We experimentally evaluated random number sequences generated by a superconducting hardware random number generator composed of a Josephson-junction oscillator, a rapid-single-flux-quantum (RSFQ) toggle flip-flop (TFF), and an RSFQ AND gate. Test circuits were fabricated using a 10 kA/cm2 Nb/AlOx/Nb integration process. Measurements were conducted in a liquid helium bath. The random numbers were generated for a trigger frequency of 500 kHz under the oscillating Josephson-junction at 29 GHz. 26 random number sequences of 20 kb length were evaluated for bias voltages between 2.0 and 2.7 mV. The NIST FIPS PUBS 140-2 tests were used for the evaluation. 100% pass rates were confirmed at the bias voltages of 2.5 and 2.6 mV. We found that the Monobit test limited the pass rates. As numerical simulations suggested, a detailed evaluation for the probability of obtaining “1” demonstrated the monotonical dependence on the bias voltage.

Extremely energy-efficient logic devices are required for future low-power high-performance computing systems. Superconductor electronic technology has a number of energy-efficient logic families. Among them is the adiabatic quantum-flux-parametron (AQFP) logic family, which adiabatically switches the quantum-flux-parametron (QFP) circuit when it is excited by an AC power-clock. When compared to state-of-the-art CMOS technology, AQFP logic circuits have the advantage of relatively fast clock rates (5 GHz to 10 GHz) and 5 - 6 orders of magnitude reduction in energy before cooling overhead. We have been developing extremely energy-efficient computing processor components using the AQFP. The adder is the most basic computational unit and is important in the development of a processor. In this work, we designed and measured a 16-bit parallel prefix carry look-ahead Kogge-Stone adder (KSA). We fabricated the circuit using the AIST 10 kA/cm2 High-speed STandard Process (HSTP). Due to a malfunction in the measurement system, we were not able to confirm the complete operation of the circuit at the low frequency of 100 kHz in liquid He, but we confirmed that the outputs that we did observe are correct for two types of tests: (1) critical tests and (2) 110 random input tests in total. The operation margin of the circuit is wide, and we did not observe any calculation errors during measurement.

Optical logic circuits based on integrated nanophotonics attract significant interest due to their ultra-high-speed operation. However, the power dissipation of conventional optical logic circuits is exponential to the number of inputs of target logic functions. This paper proposes a synthesis method reducing power dissipation to a polynomial order of the number of inputs while exploiting the high-speed nature. Our method divides the target logic function into multiple sub-functions with Optical-to-Electrical (OE) converters. Each sub-function has a smaller number of inputs than that of the original function, which enables to exponentially reduce the power dissipated by an optical logic circuit representing the sub-function. The proposed synthesis method can mitigate the OE converter delay overhead by parallelizing sub-functions. We apply the proposed synthesis method to the ISCAS'85 benchmark circuits. The power consumption of the conventional circuits based on the Binary Decision Diagram (BDD) is at least three orders of magnitude larger than that of the optical logic circuits synthesized by the proposed method. The proposed method reduces the power consumption to about 100mW. The delay of almost all the circuits synthesized by the proposed method is kept less than four times the delay of the conventional BDD-based circuit.

Optical circuits using nanophotonic devices attract significant interest due to its ultra-high speed operation. As a consequence, the synthesis methods for the optical circuits also attract increasing attention. However, existing methods for synthesizing optical circuits mostly rely on straight-forward mappings from established data structures such as Binary Decision Diagram (BDD). The strategy of simply mapping a BDD to an optical circuit sometimes results in an explosion of size and involves significant power losses in branches and optical devices. To address these issues, this paper proposes a method for reducing the size of BDD-based optical logic circuits exploiting wavelength division multiplexing (WDM). The paper also proposes a method for reducing the number of branches in a BDD-based circuit, which reduces the power dissipation in laser sources. Experimental results obtained using a partial product accumulation circuit used in a 4-bit parallel multiplier demonstrates significant advantages of our method over existing approaches in terms of area and power consumption.

It is important to reduce the power consumption of complementary metal oxide semiconductor (CMOS) logic circuits, especially those used in mobile devices. A CMOS logic circuit consists of metal-oxide-semiconductor field-effect transistors (MOSFETs), which consume electrical power dynamically when they charge and discharge load capacitance that is connected to their output. Load capacitance mainly exists in wiring or buses, and transitions between logic 0 and logic 1 cause these charges and discharges. Many methods have been proposed to reduce these transitions. One novel method (called segmentation coding) has recently been proposed that reduces power consumption of CMOS buses carrying band-limited signals, such as audio data. It improves performance by employing dedicated encoders for the upper and lower bits of transmitted data, in which the transition characteristics of band-limited signals are utilized. However, it uses a conventional majority voting circuit in the encoder for lower bits, and the circuit uses many adders to count the number of 1s to calculate the Hamming distance between the transmitted data. This paper proposes segmentation coding with pseudo-majority voting. The proposed pseudo-majority voting circuit counts the number of 1s with fewer circuit resources than the conventional circuit by further utilizing the transition characteristics of band-limited signals. The effectiveness of the proposed method was demonstrated through computer simulations and experiments.

We present a new lower bound on the number of gates in reversible logic circuits that represent a given reversible logic function, in which the circuits are assumed to consist of general Toffoli gates and have no redundant input/output lines. We make a theoretical comparison of lower bounds, and prove that the proposed bound is better than the previous one. Moreover, experimental results for lower bounds on randomly-generated reversible logic functions and reversible benchmarks are given. The results also demonstrate that the proposed lower bound is better than the former one.

Hassoune and O'Connor proposed a dynamically reconfigurable dynamic logic circuit (DRDLC) that generates Boolean functions by using double-gate (DG) carbon nanotube (CNT) FETs, which have an ambipolar property. O'Connor et al. proposed a DRDLC that generates 14 Boolean functions asing two Boolean inputs with seven transistors. Furthermore, DRDLCs that generates all 16 Boolean functions have been proposed. In this paper, we focus on the design of a dynamic logic circuit with n Boolean inputs. First, we show a DRDLC that generates the monomial Boolean functions. Next, we propose a DRDLC that generates the whole set of Boolean functions consisting of t terms or less. Finally, we report the number of Boolean functions generated by the proposed DRDLC.

This letter describes a design methodology for an arithmetic logic unit (ALU) incorporating reconfigurability based on double-gate carbon nanotube field-effect transistors (DG-CNTFETs). The design of a DG-CNTFET with an ambipolar-property-based reconfigurable static logic circuit is simple and straightforward using an ambipolar binary decision diagram (Am-BDD), which represents the cornerstone for the automatic pass transistor logic (PTL) synthesis flows of ambipolar devices. In this work, an ALU with 16 functions is synthesized by the design methodology of a DG-CNTFET-based reconfigurable static logic circuit. Furthermore, it is shown that the proposed ALU is much more flexible and practical than a conventional DG-CNTFET-based reconfigurable ALU.

In this paper, the measurement of capacitance variation, of an on-chip power distribution network (PDN) due to the change of internal states of a CMOS logic circuit, is studied. A state-dependent PDN-capacitance model that explains measurement results will be also proposed. The model is composed of capacitance elements related to MOS transistors, signal and power supply wires, and substrate. Reflecting the changes of electrode potentials, the capacitance elements become state-dependent. The capacitive elements are then all connected in parallel between power supply and ground to form the proposed model. By using the proposed model, state-dependence of PDN-capacitances for different logic circuits are studied in detail. The change of PDN-capacitance exceeds 12% of its total capacitance in some cases, which corresponds to 6% shift of anti-resonance frequency. Consideration of the state-dependence is important for modeling the PDN-capacitance.

I. O'Connor et al. have proposed a dynamically reconfigurable dynamic logic circuit (DRDLC) to generate some logic functions by using the double-gate (DG) carbon nanotube (CNT) FETs which have the ambipolar property [1]. This DRDLC consists of seven transistors to generate 14 logic functions which do not include the XOR and XNOR functions. On the other hand, K. Jabeur et al. have proposed a DRDLC to generate the whole set of 16 logic functions including XOR and XNOR by adding 4 or 8 transistors to O'Connor's circuit [5]. In this letter, we propose a DRDLC, which consists of only seven transistors, to generate the whole set of 16 logic functions by using DG-CNTFETs. Finally, we show that the number of transistors can be reduced compared to the conventional DRDLC to generate 16 logic functions.

A generalized version of sequential logic circuit based neuron models is presented, where the dynamics of the model is modeled by an asynchronous cellular automaton. Thanks to the generalizations in this paper, the model can exhibit various neuron-like waveforms of the membrane potential in response to excitatory and inhibitory stimulus. Also, the model can reproduce four groups of biological and model neurons, which are classified based on existence of bistability and subthreshold oscillations, as well as their underlying bifurcations mechanisms.

An asynchronous sequential logic spiking neuron is an artificial neuron model that can exhibit various bifurcations and nonlinear responses to stimulation inputs. In this paper, a pulse-coupled system of the asynchronous sequential logic spiking neurons is presented. Numerical simulations show that the coupled system can exhibit various lockings and related nonlinear responses. Then, theoretical sufficient parameter conditions for existence of typical lockings are provided. Usefulness of the parameter conditions is validated by comparing with the numerical simulation results as well as field programmable gate array experiment results.

A design methodology of Random Switching Logic (RSL) using CMOS standard cell libraries is proposed to counter power analysis attacks against cryptographic hardware modules. The original RSL proposed in 2004 requires a unique RSL-gate for random data masking and glitch suppression to prevent secret information leakage through power traces. In contrast, our new methodology enables to use general logic gates supported by standard cell libraries. In order to evaluate its practical performance in hardware size and speed as well as resistance against power analysis attacks, an AES circuit with the RSL technique was implemented as a cryptographic LSI using 130-nm and 90-nm CMOS standard cell library. From the results of attack experiments that used a million traces, we confirmed that the RSL-AES circuit has very high DPA and CPA resistance thanks to the contributions of both the masking function and the glitch suppressing function.

Delay models for binary logic circuits have been proposed and clarified their mathematical properties. Kleene's ternary logic is one of the simplest delay models to express transient behavior of binary logic circuits. Goto first applied Kleene's ternary logic to hazard detection of binary logic circuits in 1948. Besides Kleene's ternary logic, there are many delay models of binary logic circuits, Lewis's 5-valued logic etc. On the other hand, multiple-valued logic circuits recently play an important role for realizing digital circuits. This is because, for example, they can reduce the size of a chip dramatically. Though multiple-valued logic circuits become more important, there are few discussions on delay models of multiple-valued logic circuits. Then, in this paper, we introduce a delay model of multiple-valued logic circuits, which are constructed by Min, Max, and Literal operations. We then show some of the mathematical properties of our delay model.

A fine-grain bit-serial multiple-valued reconfigurable VLSI based on logic-in-control architecture is proposed for effective use of the hardware resources. In logic-in-control architecture, the control circuits can be merged with the arithmetic/logic circuits, where the control and arithmetic/logic circuits are constructed by using one or multiple logic blocks. To implement the control circuit, only one state in a state transition diagram is allocated to one logic block, which leads to reduction of the complexity of interconnections between logic blocks. The fine-grain logic block is implemented based on multiple-valued current-mode circuit technology. In the fine-grain logic block, an arbitrary 3-variable binary function can be programmed by using one multiplexer and two universal literal circuits. Three-variable binary functions are used to implement the control circuit. Moreover, the hardware resources can be utilized to construct a bit-serial adder, because full-adder sum and carry can be realized by programming in the universal literal circuit. Therefore, the logic block can be effectively reconfigured for arithmetic/logic and control circuits. It is made clear that the hardware complexity of the control circuit in the proposed reconfigurable VLSI can be reduced in comparison with that of the control circuit based on a typically sequential circuit in the conventional FPGA and the fine-grain field-programmable VLSI reported until now.

The importance of redundant technologies for improving dependability and delay fault testability are growing. This paper presents properties of a class of redundant technologies, namely two-rail logic, and analyzes testability of path delay faults occurring on two-rail logic circuits. The paper reveals the following characteristics of two-rail logic circuits: While the number of paths in two-rail logic circuits is twice that in ordinary single-rail logic circuits, the number of robust testable path delay faults in two-rail logic circuits is twice or more that in the single-rail logic circuits. This suggests two-rail logic circuits are more testable than ordinary single-rail logic circuits. On two-rail logic circuits, there may be some robust testable path delay faults that are functional un-sensitizable for any input vectors consisting of codewords of two-rail codes, i.e. for any input vectors that can occur during fault-free operation. Even if such faults occur, the circuits are still strongly fault secure for unidirectional stuck-at faults as well as they work correctly.

This paper presents a scan design for delay fault testability of 2-rail logic circuits. The flip flops used in the scan design are based on master-slave ones. The proposed scan design provides complete fault coverage in delay fault testing of 2-rail logic circuits. In two-pattern testing with the proposed scan design, initial vectors are set using the set-reset operation, and the scan-in operation for initial vectors is not required. Hence, the test application time is reduced to about half that of the enhanced scan design. Because the additional function is only the set-reset operation of the slave latch, the area overhead is small. The evaluation shows that the differences in the area overhead of the proposed scan design from those of the standard scan design and the enhanced scan design are 2.1 and -14.5 percent on average, respectively.

We fabricated both thin film transistors (TFTs) and diodes using zinc oxide (ZnO) and pentacene, and investigated their basic characteristics. We found that field-effect mobility is influenced by the interface state between the semiconductor and dielectric layers. Furthermore, the complementary metal oxide semiconductor (CMOS) inverter using a p-channel pentacene field-effect transistor (FET) and an n-channel ZnO FET showed a relatively high voltage gain (8-12) by optimizing the device structure. The hybrid complementary inverters described here are expected for application in flexible displays, radio frequency identification cards (RFID) tags, and others.

We propose a new large-scale logic test element group (TEG), called a flip-flop RAM (FF-RAM), to improve the total process quality before and during initial mass production. It is designed to be as convenient as an SRAM for measurement and to imitate a logic LSI. We implemented a 10 Mgates FF-RAM using our 65-nm CMOS process. The FF-RAM enables us to make fail-bit maps (FBM) of logic cells because of its cell array structure as an SRAM. An FF-RAM has an additional structure to detect the open and short failure of upper metal layers. The test results show that it can detect failure locations and layers effortlessly using FBMs. We measured and analyzed it for both the cell arrays and the upper metal layers. Their results provided many important clues to improve our processes. We also measured the neutron-induced soft error rate (SER) of FF-RAM, which is becoming a serious problem as transistors become smaller. We compared the results of the neutron-induced soft error rate to those of previous generations: 180 nm, 130 nm, and 90 nm. Because of this TEG, we can considerably shorten the development period for advanced CMOS technology.

In recent years, certain countermeasures against differential power analysis (DPA) at the logic level have been proposed. Recently, Popp and Mangard proposed a new countermeasure-masked dual-rail pre-charge logic (MDPL); this countermeasure combines dual-rail circuits with random masking to improve the wave dynamic differential logic (WDDL). They claimed that it could implement secure circuits using a standard CMOS cell library without special constraints for the place-and-route method because the difference between the loading capacitances of all the pairs of complementary logic gates in MDPL can be compensated for by the random masking. In this paper, we particularly focus on the signal transition of MDPL gates and evaluate the DPA-resistance of MDPL in detail. Our evaluation results reveal that when the input signals have different delay times, leakage occurs in the MDPL as well as WDDL gates, even if MDPL is effective in reducing the leakage caused by the difference in loading capacitances. Furthermore, in order to validate our evaluation, we demonstrate a problem with different input signal delays by conducting measurements for an FPGA.