of the leakage current, and large QBD value above 200C/cm2. The oxide film composition was evaluated by secondary ion mass spectroscopy (SIMS). The chemical bonding states were also examined by Fourier transform-infrared reflection attenuated total reflectance (FT-IR ATR) and X-ray photoelectron spectroscopy (XPS) measurements. These results indicate that although a large number of nitrogen (N) atoms are incorporated by the RTN and RTON, only the RTN process generates the hydrogen-related species such as NH and SiH bounds in the film, whereas the RTON film indicates only SiN bonds in bulk SiO2. From the dielectric and physical properties of the oxide films, it is considered that the oxide wearout by high-field stress is the result of the electron trapping process, in which anomalous leakage due to trap-assisted tunneling near the injected interface rapidly increases, leading to irreversible oxide failure.

  • Self-Aligned Aluminum-Gate MOSFET's Having Ultra-Shallow Junctions Formed by 450 Furnace Annealing

    Koji KOTANI  Tadahiro OHMI  Satoshi SHIMONISHI  Tomohiro MIGITA  Hideki KOMORI  Tadashi SHIBATA  

     
    PAPER-Device Technology

      Vol:
    E76-C No:4
      Page(s):
    541-547

    Self-aligned aluminum-gate MOSFET's have been successfully fabricated by employing ultraclean ion implantation technology. The use of ultra high vacuum ion implanter and the suppression of high-energy ion-beam-induced metal sputter contamination have enabled us to form ultra-shallow low-leakage pn junctions by furnace annealing at a temperature as low as 450. The fabricated aluminum-gate MOSFET's have exhibited good electrical characteristics, thus demonstrating a large potential for application to realizing ultra-high-speed integrated circuits.

  • A Novel CMOS Structure with Polysilicon Source/Drain (PSD) Transistors by Self-Aligned Silicidation

    Masahiro SHIMIZU  Takehisa YAMAGUCHI  Masahide INUISHI  Katsuhiro TSUKAMOTO  

     
    PAPER-Device Technology

      Vol:
    E76-C No:4
      Page(s):
    532-540

    A novel CMOS structure has been developed using Ti-salicide PSD transistor formed by a new self-aligned method. Both N-channel and P-channel PSD transistors exhibit excellent short-channel behaviors down to the sub-half-micrometer region with shallow S/D junctions formed by dopant diffusion from polysilicons. New salicide process has been developed for the PSD structure and can effectively reduce the sheet resistances of the S/D polysilicon and the polysilicon gate to as low as 45Ω/. As a result, the low resistive local interconnects can be successfully implemented by the Ti-salicide S/D polysilicon merged with contacts by self-alignment. More-over it is found that shallow Ti-salicide S/D junctions with the PSD structure can achieve approximately 12 orders of magnitude lower area leakage current than that of the conventional implanted S/D junctions by eliminating implanted damage and preventing penetration of silicide into junctions with the elevated structure of S/D polysilicon layer. Furthermore CMOS ring oscillators having PSD transistors with an effective channel length of 0.4 µm were fabricated using the salicided S/D polysilicon as a local interconnect between the N+ and the P+ regions, and successfully operated with a propagation delay time of 50 ps/stage at a supply voltage of 5 V.

  • Resonant Mode of Surface Wave in Goubau Line

    Ken-ichi SAKINA  Jiro CHIBA  

     
    LETTER-Electromagnetic Theory

      Vol:
    E76-C No:4
      Page(s):
    657-660

    It is shown from a computer analysis that there exists a resonant mode of a surface wave which propagates along Goubau line, and that the attenuation of such a mode is very low. The approximate formula for obtaining the resonant frequency is also given.

  • Guidance of a Mobile Robot with Environmental Map Using Omnidirectional Image Sensor COPIS

    Yasushi YAGI  Yoshimitsu NISHIZAWA  Masahiko YACHIDA  

     
    PAPER

      Vol:
    E76-D No:4
      Page(s):
    486-493

    We have proposed a new omnidirectional image sensor COPIS (COnic Projection Image Sensor) for guiding navigation of a mobile robot. Its feature is passive sensing of the omnidirectional image of the environment in real-time (at the frame rate of a TV camera) using a conic mirror. COPIS is a suitable sensor for visual navigation in real world environment with moving objects. This paper describes a method for estimating the location and the motion of the robot by detecting the azimuth of each object in the omnidirectional image. In this method, the azimuth is matched with the given environmental map. The robot can always estimate its own location and motion precisely because COPIS observes a 360 degree view around the robot even if all edges are not extracted correctly from the omnidirectional image. We also present a method to avoid collision against unknown obstacles and estimate their locations by detecting their azimuth changes while the robot is moving in the environment. Using the COPIS system, we performed several experiments in the real world.

  • A Linear Phase Two-Channel Filter Bank Allowing Perfect Reconstruction

    Hitoshi KIYA  Mitsuo YAE  Masahiro IWAHASHI  

     
    PAPER-Linear and Nonlinear Digital Filters

      Vol:
    E76-A No:4
      Page(s):
    620-625

    We propose a design method for a two-channel perfect reconstruction FIR filter banks employing linear-phase filters. This type of filter bank is especially important in splitting image signals into frequency bands for subband image cording. Because in such an application, it is necessary to use the combination of linear-phase filters and symmetric image signal, namely linear phase signal to avoid the increase in image size caused by filtering. In this paper, first we summarize the design conditions for two-channel filter banks. Next, we show that the design problem is reduced to a very simple linear equation, by using a half-band filter as a lowpass filter. Also the proposed method is available to lead filters with fewer complexity, which enable us to use simple arithmetic operations. For subband coding, the property is important because it reduces hardware complexity.

  • High-Speed SOI Bipolar Transistors Using Bonding and Thinning Techniques

    Manabu KOJIMA  Atsushi FUKURODA  Tetsu FUKANO  Naoshi HIGAKI  Tatsuya YAMAZAKI  Toshihiro SUGII  Yoshihiro ARIMOTO  Takashi ITO  

     
    PAPER-Device Technology

      Vol:
    E76-C No:4
      Page(s):
    572-576

    We propose a high-speed SOI bipolar transistor fabricated using bonding and thinning techniques. It is important to replace SOI area except for devices with thick SiO2 to reduce parasitic capacitance. A thin SOI film with a thin buried layer helps meet this requirement. We formed a 1-µm-thick SOI film with a 0.7-µm-thick buried layer by ion implantation before wafer bonding pulse-field-assisted bonding and selective polishing. Devices were completely isolated by thick SiO2 using a thin SOI film and the LOCOS process. We fabricated epitaxial base transistors (EBTs) on bonded SOI. Our transistors had a cutoff frequency of 32 GHz.

  • Redundancy Technique for Ultra-High-Speed Static RAMs

    Hiroaki NAMBU  Kazuo KANETANI  Youji IDEI  Kunihiko YAMAGUCHI  Toshirou HIRAMOTO  Nobuo TAMBA  Kunihiko WATANABE  Masanori ODAKA  Takahide IKEDA  Kenichi OHHATA  Yoshiaki SAKURAI  Noriyuki HOMMA  

     
    PAPER-Integrated Electronics

      Vol:
    E76-C No:4
      Page(s):
    641-648

    A new redundancy technique especially suitable for ultra-high-speed static RAMs (SRAMs) has been developed. This technique is based on a decoding-method that uses two kinds of fuses without introducing any additional delay time. One fuse is initially ON and can be turned OFF afterwards, if necessary, by a cutting process using a focused ion beam (FIB). The other is initially OFF and can be turned ON afterwards by a connecting process using laser chemical vapor deposition (L-CVD). This technique is applied to a 64 kbit SRAM having a 1.5-ns access time. The experimental results obtained through an SRAM chip repaired using this redundancy technique show that this technique does not introduce any increase in the access time and does not reduce the operational margin of the SRAM.

  • Reconstruction of Polyhedra by a Mechanical Theorem Proving Method

    Kyun KOH  Koichiro DEGUCHI  Iwao MORISHITA  

     
    PAPER

      Vol:
    E76-D No:4
      Page(s):
    437-445

    In this paper we propose a new application of Wu's mechanical theorem proving method to reconstruct polyhedra in 3-D space from their projection image. First we set up three groups of equations. The first group is of the geometric relations expressing that vertices are on a plane segment, on a line segment, and forming angle in 3-D space. The second is of those relations on image plane. And the rest is of the relations between the vertices in 3-D space and their correspondence on image plane. Next, we classify all the groups of equations into two sets, a set of hypotheses and a conjecture. We apply this method to seven cases of models. Then, we apply Wu's method to prove that the hypotheses follow the conjecture and obtain pseudodivided remainders of the conjectures, which represent relations of angles or lengths between 3-D space and their projected image. By this method we obtained new geometrical relations for seven cases of models. We also show that, in the region in image plane where corresponding spatial measures cannot reconstructed, leading coefficients of hypotheses polynomials approach to zero. If the vertex of an image angle is in such regions, we cannot calculate its spatial angle by direct manipulation of the hypothesis polynomials and the conjecture polynomial. But we show that by stability analysis of the pseudodivided remainder the spatial angles can be calculated even in those regions.

  • Prospective Operation Technologies for Fiber-Optic Subscriber Loops

    Yutaka WAKUI  Norio KASHIMA  

     
    INVITED PAPER

      Vol:
    E76-B No:4
      Page(s):
    329-335

    The construction of an optical subscriber loop and its operation system will be one of the most important infrastructures for the information society of the future. This paper presents a discussion of current and future service trends, the evolution of fiber-optic systems in the loop, and subscriber loop operation systems. Several operation technologies are also discussed which will enable the operation systems described in this paper to be constructed. Of these, the key technologies are an operation system architecture with flexibility, software technologies based on object-oriented design and programming, and automatic operation modules.

  • Mechanical Optical Switch for Single Mode Fiber

    Masanobu SHIMIZU  Koji YOSHIDA  Toshihiko OHTA  

     
    PAPER

      Vol:
    E76-B No:4
      Page(s):
    370-374

    The 22 mechanical optical switch for single mode fiber (SMF) is reported. By using the precision grinding and molding techniques all-plastic multiple-fiber connector, 22 pin-referenced indirect slide switch is developed. The characteristics and the reliability test's results of this optical switch are also reported. Evaluations confirm that the switch has low insertion loss, high-speed switching, stable switching operations and reliability in practical applications.

  • Minimizing the Edge Effect in a DRAM Cell Capacitor by Using a Structure with High-Permittivity Thin Film

    Takeo YAMASHITA  Tadahiro OHMI  

     
    PAPER-Device Technology

      Vol:
    E76-C No:4
      Page(s):
    556-561

    The concentration of the electric field at the edge of the electrode has been simulated in several types of flat DRAM cell capacitors with high permittivity dielectrics. The results indicated that the permittivity of the material surrounding the edge of the electrode as well as the geometrical structure affected the concentration of the electric field. The electric field strength was minimized and most evenly distributed by utilizing the structure in which the sidewall of the capacitor dielectric was terminated at the edge of the electrode by a low-dielectric constant insulator. High-precision fabrication of the capacitor's profile is required for the minimization and uniformity of the electric field.

  • A Text-Independent Off-Line Writer Identification Method for Japanese and Korean Sentences

    Mitsu YOSHIMURA  Isao YOSHIMURA  Hyun Bin KIM  

     
    PAPER

      Vol:
    E76-D No:4
      Page(s):
    454-461

    This paper proposes an off-line text-independent writer identification method applicable to Japanese and Korean sentences. It is assumed that the writer of a writing in question exists in a certain group of people and that reference writings written by each person in the group can be used for identification. In the proposed method, relative frequencies of some model patterns are counted on the binary pattern of each writing and are used as the feature to measure the distance between two writings. Based on a modified Mahalanobis' distance for this feature, the person whose reference writing is nearest to the writing in question is judged as the writer. The effectiveness of the proposed method is examined through an experiment using Japanese and Korean writings. Error rates in the experiment were different depending on conditions such as volume of reference writings, dimension of adopted features, and number of people to be identified. In some cases, error rates as low as 0% were observed. Error rates tend to be lower in Korean writings probably because Hangul is composed of a smaller number of letters compared to Kanji and Hiragana in Japanese writing.

  • Error-Correction Learning of Three Layer Neural Networks Based on Linear-Homogeneous Expressions

    Ryuzo TAKIYAMA  Kimitoshi FUKUDOME  

     
    PAPER-Neural Networks

      Vol:
    E76-A No:4
      Page(s):
    637-641

    The three layer neural network (TLNN) is treated, where the nonlinearity of a neuron is of signum. First we propose an expression of the discriminant function of the TLNN, which is called a linear-homogeneous expression. This expression allows the differentiation in spite of the signum property of the neuron. Subsequently a learning algorithm is proposed based on the linear-homogeneous form. The algorithm is an error-correction procedure, which gives a mathematical foundation to heuristic error-correction learnings described in various literatures.

  • Space Partitioning Image Processing Technique for Parallel Recursive Half Toning

    Yoshinori TAKEUCHI  Hiroaki KUNIEDA  

     
    PAPER-Digital Signal Processing

      Vol:
    E76-A No:4
      Page(s):
    603-612

    This paper studies a method for a parallel implementation of digital half toning technique, which converts continuous tone images into monotone one without losing fidelity of images. A new modified algorithm for half toning is proposed, which is able to be implemented on a rectangular or one dimensional parallel multi-processor array as a part of extensions of space partitioning image processings. The purpose of this paper is primarily to apply space partitioning local image processing technique to nonlinear recursive algorithms. The target is to achieve a fast half toning with high quality. For that propose, local directional error diffusion techniques will be introduced, which enable original recursive error diffusion half toning to be converted into a local processing algorithm without losing its original advantages of producing high quality images. The characteristics of proposed methods will be analyzed and the advantages of our algorithm of high speed processing and high quality will be demonstrated by showing the results of simulations for typical examples.

30001-30020hit(30728hit)