The automatic defect detection for fabric images is an essential mission in textile industry. However, there are some inherent difficulties in the detection of fabric images, such as complexity of the background and the highly uneven scales of defects. Moreover, the trade-off between accuracy and speed should be considered in real applications. To address these problems, we propose a novel model based on YOLOv4 to detect defects in fabric images, called Feature Augmentation YOLO (FA-YOLO). In terms of network structure, FA-YOLO adds an additional detection head to improve the detection ability of small defects and builds a powerful Neck structure to enhance feature fusion. First, to reduce information loss during feature fusion, we perform the residual feature augmentation (RFA) on the features after dimensionality reduction by using 1×1 convolution. Afterward, the attention module (SimAM) is embedded into the locations with rich features to improve the adaptation ability to complex backgrounds. Adaptive spatial feature fusion (ASFF) is also applied to output of the Neck to filter inconsistencies across layers. Finally, the cross-stage partial (CSP) structure is introduced for optimization. Experimental results based on three real industrial datasets, including Tianchi fabric dataset (72.5% mAP), ZJU-Leaper fabric dataset (0.714 of average F1-score) and NEU-DET steel dataset (77.2% mAP), demonstrate the proposed FA-YOLO achieves competitive results compared to other state-of-the-art (SoTA) methods.

Memory-based Programmable Logic Device (MPLD) is a new type of reconfigurable device constructed using a general SRAM array in a unique interconnect configuration. This research aims to propose approaches to guarantee the long-term reliability of MPLDs, including a test method to identify interconnect defects in the SRAM array during the production phase and a delay monitoring technique to detect aging-caused failures. The proposed test method configures pre-generated test configuration data into SRAMs to create fault propagation paths, applies an external walking-zero/one vector to excite faults, and identifies faults at the external output ports. The proposed delay monitoring method configures a novel ring oscillator logic design into MPLD to measure delay variations when the device is in practical use. The logic simulation results with fault injection confirm the effectiveness of the proposed methods.

This paper provides a new method to implement substrate integrated defected ground structure (SIDGS)-based bandpass filter (BPF) with adjustable frequency and controllable bandwidth. Compared with previous literature, this method implements a new SIDGS-like resonator capable of tunable frequency in the same plane as the slotted line using a varactor diode, increasing the design flexibility. In addition, the method solves the problem that the tunable BPF constituted by the SIDGS resonator cannot control the bandwidth by introducing a T-shaped non-resonant unit. The theoretical design method and the structural design are shown. Moreover, the configured structure is fabricated and measured to show the validity of the design method in this paper.

Aiming at the problem of low classification accuracy of surface defects of lithium battery pole pieces by traditional classification methods, an image classification algorithm for surface defects of lithium battery pole piece based on deep learning is proposed in this paper. Firstly, Wavelet Threshold and Histogram Equalization are used to preprocess the detect image to weaken influence of noise in non-defect regions and enhance defect features. Secondly, a VGG-InceptionV2 network with better performance is proposed by adding InceptionV2 structure to the improved VGG network structure. Then the original data set is expanded by rotating, flipping and contrast adjustment, and the optimal value of the model hyperparameters is determined by experiments. Finally, the model in this paper is compared with VGG16 and GoogLeNet to realize the recognition of defect types. The results show that the accuracy rate of the model in this paper for the surface pole piece defects of lithium batteries is 98.75%, and the model parameters is only 1.7M, which has certain significance for the classification of lithium battery surface pole piece defects in industry.

Defect prediction approaches have been greatly contributing to software quality assurance activities such as code review or unit testing. Just-in-time defect prediction approaches are developed to predict whether a commit is a defect-inducing commit or not. Prior research has shown that commit-level prediction is not enough in terms of effort, and a defective commit may contain both defective and non-defective files. As the defect prediction community is promoting fine-grained granularity prediction approaches, we propose our novel class-level prediction, which is finer-grained than the file-level prediction, based on the files of the commits in this research. We designed our model for Python projects and tested it with ten open-source Python projects. We performed our experiment with two settings: setting with product metrics only and setting with product metrics plus commit information. Our investigation was conducted with three different classifiers and two validation strategies. We found that our model developed by random forest classifier performs the best, and commit information contributes significantly to the product metrics in 10-fold cross-validation. We also created a commit-based file-level prediction for the Python files which do not have the classes. The file-level model also showed a similar condition as the class-level model. However, the results showed a massive deviation in time-series validation for both levels and the challenge of predicting Python classes and files in a realistic scenario.

This paper focuses on the “data collection period” for training a better Just-In-Time (JIT) defect prediction model — the early commit data vs. the recent one —, and conducts a large-scale comparative study to explore an appropriate data collection period. Since there are many possible machine learning algorithms for training defect prediction models, the selection of machine learning algorithms can become a threat to validity. Hence, this study adopts the automatic machine learning method to mitigate the selection bias in the comparative study. The empirical results using 122 open-source software projects prove the trend that the dataset composed of the recent commits would become a better training set for JIT defect prediction models.

This paper presents an improved YOLOv3 network, named MSFF-YOLOv3, for precisely detecting variable surface defects of aluminum profiles in practice. First, we introduce a larger prediction scale to provide detailed information for small defect detection; second, we design an efficient attention-guided block to extract more features of defects with less overhead; third, we design a bottom-up pyramid and integrate it with the existing feature pyramid network to construct a twin-tower structure to improve the circulation and fusion of features of different layers. In addition, we employ the K-median algorithm for anchor clustering to speed up the network reasoning. Experimental results showed that the mean average precision of the proposed network MSFF-YOLOv3 is higher than all conventional networks for surface defect detection of aluminum profiles. Moreover, the number of frames processed per second for our proposed MSFF-YOLOv3 could meet real-time requirements.

As modern CMOS circuits fabricated with advanced technology nodes are becoming more and more susceptible to soft-errors, many hardened latches have been proposed for reliable LSI designs. We reveal for the first time that production defects in such hardened latches can cause two serious problems: (1) these production defects are difficult to detect with conventional scan test and (2) these production defects can reduce the reliability of hardened latches. This paper systematically addresses these two problems with three major contributions: (1) Post-Test Vulnerability Factor (PTVF), a first-of-its-kind metric for quantifying the impact of production defects on hardened latches, (2) a novel Scan-Test-Aware Hardened Latch (STAHL) design that has the highest defect coverage compared to state-of-the-art hardened latch designs, and (3) an STAHL-based scan test procedure. Comprehensive simulation results demonstrate the accuracy of the proposed PTVF metric and the effectiveness of the STAHL-based scan test. As the first comprehensive study bridging the gap between hardened latch design and LSI testing, the findings of this paper will significantly improve the soft-error-related reliability of LSI designs for safety-critical applications.

Cross-project defect prediction (CPDP) is a hot research topic in recent years. The inconsistent data distribution between source and target projects and lack of labels for most of target instances bring a challenge for defect prediction. Researchers have developed several CPDP methods. However, the prediction performance still needs to be improved. In this paper, we propose a novel approach called Joint Domain Adaption and Pseudo-Labeling (JDAPL). The network architecture consists of a feature mapping sub-network to map source and target instances into a common subspace, followed by a classification sub-network and an auxiliary classification sub-network. The classification sub-network makes use of the label information of labeled instances to generate pseudo-labels. The auxiliary classification sub-network learns to reduce the distribution difference and improve the accuracy of pseudo-labels for unlabeled instances through loss maximization. Network training is guided by the adversarial scheme. Extensive experiments are conducted on 10 projects of the AEEEM and NASA datasets, and the results indicate that our approach achieves better performance compared with the baselines.

This review provides a current overview of the fabrication processes for superconducting digital circuits at CRAVITY (clean room for analog and digital superconductivity) at the National Institute of Advanced Industrial Science and Technology (AIST), Japan. CRAVITY routinely fabricates superconducting digital circuits using three types of fabrication processes and supplies several thousand chips to its collaborators each year. Researchers at CRAVITY have focused on improving the controllability and uniformity of device parameters and the reliability, which means reducing defects. These three aspects are important for the correct operation of large-scale digital circuits. The current technologies used at CRAVITY permit ±10% controllability over the critical current density (Jc) of Josephson junctions (JJs) with respect to the design values, while the critical current (Ic) uniformity is within 1σ=2% for JJs with areas exceeding 1.0 µm2 and the defect density is on the order of one defect for every 100,000 JJs.

Various software fault prediction models have been proposed in the past twenty years. Many studies have compared and evaluated existing prediction approaches in order to identify the most effective ones. However, in most cases, such models and techniques provide varying results, and their outcomes do not result in best possible performance across different datasets. This is mainly due to the diverse nature of software development projects, and therefore, there is a risk that the selected models lead to inconsistent results across multiple datasets. In this work, we propose the use of bandit algorithms in cases where the accuracy of the models are inconsistent across multiple datasets. In the experiment discussed in this work, we used four conventional prediction models, tested on three different dataset, and then selected the best possible model dynamically by applying bandit algorithms. We then compared our results with those obtained using majority voting. As a result, Epsilon-greedy with ϵ=0.3 showed the best or second-best prediction performance compared with using only one prediction model and majority voting. Our results showed that bandit algorithms can provide promising outcomes when used in fault prediction.

Cross-project defect prediction (CPDP) is a feasible solution to build an accurate prediction model without enough historical data. Although existing methods for CPDP that use only labeled data to build the prediction model achieve great results, there are much room left to further improve on prediction performance. In this paper we propose a Semi-Supervised Discriminative Feature Learning (SSDFL) approach for CPDP. SSDFL first transfers knowledge of source and target data into the common space by using a fully-connected neural network to mine potential similarities of source and target data. Next, we reduce the differences of both marginal distributions and conditional distributions between mapped source and target data. We also introduce the discriminative feature learning to make full use of label information, which is that the instances from the same class are close to each other and the instances from different classes are distant from each other. Extensive experiments are conducted on 10 projects from AEEEM and NASA datasets, and the experimental results indicate that our approach obtains better prediction performance than baselines.

Cross-project defect prediction (CPDP) is a research hot recently, which utilizes the data form existing source project to construct prediction model and predicts the defect-prone of software instances from target project. However, it is challenging in bridging the distribution difference between different projects. To minimize the data distribution differences between different projects and predict unlabeled target instances, we present a novel approach called selective pseudo-labeling based subspace learning (SPSL). SPSL learns a common subspace by using both labeled source instances and pseudo-labeled target instances. The accuracy of pseudo-labeling is promoted by iterative selective pseudo-labeling strategy. The pseudo-labeled instances from target project are iteratively updated by selecting the instances with high confidence from two pseudo-labeling technologies. Experiments are conducted on AEEEM dataset and the results show that SPSL is effective for CPDP.

To enhance the prediction accuracy of the number of faults, many studies proposed various prediction models. The model is built using a dataset collected in past projects, and the number of faults is predicted using the model and the data of the current project. Datasets sometimes have many data points where the dependent variable, i.e., the number of faults is zero. When a multiple linear regression model is made using the dataset, the model may not be built properly. To avoid the problem, the Tobit model is considered to be effective when predicting software faults. The model assumes that the range of a dependent variable is limited and the model is built based on the assumption. Similar to the Tobit model, the Poisson regression model assumes there are many data points whose value is zero on the dependent variable. Also, log-transformation is sometimes applied to enhance the accuracy of the model. Additionally, ensemble methods are effective to enhance prediction accuracy of the models. We evaluated the prediction accuracy of the methods separately, when the number of faults is zero and not zero. In the experiment, our proposed ensemble method showed the highest accuracy, and Pred25 was 21% when the number of faults was not zero, and it was 45% when the number was zero.

The aim of this paper is to show an upper bound for finding defective samples in a group testing framework. To this end, we exploit minimization of Hamming weights in coding theory and define probability of error for our decoding scheme. We derive a new upper bound on the probability of error. We show that both upper and lower bounds coincide with each other at an optimal density ratio of a group matrix. We conclude that as defective rate increases, a group matrix should be sparser to find defective samples with only a small number of tests.

Software defect prediction (SDP) plays a vital role in allocating testing resources reasonably and ensuring software quality. When there are not enough labeled historical modules, considerable semi-supervised SDP methods have been proposed, and these methods utilize limited labeled modules and abundant unlabeled modules simultaneously. Nevertheless, most of them make use of traditional features rather than the powerful deep feature representations. Besides, the cost of the misclassification of the defective modules is higher than that of defect-free ones, and the number of the defective modules for training is small. Taking the above issues into account, we propose a cost-sensitive and sparse ladder network (CSLN) for SDP. We firstly introduce the semi-supervised ladder network to extract the deep feature representations. Besides, we introduce the cost-sensitive learning to set different misclassification costs for defective-prone and defect-free-prone instances to alleviate the class imbalance problem. A sparse constraint is added on the hidden nodes in ladder network when the number of hidden nodes is large, which enables the model to find robust structures of the data. Extensive experiments on the AEEEM dataset show that the CSLN outperforms several state-of-the-art semi-supervised SDP methods.

Heterogeneous defect prediction (HDP) is to detect the largest number of defective software modules in one project by using historical data collected from other projects with different metrics. However, these data can not be directly used because of different metrics set among projects. Meanwhile, software data have more non-defective instances than defective instances which may cause a significant bias towards defective instances. To completely solve these two restrictions, we propose unsupervised deep domain adaptation approach to build a HDP model. Specifically, we firstly map the data of source and target projects into a unified metric representation (UMR). Then, we design a simple neural network (SNN) model to deal with the heterogeneous and class-imbalanced problems in software defect prediction (SDP). In particular, our model introduces the Maximum Mean Discrepancy (MMD) as the distance between the source and target data to reduce the distribution mismatch, and use the cross-entropy loss function as the classification loss. Extensive experiments on 18 public projects from four datasets indicate that the proposed approach can build an effective prediction model for heterogeneous defect prediction (HDP) and outperforms the related competing approaches.

Software defect prediction (SDP) plays a significant part in allocating testing resources reasonably, reducing testing costs, and ensuring software quality. One of the most widely used algorithms of SDP models is Naive Bayes (NB) because of its simplicity, effectiveness and robustness. In NB, when a data set has continuous or numeric attributes, they are generally assumed to follow normal distributions and incorporate the probability density function of normal distribution into their conditional probabilities estimates. However, after conducting a Kolmogorov-Smirnov test, we find that the 21 main software metrics follow non-normal distribution at the 5% significance level. Therefore, this paper proposes an improved NB approach, which estimates the conditional probabilities of NB with kernel density estimation of training data sets, to help improve the prediction accuracy of NB for SDP. To evaluate the proposed method, we carry out experiments on 34 software releases obtained from 10 open source projects provided by PROMISE repository. Four well-known classification algorithms are included for comparison, namely Naive Bayes, Support Vector Machine, Logistic Regression and Random Tree. The obtained results show that this new method is more successful than the four well-known classification algorithms in the most software releases.

Association rule mining discovers relationships among variables in a data set, representing them as rules. These are expected to often have predictive abilities, that is, to be able to predict future events, but commonly used rule interestingness measures, such as support and confidence, do not directly assess their predictive power. This paper proposes a cross-validation -based metric that quantifies the predictive power of such rules for characterizing software defects. The results of evaluation this metric experimentally using four open-source data sets (Mylyn, NetBeans, Apache Ant and jEdit) show that it can improve rule prioritization performance over conventional metrics (support, confidence and odds ratio) by 72.8% for Mylyn, 15.0% for NetBeans, 10.5% for Apache Ant and 0 for jEdit in terms of SumNormPre(100) precision criterion. This suggests that the proposed metric can provide better rule prioritization performance than conventional metrics and can at least provide similar performance even in the worst case.

A design-for-testability method and an electrical interconnect test method are proposed to detect open defects occurring at interconnects among dies and input/output pins in 3D stacked ICs. As part of the design method, an nMOS and a diode are added to each input interconnect. The test method is based on measuring the quiescent current that is made to flow through an interconnect to be tested. The testability is examined both by SPICE simulation and by experimentation. The test method enabled the detection of open defects occurring at the newly designed interconnects of dies at experiments test speed of 1MHz. The simulation results reveal that an open defect generating additional delay of 279psec is detectable by the test method at a test speed of 200MHz beside of open defects that generate no logical errors.