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16721-16740hit(20498hit)

  • The Distributed Program Reliability Analysis on a Star Topology: Efficient Algorithms and Approximate Solution

    Ming-Sang CHANG  Deng-Jyi CHEN  Min-Sheng LIN  Kuo-Lung KU  

     
    PAPER-Software Theory

      Vol:
    E82-D No:6
      Page(s):
    1020-1029

    A distributed computing system consists of processing elements, communication links, memory units, data files, and programs. These resources are interconnected via a communication network and controlled by a distributed operating system. The distributed program reliability (DPR) in a distributed computing system is the probability that a program which runs on multiple processing elements and needs to retrieve data files from other processing elements will be executed successfully. This reliability varies according to 1) the topology of the distributed computing system, 2) the reliability of the communication edges, 3) the data files and programs distribution among processing elements, and 4) the data files required to execute a program. In this paper, we show that computing the distributed program reliability on a star distributed computing system is #P-complete. A polynomially solvable case is developed for computing the distributed program reliability when some additional file distribution is restricted on the star topology. We also propose a polynomial time algorithm for computing the distributed program reliability with approximate solutions when the star topology has no the additional file distribution.

  • TCAD--Yesterday, Today and Tomorrow

    Robert W. DUTTON  

     
    INVITED PAPER

      Vol:
    E82-C No:6
      Page(s):
    791-799

    This paper outlines the modeling requirements of integrated circuit (IC) fabrication processes that have lead to and sustained the development of computer-aided design of technology (i. e. TCAD). Over a period spanning more than two decades the importance of TCAD modeling and the complexity of required models has grown steadily. The paper also illustrates typical applications where TCAD has been powerful and strategic to IC scaling of processes. Finally, the future issues of atomic-scale modeling and the need for an hierarchical approach to capture and use such detailed information at higher levels of simulation are discussed.

  • New Scheduling Mechanisms for Achieving Fairness Criteria (MCR Plus Equal Share, Maximum of MCR or Max-Min Share)

    Masayoshi NABESHIMA  Naoaki YAMANAKA  

     
    LETTER-Switching and Communication Processing

      Vol:
    E82-B No:6
      Page(s):
    962-966

    The ATM Forum specifies several fairness criteria, thus the scheduling mechanisms should allocate enough bandwidth to each connection to achieve one of such fairness criteria. However, two fairness criteria (MCR plus equal share, maximum of MCR or Max-Min share) cannot be achieved by conventional scheduling mechanisms. In this letter, we have developed new scheduling mechanisms that achieve these fairness criteria. We also present simulation results to show that our mechanisms can allocate bandwidth fairly.

  • GUITESTER: A Log-Based Usability Testing Tool for Graphical User Interfaces

    Hidehiko OKADA  Toshiyuki ASAHI  

     
    PAPER-Sofware System

      Vol:
    E82-D No:6
      Page(s):
    1030-1041

    In this paper, we propose methods for testing the usability of graphical user interface (GUI) applications based on log files of user interactions. Log analysis by existing methods is not efficient because evaluators analyze a single log file or log files of the same user and then manually compare results. The methods proposed here solve this problem; the methods enable evaluators to analyze the log files of multiple users together by detecting interaction patterns that commonly appear in the log files. To achieve the methods, we first clarify usability attributes that can be evaluated by a log-based usability testing method and user interaction patterns that have to be detected for the evaluation. Based on an investigation on the information that can be obtained from the log files, we extract the attributes of clarity, safety, simplicity, and continuity. For the evaluations of clarity and safety, the interaction patterns that have to be detected include those from user errors. We then propose our methods for detecting interaction patterns from the log files of multiple users. Patterns that commonly appear in the log files are detected by utilizing a repeating pattern detection algorithm. By regarding an operation sequence recorded in a log file as a string and concatenating strings, common patterns are able to be detected as repeating patterns in the concatenated string. We next describe the implementation of the methods in a computer tool for log-based usability testing. The tool, GUITESTER, records user-application interactions into log files, generates usability analysis data from the log files by applying the proposed methods, and visualizes the generated usability analysis data. To show the effectiveness of GUITESTER in finding usability problems, we report an example of a usability test. In this test, evaluators could find 14 problems in a tested GUI application. We finally discuss the ability of the proposed methods in terms of its log analysis efficiency, by comparing the analysis/sequence time (AT/ST) ratio of GUITESTER with those of other methods and tools. The ratio of GUITESTER is found to be smaller. This indicates the methods make log analysis more efficient.

  • Testing for the Programming Circuit of SRAM-Based FPGAs

    Hiroyuki MICHINISHI  Tokumi YOKOHIRA  Takuji OKAMOTO  Tomoo INOUE  Hideo FUJIWARA  

     
    PAPER-Fault Tolerant Computing

      Vol:
    E82-D No:6
      Page(s):
    1051-1057

    The programming circuit of SRAM-based FPGAs consists of two shift registers, a control circuit and a configuration memory (SRAM) cell array. Because the configuration memory cell array can be easily tested by conventional test methods for RAMs, we focus on testing for the shift registers. We first derive test procedures for the shift registers, which can be done by using only the faculties of the programming circuit, without using additional hardware. Next, we show the validness of the test procedures. Finally, we show an application of the test procedures to test Xilinx XC4025.

  • Process Synthesis Using TCAD: A Mixed-Signal Case Study

    Michael SMAYLING  John RODRIGUEZ  Alister YOUNG  Ichiro FUJII  

     
    INVITED PAPER

      Vol:
    E82-C No:6
      Page(s):
    983-991

    A complex modular process flow was developed for PRISM technology to permit increased system integration. In order to combine the required functions--submicron CMOS Logic, Nonvolatile Memories, Precision Linear, and Power Drivers--on a monolithic silicon chip, a highly structured, systematic approach to process synthesis was developed. TCAD tools were used extensively for process design and verification. The 60 V LDMOS power transistor and the Flash memory cell built in the technology will be described to illustrate the process synthesis methodology.

  • Equipment Simulation of Production Reactors for Silicon Device Fabrication

    Christoph WERNER  

     
    INVITED PAPER

      Vol:
    E82-C No:6
      Page(s):
    992-996

    Equipment simulation can provide valuable support in reactor design and process optimization. This article describes the physical and chemical models used in this technique and the current state of the art of the available software tools is reviewed. Moreover, the potential of equipment simulation will be highlighted by means of three recent examples from advanced quarter micron silicon process development. These include a vertical batch reactor for LPCVD of arsenic doped silicon oxide, a multi station tungsten CVD reactor, and a plasma reactor for silicon etching.

  • Large Signal Analysis of RF Circuits in Device Simulation

    Zhiping YU  Robert W. DUTTON  Boris TROYANOSKY  Junko SATO-IWANAGA  

     
    INVITED PAPER

      Vol:
    E82-C No:6
      Page(s):
    908-916

    As wireless communication is penetrating every corner of the globe, the optimum design and accurate analysis of RF, power semiconductor devices become one of the biggest challenges in EDA and TCAD (Technology CAD) tool development. The performance gauge for these devices is quite different from that for either digital or analog devices aimed at small-signal applications in that the power gain, efficiency, and distortion (or the range of linearity) are the utmost design concerns. In this article, the methodology and mathematical foundation for numerical analysis of large signal distortion at the device simulation level are discussed. Although the harmonic balance (HB) method has long been used in circuit simulation for large signal distortion analysis, the implementation of the same method in device simulation faces daunting challenges, among which are the tremendous computational cost and memory storage management. But the benefits from conducting such a device level simulation are also obvious--for the first time, the impact of technology and structural variation of device on large signal performance can directly be assessed. The necessary steps to make the HB analysis feasible in device simulation are outlined and algorithmic improvement to ease the computation/storage burden is discussed. The applications of the device simulator for various RF power devices, including GaAs MESFETs and silicon LDMOS (lateral diffusion MOS) are presented, and the insight gained from such an analysis is provided.

  • 2-Dimensional Simulation of FN Current Suppression Including Phonon Assisted Tunneling Model in Silicon Dioxide

    Katsumi EIKYU  Kiyohiko SAKAKIBARA  Kiyoshi ISHIKAWA  Tadashi NISHIMURA  

     
    PAPER

      Vol:
    E82-C No:6
      Page(s):
    889-893

    A gate oxide excess current model is described based on the phonon-assisted tunneling process of electrons into neutral traps. The influence on local electric field of charge of electrons trapped by neutral traps in gate oxide is simulated using a two-dimensional device simulator into which the new model is incorporated. FN current is suppressed with an increase in the neutral trap density to over 1019 cm-3. The calculated results reflect the endurance characteristics of flash memories in which erase/write operation speed depends on FN current.

  • Measurement-Based Mathematical Active Device Modeling for High Frequency Circuit Simulation

    David E. ROOT  

     
    INVITED PAPER

      Vol:
    E82-C No:6
      Page(s):
    924-936

    Measurement-based mathematical modeling is an attractive approach for simulating, accurately and efficiently, circuits based on active devices from a diverse range of constantly evolving processes and technologies. The principle of the measurement-based approach is that it is often most practical to characterize the device with various high-frequency measurements, and then mathematically transform the data to produce predictive device dynamical models for small-signal (linear) and large-signal (nonlinear) circuit design purposes. There are many mathematical, physical, and measurement considerations, however, that must be incorporated into any sound framework for successful measurement-based modeling. This paper will review some foundations of the subject and discuss some future trends. Review topics include constructing nonlinear constitutive relations from linear data parameterized by operating point and conservation laws including terminal charge conservation and energy conservation. Recent advances and trends will be discussed, such as pulsed I-V and pulsed S-parameter characterization with implications for electro-thermal and dispersive dynamical models, nonlinear wave-form measurements, and the relationship to some black-box behavioral modeling approaches.

  • Dynamic Load Balancing of a Service Control Node in the Advanced Intelligent Network

    Katsuyuki KAWASE  Masanori HIRANO  Etsuo MASUDA  Hitoshi IMAGAWA  Yasuo KINOUCHI  

     
    PAPER

      Vol:
    E82-B No:6
      Page(s):
    877-885

    A service control node in the Advanced Intelligent Network (AIN) allocates data for customers among multiple modules and performs distributed processing of multiple transactions. In such a node, load can vary among the modules due to dispersion in the amount of traffic for each customer. It is therefore important to balance out this load variation and raise the utilization of each module in order to achieve an efficient distributed processing system. We first propose a method for balancing the load among modules by dynamically transferring customer data in units of records from high-load modules to low-load modules. Then, based on this method, a method for selecting records to be transferred between modules is also proposed. And we clarify the processor overhead for transferring records. The effect of the reduction of number of modules by load balancing is also evaluated. Based on the these results, it is shown that dynamic transferring of records is an effective scheme for balancing load among modules in a service control node of the AIN.

  • Mesh Generation for Application in Technology CAD

    Peter FLEISCHMANN  Wolfgang PYKA  Siegfried SELBERHERR  

     
    INVITED PAPER

      Vol:
    E82-C No:6
      Page(s):
    937-947

    After a brief discussion of the demands in meshing for semiconductor process and device simulation, we present a three-dimensional Delaunay refinement technique combined with a modified advancing front algorithm.

  • Non-uniform Multi-Layer IC Interconnect Transmission Line Characterization for Fast Signal Transient Simulation of High-Speed/High-Density VLSI Circuits

    Woojin JIN  Hanjong YOO  Yungseon EO  

     
    PAPER

      Vol:
    E82-C No:6
      Page(s):
    955-966

    A new IC interconnect transmission line parameter determination methodology and a novel fast simulation technique for non-uniform transmission lines are presented and verified. The capacitance parameter is a strong function of a shielding effect between the layers, while silicon substrate has a substantial effect on inductance parameter. Thus, they are taken into account to determine the parameters. Then the virtual straight-line-based per unit length parameters are determined in order to perform the fast transient simulation of the non-uniform transmission lines. It was shown that not only the inductance effect due to a silicon substrate but also the shielding effect between the layers are too significant to be neglected. Further, a model order reduction technique is integrated into Berkeley SPICE in order to demonstrate that the virtual straight-line-based per-unit-length parameters can be efficiently employed for the fast transient response simulation of the complicated multi-layer interconnect structures. Since the methodology is very efficient as well as accurate, it can be usefully employed for IC CAD tools of high-performance VLSI circuit design.

  • Quantum Transport Modeling of Ultrasmall Semiconductor Devices

    Hideaki TSUCHIYA  Tanroku MIYOSHI  

     
    INVITED PAPER

      Vol:
    E82-C No:6
      Page(s):
    880-888

    With the progress of LSI technology, the electronic device size is presently scaling down to the nano-meter region. In such an ultrasmall device, it is indispensable to take quantum mechanical effects into account in device modeling. In this paper, we first review the approaches to the quantum mechanical modeling of carrier transport in ultrasmall semiconductor devices. Then, we propose a novel quantum device model based upon a direct solution of the Boltzmann equation for multi-dimensional practical use. In this model, the quantum effects are represented in terms of quantum mechanically corrected potential in the classical Boltzmann equation.

  • A Multiple-Valued Immune Network and Its Applications

    Zheng TANG  Takayuki YAMAGUCHI  Koichi TASHIMA  Okihiko ISHIZUKA  Koichi TANNO  

     
    PAPER-Neural Networks

      Vol:
    E82-A No:6
      Page(s):
    1102-1108

    This paper describes a new model of multiple-valued immune network based on biological immune response network. The model of multiple-valued immune network is formulated based on the analogy with the interaction between B cells and T cells in immune system. The model has a property that resembles immune response quite well. The immunity of the network is simulated and makes several experimentally testable predictions. Simulation results are given to a letter recognition application of the network and compared with binary ones. The simulations show that, beside the advantages of less categories, improved memory pattern and good memory capacity, the multiple-valued immune network produces a stronger noise immunity than binary one.

  • Modeling of Dopant Diffusion in Silicon

    Scott T. DUNHAM  Alp H. GENCER  Srinivasan CHAKRAVARTHI  

     
    INVITED PAPER

      Vol:
    E82-C No:6
      Page(s):
    800-812

    Recent years have seen great advances in our understanding and modeling of the coupled diffusion of dopants and defects in silicon during integrated circuit fabrication processes. However, the ever-progressing shrinkage of device dimensions and tolerances leads to new problems and a need for even better models. In this review, we address some of the advances in the understanding of defect-mediated diffusion, focusing on the equations and parameters appropriate for modeling of dopant diffusion in submicron structures.

  • System Performance Analyses of Out-of-Order Superscalar Processors Using Analytical Method

    Hak-Jun KIM  Sun-Mo KIM  Sang-Bang CHOI  

     
    PAPER

      Vol:
    E82-A No:6
      Page(s):
    927-938

    This research presents a novel analytic model to predict the instruction execution rate of superscalar processors using the queuing model with finite-buffer size and synchronous operation mode. The proposed model is also able to analyze the performance relationship between cache and pipeline. The proposed model takes into account various kinds of architectural parameters such as instruction-level parallelism, branch probability, the accuracy of branch prediction, cache miss, and etc. To prove the correctness of the model, we performed extensive simulations and compared the results with the analytic model. Simulation results showed that the proposed model can estimate the average execution rate accurately within 10% error in most cases. The proposed model can explain the causes of performance bottleneck which cannot be uncovered by the simulation method only. The model is also able to show the effect of the cache miss on the performance of out-of-order issue superscalar processors, which can provide an valuable information in designing a balanced system.

  • Roundoff Error Analysis in the Decoding of Fractal Image Coding Using a Simplified State-Space Model

    Choong Ho LEE  Masayuki KAWAMATA  Tatsuo HIGUCHI  

     
    PAPER

      Vol:
    E82-A No:6
      Page(s):
    872-878

    This paper proposes an analysis method of the roundoff error due to finite-wordlength decoding in fractal image coding. The proposed method can be applied to large images such as 256 256 or 512 512 images because it needs no complex matrix computation. The simplified model used here ignores the effect of decimation ratio on the roundoff error because it is negligible. As an analysis result, the proposed method gives the output error variance which consists of grey-tone scaling coefficients and an iteration number. This method is tested on various types of 12 standard images which have 256 256 size or 512 512 size with 256 grey levels. Comparisons of simulation results with analysis results are given. The results show that our analysis method is valid for the fractal image coding.

  • A Fixed-Point DSP (MDSP) Chip for Portable Multimedia

    Soohwan ONG  Myung H. SUNWOO  

     
    PAPER

      Vol:
    E82-A No:6
      Page(s):
    939-944

    Existing multimedia processors having millions of transistors are not suitable for portable multimedia services and existing fixed-point DSP chips having fixed data formats are not appropriate for multimedia applications. This paper proposes a multimedia fixed-point DSP (MDSP) chip for portable multimedia services and its chip implementation. MDSP employs parallel processing techniques, such as SIMD, vector processing, and DSP techniques. MDSP can handle 8-, 16-, 32- or 40-bit data and can perform two MAC operations in parallel. In addition, MDSP can complete two vector operations with two data movements in a cycle. With these features, MDSP can handle both 2-D video signal processing and 1-D signal processing. The prototype MDSP chip has 68,831 gates, has been fabricated, and is running at 30 MHz.

  • A Pipeline Structure for the Sequential Boltzmann Machine

    Hongbing ZHU  Mamoru SASAKI  Takahiro INOUE  

     
    PAPER

      Vol:
    E82-A No:6
      Page(s):
    920-926

    In this paper, by making good use of the parallel-transit-evaluation algorithm and sparsity of the connection between neurons, a pipeline structure is successfully introduced to the sequential Boltzmann machine processor. The novel structure speeds up nine times faster than the previous one, with only the 12% rise in hardware resources under 10,000 neurons. The performance is confirmed by designing it using 1.2 µm CMOS process standard cells and analyzing the probability of state-change.

16721-16740hit(20498hit)