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[Keyword] SOC(334hit)

221-240hit(334hit)

  • Impact of Intrinsic Parasitic Extraction Errors on Timing and Noise Estimation

    Toshiki KANAMOTO  Shigekiyo AKUTSU  Tamiyo NAKABAYASHI  Takahiro ICHINOMIYA  Koutaro HACHIYA  Atsushi KUROKAWA  Hiroshi ISHIKAWA  Sakae MUROMOTO  Hiroyuki KOBAYASHI  Masanori HASHIMOTO  

     
    LETTER-Interconnect

      Vol:
    E89-A No:12
      Page(s):
    3666-3670

    In this letter, we discuss the impact of intrinsic error in parasitic capacitance extraction programs which are commonly used in today's SoC design flows. Most of the extraction programs use pattern-matching methods which introduces an improvable error factor due to the pattern interpolation, and an intrinsically inescapable error factor from the difference of boundary conditions in the electro-magnetic field solver. Here, we study impact of the intrinsic error on timing and crosstalk noise estimation. We experimentally show that the resulting delay and noise estimation errors show a scatter which is normally distributed. Values of the standard deviations will help designers consider the intrinsic error compared with other variation factors.

  • Hierarchical-Analysis-Based Fast Chip-Scale Power Estimation Method for Large and Complex LSIs

    Yuichi NAKAMURA  Takeshi YOSHIMURA  

     
    PAPER-Simulation and Verification

      Vol:
    E89-A No:12
      Page(s):
    3458-3463

    This paper presents a novel power estimation method for large and complex LSIs. The proposed method is based on simulation and is used for analyzing the ways in chip-scale gate-level circuits including processors and memory are affected by gated-clock power reduction and the voltage drop due to electrical resistance. The chip-scale power estimation based on simulation patterns generally takes enormous time. In order to reduce the time to obtain accurate estimation results based on simulation patterns, we introduce three approaches: "partitioning of target LSIs and simulation pattern," "memory modeling," and "processor modeling." After placing and routing, the target LSIs are partitioned into hierarchical blocks, memory, and processors. The power consumption of each hierarchical block is calculated by using the partitioned patterns generated from chip-scale simulation patterns. The power consumption of the processor and memory blocks is estimated by a method considering the static power consumption and the rate of LSI activity ratio. Experimental results for a commercial 0.18 µm-technology media processing chip show that the proposed method is 23 times faster than the conventional method without partitioning and that both the results are almost the same.

  • A VLSI Spiking Feedback Neural Network with Negative Thresholding and Its Application to Associative Memory

    Kan'ya SASAKI  Takashi MORIE  Atsushi IWATA  

     
    PAPER

      Vol:
    E89-C No:11
      Page(s):
    1637-1644

    An integrate-and-fire-type spiking feedback network is discussed in this paper. In our spiking neuron model, analog information expressing processing results is given by the relative relation of spike firing. Therefore, for spiking feedback networks, all neurons should fire (pseudo-)periodically. However, an integrate-and-fire-type neuron generates no spike unless its internal potential exceeds the threshold. To solve this problem, we propose negative thresholding operation. In this paper, this operation is achieved by a global excitatory unit. This unit operates immediately after receiving the first spike input. We have designed a CMOS spiking feedback network VLSI circuit with the global excitatory unit for Hopfield-type associative memory. The circuit simulation results show that the network achieves correct association operation.

  • Hardware Implementation of an Inverse Function Delayed Neural Network Using Stochastic Logic

    Hongge LI  Yoshihiro HAYAKAWA  Shigeo SATO  Koji NAKAJIMA  

     
    PAPER-Biocybernetics, Neurocomputing

      Vol:
    E89-D No:9
      Page(s):
    2572-2578

    In this paper, the authors present a new digital circuit of neuron hardware using a field programmable gate array (FPGA). A new Inverse function Delayed (ID) neuron model is implemented. The Inverse function Delayed model, which includes the BVP model, has superior associative properties thanks to negative resistance. An associative memory based on the ID model with self-connections has possibilities of improving its basin sizes and memory capacity. In order to decrease circuit area, we employ stochastic logic. The proposed neuron circuit completes the stimulus response output, and its retrieval property with negative resistance is superior to a conventional nonlinear model in basin size of an associative memory.

  • A 3D Feature-Based Binocular Tracking Algorithm

    Guang TIAN  Feihu QI  Masatoshi KIMACHI  Yue WU  Takashi IKETANI  

     
    PAPER-Tracking

      Vol:
    E89-D No:7
      Page(s):
    2142-2149

    This paper presents a 3D feature-based binocular tracking algorithm for tracking crowded people indoors. The algorithm consists of a two stage 3D feature points grouping method and a robust 3D feature-based tracking method. The two stage 3D feature points grouping method can use kernel-based ISODATA method to detect people accurately even though the part or almost full occlusion occurs among people in surveillance area. The robust 3D feature-based Tracking method combines interacting multiple model (IMM) method with a cascade multiple feature data association method. The robust 3D feature-based tracking method not only manages the generation and disappearance of a trajectory, but also can deal with the interaction of people and track people maneuvering. Experimental results demonstrate the robustness and efficiency of the proposed framework. It is real-time and not sensitive to the variable frame to frame interval time. It also can deal with the occlusion of people and do well in those cases that people rotate and wriggle.

  • An Efficient Architecture of High-Performance Deblocking Filter for H.264/AVC

    Seonyoung LEE  Kyeongsoon CHO  

     
    LETTER

      Vol:
    E89-A No:6
      Page(s):
    1736-1739

    We devised an efficient architecture of deblocking filter and implemented the circuit with 15,400 logic gates and a 16032 dual-port SRAM using 0.25 µm standard cell technology. This circuit can process 88 image frames with 1,280720 pixels per second at 166 MHz. Our circuit requires smaller number of accesses to the external memory than other approaches and hence causes less bus traffic in the SoC design platform.

  • Graphical Gaussian Modeling for Gene Association Structures Based on Expression Deviation Patterns Induced by Various Chemical Stimuli

    Tetsuya MATSUNO  Nobuaki TOMINAGA  Koji ARIZONO  Taisen IGUCHI  Yuji KOHARA  

     
    PAPER-Biological Engineering

      Vol:
    E89-D No:4
      Page(s):
    1563-1574

    Activity patterns of metabolic subnetworks, each of which can be regarded as a biological function module, were focused on in order to clarify biological meanings of observed deviation patterns of gene expressions induced by various chemical stimuli. We tried to infer association structures of genes by applying the multivariate statistical method called graphical Gaussian modeling to the gene expression data in a subnetwork-wise manner. It can be expected that the obtained graphical models will provide reasonable relationships between gene expressions and macroscopic biological functions. In this study, the gene expression patterns in nematodes under various conditions (stresses by chemicals such as heavy metals and endocrine disrupters) were observed using DNA microarrays. The graphical models for metabolic subnetworks were obtained from these expression data. The obtained models (independence graph) represent gene association structures of cooperativities of genes. We compared each independence graph with a corresponding metabolic subnetwork. Then we obtained a pattern that is a set of characteristic values for these graphs, and found that the pattern of heavy metals differs considerably from that of endocrine disrupters. This implies that a set of characteristic values of the graphs can representative a macroscopic biological meaning.

  • Hardware Design Verification Using Signal Transitions and Transactions

    Nobuyuki OHBA  Kohji TAKANO  

     
    PAPER

      Vol:
    E89-A No:4
      Page(s):
    1012-1017

    Hardware prototyping has been widely used for ASIC/SoC verification. This paper proposes a new hardware design verification method, Transition and Transaction Tracer (TTT), which probes and records the signals of interest for a long time, hours, days, or even weeks, without a break. It compresses the captured data in real time and stores it in a state transition format in memory. Since it records all the transitions, it is effective in finding and fixing errors, even ones that occur rarely or intermittently. It can also be programmed to generate a trigger for a logic analyzer when it detects certain transitions. This is useful for debugging situations where the engineer has trouble finding an appropriate trigger condition to pinpoint the source of errors. We have been using the method in hardware prototyping for ASIC/SoC development for two years and found it useful for system level tests, and in particular for long running tests.

  • A Memory Grouping Method for Reducing Memory BIST Logic of System-on-Chips

    Masahide MIYAZAKI  Tomokazu YONEDA  Hideo FUJIWARA  

     
    PAPER-Dependable Computing

      Vol:
    E89-D No:4
      Page(s):
    1490-1497

    With the increasing demand for SoCs to include rich functionality, SoCs are being designed with hundreds of small memories with different sizes and frequencies. If memory BIST logics were individually added to these various memories, the area overhead would be very high. To reduce the overhead, memory BIST logic must therefore be shared. This paper proposes a memory-grouping method for memory BIST logic sharing. A memory-grouping problem is formulated and an algorithm to solve the problem is proposed. Experimental results show that the proposed method reduced the area of the memory BIST wrapper by up to 40.55%. The results also show that the ability to select from two types of connection methods produced a greater reduction in area than using a single connection method.

  • Entropy Based Associative Memory

    Masahiro NAKAGAWA  

     
    PAPER

      Vol:
    E89-A No:4
      Page(s):
    895-901

    In this paper, an entropy based associative memory model will be proposed and applied to memory retrievals with an orthogonal learning model to compare with the conventional model based on the quadratic Lyapunov functional to be minimized. In the present approach, the updating dynamics will be constructed on the basis of the entropy minimization strategy which may be reduced asymptotically to the above-mentioned autocorrelation dynamics as a special case. From numerical results, it will be found that the presently proposed novel approach realizes twice of the memory capacity in comparison with the autocorrelation based dynamics such as associatron.

  • Concurrent Core Testing for SOC Using Merged Test Set and Scan Tree

    Gang ZENG  Hideo ITO  

     
    PAPER-Dependable Computing

      Vol:
    E89-D No:3
      Page(s):
    1157-1164

    A novel concurrent core test approach is proposed to reduce the test cost of SOC. Prior to test, the test sets corresponding to cores under test (CUT) are merged by using the proposed merging algorithm to obtain a minimum merged test set. During test, the proposed scan tree architecture is employed to support the concurrent core test using the merged test set. The approach achieves concurrent core test with one scan input and low hardware overhead. Moreover, the approach does not need any additional test generation, and it can be used in conjunction with general compression/decompression techniques to further reduce test cost. Experimental results for ISCAS 89 benchmarks have proven the efficiency of the proposed approach.

  • Low-Voltage and Low-Power Logic, Memory, and Analog Circuit Techniques for SoCs Using 90 nm Technology and Beyond

    Koichiro ISHIBASHI  Tetsuya FUJIMOTO  Takahiro YAMASHITA  Hiroyuki OKADA  Yukio ARIMA  Yasuyuki HASHIMOTO  Kohji SAKATA  Isao MINEMATSU  Yasuo ITOH  Haruki TODA  Motoi ICHIHASHI  Yoshihide KOMATSU  Masato HAGIWARA  Toshiro TSUKADA  

     
    INVITED PAPER

      Vol:
    E89-C No:3
      Page(s):
    250-262

    Circuit techniques for realizing low-voltage and low-power SoCs for 90-nm CMOS technology and beyond are described. A proposed SAFBB (self-adjusted forward body bias techniques), ATC (Asymmetric Three transistor Cell) DRAM, and ADC using an offset canceling comparator deal with leakage and variability issues for these technologies. A 32-bit adder using SAFBB attained 353-µA at 400-MHz operation at 0.5-V supply voltage, and 1 Mb memory array using ATC DRAM cells achieved 1.5 mA at 50 MHz, 0.5 V. The 4-bit ADC attained 2 Gsample/s operation at a supply voltage of 0.9 V.

  • Wire Length Distribution Model for System LSI

    Takanori KYOGOKU  Junpei INOUE  Hidenari NAKASHIMA  Takumi UEZONO  Kenichi OKADA  Kazuya MASU  

     
    PAPER-Interconnect

      Vol:
    E88-A No:12
      Page(s):
    3445-3452

    This paper concerns a new model for estimating the wire length distribution (WLD) of a system-on-a-chip (SoC). The WLD represents the correlation between wire length and the number of interconnects, and we can predict circuit performances such as power consumption, maximum clock frequency, and chip size from the WLD. A WLD model considering core utilization has been proposed, and the core utilization has a large impact on circuit performance. However, the WLD model can treat only a one-function circuit. We propose a new WLD model considering core utilization to estimate the wire length distribution of SoC, which consists of several different-function macroblocks. We present an optimization method to determine each core utilization of macroblocks.

  • A Method of Precise Estimation of Physical Parameters in LSI Interconnect Structures

    Toshiki KANAMOTO  Tetsuya WATANABE  Mitsutoshi SHIROTA  Masayuki TERAI  Tatsuya KUNIKIYO  Kiyoshi ISHIKAWA  Yoshihide AJIOKA  Yasutaka HORIBA  

     
    PAPER-Interconnect

      Vol:
    E88-A No:12
      Page(s):
    3463-3470

    This paper proposes a new non-destructive methodology to estimate physical parameters for LSIs. In order to resolve the estimation accuracy degradation issue for low-k dielectric films, we employ a parallel-plate capacitance measurement and a wire resistance measurement in our non-destructive method. Due to (1) the response surface functions corresponding to the parallel-plate capacitance measurement and the wire resistance measurement and (2) the searching of the physical parameter values using our cost function and simulated annealing, the proposed method attains higher precision than that of the existing method. We demonstrate the effectiveness of our method by application to our 90 nm SoC process using low-k materials.

  • Shift-Invariant Associative Memory Based on Homogeneous Neural Networks

    Hiromi MIYAJIMA  Noritaka SHIGEI  Shuji YATSUKI  

     
    PAPER

      Vol:
    E88-A No:10
      Page(s):
    2600-2606

    This paper proposes homogeneous neural networks (HNNs), in which each neuron has identical weights. HNNs can realize shift-invariant associative memory, that is, HNNs can associate not only a memorized pattern but also its shifted ones. The transition property of HNNs is analyzed by the statistical method. We show the probability that each neuron outputs correctly and the error-correcting ability. Further, we show that HNNs cannot memorize over the number,, of patterns, where m is the number of neurons and k is the order of connections.

  • 77-GHz MMIC Module Design Techniques for Automotive Radar Applications

    Yasushi ITOH  Kazuhiko HONJO  

     
    REVIEW PAPER

      Vol:
    E88-C No:10
      Page(s):
    1939-1946

    Recent advances in 77-GHz MMIC module design techniques for automotive radar applications are reviewed in this paper. The target of R&D activities is moving from high performance to low cost, mass production, high-yield manufacturing and testing. To meet the stringent requirements, millimeter-wave module design techniques have made significant progress especially in packaging, bonding, and making interface with other modules. In addition, millimeter-wave semiconductor devices and MMICs have made remarkable improvements for low cost and mass production. In this paper, the topics focusing on millimeter-wave semiconductor devices and 77-GHz MMICs are reviewed first. Then the recent R&D results on 77-GHz MMIC module design techniques are introduced, showing the technical trend of packaging, bonding, and making interface with other modules for millimeter-wave, highly-integrated, low-cost MMIC modules. Finally, the existing and future module design issues for automotive radar applications are discussed.

  • Wrapper Scan Chains Design for Rapid and Low Power Testing of Embedded Cores

    Yinhe HAN  Yu HU  Xiaowei LI  Huawei LI  Anshuman CHANDRA  Xiaoqing WEN  

     
    PAPER-Dependable Computing

      Vol:
    E88-D No:9
      Page(s):
    2126-2134

    Connection of internal scan chains in core wrapper design (CWD) is necessary to handle the width match of TAM and internal scan chains. However, conventional serial connection of internal scan chains incurs power and time penalty. Study shows that the distribution and high density of don't care bits (X-bits) in test patterns make scan slices overlapping and partial overlapping possible. A novel parallel CWD (pCWD) approach is presented in this paper for lowering test power by shortening wrapper scan chains and adjusting test patterns. In order to achieve shift time reduction from overlapping in pCWD, a two-phase process on test pattern: partition and fill, is presented. Experimental results on d695 of ITC2002 benchmark demonstrated the shift time and test power have been decreased by 1.5 and 15 times, respectively. In addition, the proposed pCWD can be used as a stand-alone time reduction technique, which has better performance than previous techniques.

  • Retrieval Property of Associative Memory Based on Inverse Function Delayed Neural Networks

    Hongge LI  Yoshihiro HAYAKAWA  Koji NAKAJIMA  

     
    PAPER-Nonlinear Problems

      Vol:
    E88-A No:8
      Page(s):
    2192-2199

    Self-connection can enlarge the memory capacity of an associative memory based on the neural network. However, the basin size of the embedded memory state shrinks. The problem of basin size is related to undesirable stable states which are spurious. If we can destabilize these spurious states, we expect to improve the basin size. The inverse function delayed (ID) model, which includes the Bonhoeffer-van der Pol (BVP) model, has negative resistance in its dynamics. The negative resistance of the ID model can destabilize the equilibrium states on certain regions of the conventional neural network. Therefore, the associative memory based on the ID model, which has self-connection in order to enlarge the memory capacity, has the possibility to improve the basin size of the network. In this paper, we examine the fundamental characteristics of an associative memory based on the ID model by numerical simulation and show the improvement of performance compared with the conventional neural network.

  • X-Tolerant Test Data Compression for SOC with Enhanced Diagnosis Capability

    Gang ZENG  Hideo ITO  

     
    PAPER-Dependable Computing

      Vol:
    E88-D No:7
      Page(s):
    1662-1670

    In this paper, a complete X-tolerant test data compression solution is proposed for system-on-a-chip (SOC) testing. The solution achieves low-cost testing by employing not only selective Huffman vertical coding (SHVC) for test stimulus compression but also MISR-based time compactor for test response compaction. Moreover, the solution is non-intrusive, since it can tolerate any number of unknown states (also called X state) in test responses such that it does not require modifying the logic of core to eliminate or block the sources of unknown states. Furthermore, the solution achieves enhanced diagnosis capability over conventional MISR. The enhanced diagnosis requires the least hardware overhead by reusing the existing masking logic and achieves significant saving in diagnostic time. Experimental results for ISCAS 89 benchmarks as well as the evaluation of hardware implementation have proven the efficiency of the proposed test solution.

  • Boundary Scan Test Scheme for IP Core Identification via Watermarking

    Yu-Cheng FAN  Hen-Wai TSAO  

     
    LETTER-Programmable Logic, VLSI, CAD and Layout

      Vol:
    E88-D No:7
      Page(s):
    1397-1400

    This paper proposes a novel boundary scan test scheme for intellectual property (IP) core identification via watermarking. The core concept is embedding a watermark identification circuit (WIC) and a test circuit into the IP core at the behavior design level. The procedure depends on current IP-based design flow. This scheme can detect the identification of the IP provider without the need to examine the microphotograph after the chip has been manufactured and packaged. This scheme can successfully survive synthesis, placement, and routing and identify the IP core at various design levels. Experimental results have demonstrated that the proposed approach has the potential to solve the IP identification problem.

221-240hit(334hit)