Applications of continuous-time (CT) comparator include relaxation oscillators, pulse width modulators, and so on. CT comparator receives a differential input and outputs a strobe ideally when the differential input crosses zero. Unlike the DT comparators with positive feedback circuit, amplifiers consuming static power must be employed in CT comparators to amplify the input signal. Therefore, minimization of comparator delay under the constraint of power consumption often becomes an issue. This paper analyzes transient behavior of a CT comparator. Using “constant delay approximation”, the comparator delay is derived as a function of input slew rate, number of stages of the preamplifier, and device parameters in each block. This paper also discusses optimum design of the CT comparator. The condition for minimum comparator delay is derived with keeping power consumption constant. The results include that the optimum DC gain of the preamplifier is e∼e3 per stage depending on the element which dominates load capacitance of the preamplifier.

This paper presents a self-calibrating dynamic latched comparator with a stochastic offset voltage detector that can be realized by using simple digital circuitry. An offset voltage of the comparator is compensated by using a statistical calibration scheme, and the offset voltage detector uses the uncertainty in the comparator output. Thanks to the simple offset detection technique, all the calibration circuitry can be synthesized using only standard logic cells. This paper also gives a design methodology that can provide the optimal design parameters for the detector on the basis of fundamental statistics, and the correctness of the design methodology was statistically validated through measurement. The proposed self-calibrating comparator system was fabricated in a 180 nm 1P6M CMOS process. The prototype achieved a 38 times improvement in the three-sigma of the offset voltage from 6.01 mV to 158 µV.

An optimal design method for a sub-ranging Analog-to-Digital Converter (ADC) based on stochastic comparator is demonstrated by performing theoretical analysis of random comparator offset voltages. If the Cumulative Distribution Function (CDF) of the comparator offset is defined appropriately, we can calculate the PDFs of the output code and the effective resolution of a stochastic comparator. It is possible to model the analog-to-digital conversion accuracy (defined as yield) of a stochastic comparator by assuming that the correlations among the number of comparator offsets within different analog steps corresponding to the Least Significant Bit (LSB) of the output transfer function are negligible. Comparison with Monte Carlo simulation verifies that the proposed model precisely estimates the yield of the ADC when it is designed for a reasonable target yield of >0.8. By applying this model to a stochastic comparator we reveal that an additional calibration significantly enhances the resolution, i.e., it increases the Number of Bits (NOB) by ∼ 2 bits for the same target yield. Extending the model to a stochastic-comparator-based sub-ranging ADC indicates that the ADC design parameters can be tuned to find the optimal resource distribution between the deterministic coarse stage and the stochastic fine stage.

This paper presents the design and characterization of an E-band 16×16-slot monopulse array antenna with full-corporate-feed fabricated by the commercially available batch process of diffusion bonding of laminated copper plates. The antenna is multi-layered, and consists of vertically-interconnected radiating elements, a corporate-feed circuit and a comparator. It has four input ports for different excitations. Sum and difference beams in different cut-planes for monopulse operation can be generated. The antenna has a quasi-planar profile, and a total size of 13.31 λ0×13.31λ0×1.52λ0 (λ0 is the wavelength at the design frequency of 78.5GHz). The antenna demonstrates a wide operation bandwidth of 17.2 (70-87.2) GHz for VSWR < 2. At 78.5GHz: 1) for the sum beam, there is a 32.6-dBi realized gain (83% antenna efficiency) and a 33.3-dBi directivity (95% aperture efficiency); 2) for the difference beams in the E-, H-, 45°-, and 135°-planes, the null depths are -53.0, -58.0, -57.8, and -65.6dB, respectively. Across the full operation band where the sum main-beam and difference null are able to consistently point at the boresight, the antenna also demonstrates excellent performance in terms of high gain, high efficiency, high isolation, low cross-polarization, and distinguished monopulse capability.

This paper describes a logarithmic compression ADC using a subranging TDC and the transient response of a comparator. We utilized the settling time of the comparator for a logarithmic compression instead of a logarithmic amplifier. The settling time of the comparator is inversely proportional to the logarithm of an input voltage. In the proposed ADC, an input voltage is converted into a pulse whose width represents the settling time of the comparator. Subsequently, the TDC converts the pulse width into a binary code. The supply voltage of the proposed ADC can be reduced more than a conventional logarithmic ADC because an analog to digital conversion takes place in the time domain. We confirmed through a 0.18-µm CMOS circuit simulation that the proposed ADC achieves a resolution of 11 bits, a sampling rate of 20 MS/s, a dynamic range of 59 dB and a power consumption of 9.8 mW at 1.5 V operation.

A 10-bit 20-MS/s asynchronous SAR ADC with a meta-stability detector using replica comparators is proposed. The proposed SAR ADC with the area of 0.093mm2 is implemented using a 130-nm CMOS process with a 1.2-V supply. The measured peak ENOBs for the full rail-to-rail differential input signal is 9.6bits.

We propose a low-noise and low-power dynamic comparator with an offset calibration circuit for Low-Power ADCs. The proposed comparator equips the control circuit in order to switching the comparison accuracy and the current consumption. When high accuracy is not required, current consumption is reduced by allowing the noise increase. Compared with a traditional dynamic comparator, the proposed architecture reduced the current consumption to 78% at 100MHz operating and 1.8V supply voltage. Furthermore, the offset voltage is corrected with minimal current consumption by controlling the on/off operation of the offset calibration circuit.

This paper proposes an ultra-low power fully on-chip CMOS relaxation oscillator (ROSC) for a real-time clock application. The proposed ROSC employs a compensation circuit of a comparator's non-idealities caused by offset voltage and delay time. The ROSC can generate a stable, and 32-kHz oscillation clock frequency without increasing power dissipation by using a low reference voltage and employing a novel compensation architecture for comparators. Measurement results in a 0.18-$mu$m CMOS process demonstrated that the circuit can generate a stable clock frequency of 32.55,kHz with low power dissipation of 472,nW at 1.8-V power supply. Measured line regulation and temperature coefficient were 1.1%/V and 120,ppm/$^{circ}$C, respectively.

A fully on-chip CMOS relaxation oscillator (ROSC) with a PVT variation compensation circuit is proposed in this paper. The circuit is based on a conventional ROSC and has a distinctive feature in the compensation circuit that compensates for comparator's non-idealities caused by not only offset voltage, but also delay time. Measurement results demonstrated that the circuit can generate a stable clock frequency of 6.66kHz. The current dissipation was 320nA at 1.0-V power supply. The measured line regulation and temperature coefficient were 0.98%/V and 56ppm/°C, respectively.

We propose an asynchronous datapath for the low-density parity-check decoder to decrease power consumption. Glitches and redundant computations are decreased by the asynchronous design. Taking advantage of the statistical characteristics of the input data, we develop novel key arithmetic elements in the datapath to reduce redundant computations. Two other types of datapaths, including normal synchronous design and clock-gating design, are implemented for comparisons with the proposed design. The three designs use similar architectures and realize the same function by using the 0.18µm process of the Semiconductor Manufacturing International Corporation. Post-layout result shows that the proposed asynchronous design exhibits the lowest power consumption. The proposed asynchronous design saves 48.7% and 21.9% more power than the normal synchronous and clock-gating designs, respectively. The performance of the proposed datapath is slightly worse than the clock-gating design but is better than the synchronous design. The proposed design is approximately 7% larger than the other two designs.

An 8-bit 100-kS/s successive approximation (SA) analog-to-digital converter (ADC) is proposed for measuring EEG and MEG signals in an 88 point. The architectures of a SA ADC with a single-ended analog input and a split-capacitor-based digital-to-analog converter (SC-DAC) are used to reduce the power consumption and chip area of the entire ADC. The proposed SA ADC uses a time-domain comparator that has an input offset self-calibration circuit. It also includes a serial output interface to support a daisy channel that reduces the number of channels for the multi-point sensor interface. It is designed by using a 0.35-µm 1-poly 6-metal CMOS process with a 3.3 V supply to implement together with a conventional analog circuit such as a low-noise-amplifier. The measured DNL and INL of the SA ADC are +0.63/-0.46 and +0.46/-0.51 LSB, respectively. The SNDR is 48.39 dB for a 1.11 kHz analog input signal at a sampling rate of 100 kS/s. The power consumption and core area are 38.71 µW and 0.059 mm2, respectively.

This paper analyzes a pseudo-differential dynamic comparator with a dynamic pre-amplifier. The transient gain of a dynamic pre-amplifier is derived and applied to equations of the thermal noise and the regeneration time of a comparator. This analysis enhances understanding of the roles of transistor's parameters in pre-amplifier's gain. Based on the calculated gain, two calibration methods are also analyzed. One is calibration of a load capacitance and the other is calibration of a bypass current. The analysis helps designers' estimation for the accuracy of calibration, dead-zone of a comparator with a calibration circuit, and the influence of PVT variation. The analyzed comparator uses 90-nm CMOS technology as an example and each estimation is compared with simulation results.

We propose a capacitive averaging technique applied to a double-tail latched comparator without a preamplifier for an offset reduction technique. Capacitive averaging can be introduced by considering the first stage of the double-tail latched comparator as a capacitive loaded amplifier. This makes it possible to reduce the offset voltage while preventing an increase in power dissipation. A positive feedback technique is also used for the first stage, which maximizes the effectiveness of the capacitive averaging. The capacitive averaging mechanism and the relationship between the offset reduction and the linearity of the amplifier is discussed in detail. Simulation results for a 90-nm CMOS process show that the proposed technique can reduce the offset voltage by 1/3.5 (3 mV) at a power dissipation of only 45 µW.

A 200 kS/s 10-bit successive approximation (SA) analog-to-digital converter (ADC) with a rail-to-rail input signal is proposed for acquiring biosignals such as EEG and MEG signals. A split-capacitor-based digital-to-analog converter (SC-DAC) is used to reduce the power consumption and chip area. The SC-DAC's linearity is improved by using dummy capacitors and a small bootstrapped analog switch with a constant on-resistance, without increasing its area. A time-domain comparator with a replica circuit for clock feed-through noise compensation is designed by using a highly differential digital architecture involving a small area. Its area is about 50% less than that of a conventional time-domain comparator. The proposed SA ADC is implemented by using a 0.18-µm 1-poly 6-metal CMOS process with a 1 V supply. The measured DNL and INL are +0.44/-0.4 LSB and +0.71/-0.62 LSB, respectively. The SNDR is 55.43 dB for a 99.01 kHz analog input signal at a sampling rate of 200 kS/s. The power consumption and core area are 5 µW and 0.126 mm2, respectively. The FoM is 47 fJ/conversion-step.

Progress of roles and schemes of calibration techniques in data converters are reviewed. Correction techniques of matching error and nonlinearity in analog circuits have been developed by digital assist using high-density and low-power digital circuits. The roles of the calibration are not only to improve accuracy but also to reduce power dissipation and chip area. Among various calibration schemes, the background calibration has significant advantages to achieve robustness to fast ambient change. Firstly the nonlinearity calibrations for pipeline ADCs are reviewed. They have required new solutions for redundancy of the circuits, an error estimation algorithm and reference signals. Currently utilizing the calibration techniques, the performance of 100 Msps and 12 bit has been achieved with 10 mW power dissipation. Secondly the background calibrations of matching error in flash ADC and DAC with error feedback to the analog circuits are described. The flash ADC utilizes the comparator offset correction with successive approximation algorithm. The DAC adopts a self current matching scheme with an analog memory. Measured dissipation power of the ADC is 0.38 mW at 300 MHz clock. Effects of the background calibration to suppress crosstalk noise are also discussed.

A 0.6-V voltage shifter and a 0.6-V clocked comparator are presented for sampling correlation-based impulse radio UWB receiver. The voltage shifter is used for a novel split swing level scheme-based CMOS transmission gate which can reduce the power consumption by four times. Compared to the conventional voltage shifter, the proposed voltage shifter can reduce the required capacitance area by half and eliminate the non-overlapping complementary clock generator. The proposed 0.6-V clocked comparator can operate at 100-MHz clock with the voltage shifter. To reduce the power consumption of the conventional continuous-time comparator based synchronization control unit, a novel clocked-comparator based control unit is presented, thereby achieving the lowest energy consumption of 3.9 pJ/bit in the correlation-based UWB receiver with the 0.5 ns timing step for data synchronization.

This paper presents a high speed single-stage latched comparator which is scheduled in time for both amplification and latch operations. Small active area and simple switching strategy besides desired power consumption at high comparison rates qualifies the proposed comparator to be repeatedly employed in high speed flash A/D converters. A strategy of kickback noise elimination besides gain enhancement is also introduced. A low power holding read-out circuit is presented. Post-Layout simulation results confirm 500 MS/s comparison rate with 5 mv resolution for a 1.6 v peak-to-peak input signal range and 600 µw power consumption from a 3.3 v power supply by using TSMC model of 0.35 µm CMOS technology. Total active area of proposed comparator and read-out circuit is about 300 µm2.

The accuracy of the comparator, which is often determined by its offset, is essential for the resolution of the high performance mixed-signal system. Various design efforts have been made to cancel or calibrate the comparator offset due to many factors like process variations, device thermal noise and input-referred supply noise. However, effective and simple method for offset cancel by applying additional circuits without scarifying the power, speed and area is always challenging. This work explores a dynamic offset control technique that employs charge compensation by timing control. The charge injection and clock feed-through by the latch reset transistor are investigated. A simple method is proposed to generate offset compensation voltage by implementing two source-drain shorted transistors on each regenerative node with timing control signals on their gates. Further analysis for the principle of timing based charge compensation approach for comparator offset control is described. The analysis has been verified by fabricating a 65 nm CMOS 1.2 V 1 GHz comparator that occupies 25 65 µm2 and consumes 380 µW. Circuits for offset control occupies 21% of the areas and 12% of the power consumption of the whole comparator chip.

A low power impulse radio ultra-wideband (IR-UWB) receiver for DC-960 MHz band is proposed in this paper. The proposed receiver employs multiple DC power-free charge-domain sampling correlators to eliminate the need for phase synchronization. To alleviate BER degradation due to an increased charge injection in a subtraction operation in the sampling correlator than that of an addition operation, a comparator with variable threshold (=offset) voltage is used, which enables an addition-only operation. The developed receiver fabricated in 1.2 V 65 nm CMOS achieves the lowest energy consumption of 17.6 pJ/bit at 100 Mbps in state-of-the-art correlation-based UWB receivers.

A physical random number generator, which generates truly random number trains by using the randomness of physical phenomena, is widely used in the field of cryptographic applications. We have developed an ultra high-speed superconductive physical random number generator that can generate random numbers at a frequency of more than 10 GHz by utilizing the high-speed operation and high-sensitivity of superconductive integrated circuits. In this study, we have statistically evaluated the quality of the random number trains generated by the superconductive physical random number generator. The performances of the statistical tests were based on a test method provided by National Institute of Standards and Technology (NIST). These statistical tests comprised several fundamental tests that were performed to evaluate the random number trains for their utilization in practical cryptographic applications. We have generated 230 random number trains consisting of 20,000-bits by using the superconductive physical random number generator fabricated by the SRL 2.5 kA/cm2 Nb standard process. The generated random number trains passed all the fundamental statistical tests. This result indicates that the superconductive random number generator can be sufficiently utilized in practical applications.